Prosecution Insights
Last updated: August 17, 2026
Application No. 18/840,076

INERTIAL MEASUREMENT APPARATUS

Non-Final OA §102§103
Filed
Aug 21, 2024
Priority
Mar 24, 2022 — JP 2022-048037 +1 more
Examiner
FRANK, RODNEY T
Art Unit
Tech Center
Assignee
Sony Group Corporation
OA Round
1 (Non-Final)
73%
Grant Probability
Favorable
1-2
OA Rounds
1y 1m
Est. Remaining
76%
With Interview

Examiner Intelligence

Grants 73% — above average
73%
Career Allowance Rate
672 granted / 923 resolved
+12.8% vs TC avg
Minimal +4% lift
Without
With
+3.5%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
29 currently pending
Career history
943
Total Applications
across all art units

Statute-Specific Performance

§101
5.0%
-35.0% vs TC avg
§103
46.6%
+6.6% vs TC avg
§102
18.1%
-21.9% vs TC avg
§112
26.7%
-13.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 923 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1-3, 8, and 10-14 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Hiyoshi (U.S. Patent Application Publication Number 2002/0057426). With respect to claim 1, Hiyoshi discloses and illustrates an inertial measurement apparatus comprising: an inertial measurement unit (IMU) (2A) that detects angular velocity and acceleration (angular velocity sensor 26a and acceleration sensor 27); an IMU fixing substrate (23) having a recess in which the IMU is embedded and fixed (see at least figure 4); and a part that functions as a lid (24) of the recess (see at least figure 4). With respect to claim 2, the inertial measurement apparatus according to claim 1, wherein the part that functions as the lid of the recess is a control IC (100 or 28; see at least figure 4). With respect to claim 3, the inertial measurement apparatus according to claim 1, wherein the part that functions as the lid of the recess is a substrate (24) on which the IMU fixing substrate is disposed (see at least figure 4). With respect to claim 8, the inertial measurement apparatus according to claim 1, wherein the IMU fixing substrate has the recess on an upper surface (see at least figure 4). With respect to claim 10, the inertial measurement apparatus according to claim 1, wherein the IMU fixing substrate has the recess on at least either an upper surface or a lower surface (see at least figure 4). With respect to claim 11, the inertial measurement apparatus according to claim 1, wherein one the IMU is embedded and fixed in the recess of the IMU fixing substrate. With respect to claim 12, the inertial measurement apparatus according to claim 1, wherein two the IMUs are embedded and fixed in the recess of the IMU fixing substrate (see at least figure 4). With respect to claim 13, the inertial measurement apparatus according to claim 1, wherein four the IMUs are embedded and fixed in the recess of the IMU fixing substrate (see at least figures 4 and 5). With respect to claim 14, the inertial measurement apparatus according to claim 1, wherein at least one or more the IMUs are embedded and fixed in the recess of the IMU fixing substrate (see at least figures 4 and 5). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 4, 5, 7, and 9 are is/are rejected under 35 U.S.C. 103 as being unpatentable over Hiyoshi. With respect to claim 4, the inertial measurement apparatus according to claim 1, wherein the part that functions as the lid of the recess is a label in a form of a sheet is not explicitly disclosed in Hiyoshi. However, Hiyoshi does appear to disclose some sort of label on the inertial measurement unit (see the dashed-out lines in Figure 4). Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to utilize a label on the sensor in order to easily identify the component when a sensor assembly is being constructed. With respect to claim 5, the inertial measurement apparatus according to claim 1, wherein the part that functions as the lid of the recess is a control IC in a case where the recess is smaller than the control IC, and the part that functions as the lid of the recess is a label in a form of a sheet in a case where the recess is larger than the control IC is not explicitly disclosed in Hiyoshi. . However, Hiyoshi does appear to disclose some sort of label on the inertial measurement unit (see the dashed-out lines in Figure 4). Further, Hiyoshi appears to disclose the components are all appropriately sized in order to provide a sealed sensor space. Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to provide components sized and arranged in order to provide a robust sealed sensor that would be protected from environmental effects. With respect to claim 7, the inertial measurement apparatus according to claim 1, wherein the IMU fixing substrate has the recess on both an upper surface and a lower surface is not explicitly disclosed in Hiyoshi. However, Hiyoshi shows that the bonding member has a similar shape on both sides, basically the shape of an octagon O-ring. Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to have a recess on both the upper and lower surface in order to allow an easier senso construction as the bonding member could be used equally in either orientation to assemble the IMU. With respect to claim 9, the inertial measurement apparatus according to claim 1, wherein the IMU fixing substrate has the recess on a lower surface is not explicitly disclosed in Hiyoshi. However, Hiyoshi shows that the bonding member has a similar shape on both sides, basically the shape of an octagon O-ring. Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to have a recess on both the upper and lower surface in order to allow an easier senso construction as the bonding member could be used equally in either orientation to assemble the IMU. Claim(s) 6, and 15-17 is/are rejected under 35 U.S.C. 103 as being unpatentable over Hiyoshi as applied to claim 1 above, and further in view of Ohta (U.S. Patent Application Publication Number 2010/0043550). With respect to claim 6, the inertial measurement apparatus according to claim 1, wherein the IMU fixing substrate is a ceramic substrate is not explicitly disclosed in Hiyoshi. Hiyoshi is silent as to the material of the substrate. However, the use of ceramics for substrates is relatively well known in the art. However, Ohta teaches the use of a ceramic substrate (100). Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to use a ceramic substrate as taught in Ohta with the system of Hiyoshi to provide a well known and strong substrate material that is easy to machine and manufacture. With respect to claim 15, the inertial measurement apparatus according to claim 1, wherein, in addition to the IMU, another sensor is embedded and fixed in the recess of the IMU fixing substrate is not explicitly disclosed in Hiyoshi. However, Ohta teaches that while the angular velocity senso is disclosed, other sensor types may also be in the housing (see at least paragraph [0141] of Ohta). Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to include additional sensor types as disclosed in Ohta with the system of Hiyoshi in order to enable the measurement of other properties, thus providing a more robust and more useful sensor. With respect to claim 16, the inertial measurement apparatus according to claim 15, wherein another sensor includes an atmospheric pressure sensor, a temperature sensor, and a humidity sensor is not explicitly disclosed in Hiyoshi. However, Ohta teaches that while the angular velocity senso is disclosed, other sensor types, such as a temperature and humidity sensor, may also be in the housing (see at least paragraph [0141] of Ohta). Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to include additional sensor types as disclosed in Ohta with the system of Hiyoshi in order to enable the measurement of other properties, thus providing a more robust and more useful sensor. With respect to claim 17, the inertial measurement apparatus according to claim 15, wherein the part that functions as the lid of the recess forms a gap with the recess is not explicitly disclosed in Hiyoshi. However, Ohta teaches a housing arrangement wherein there is a gap in the housing by a recess (see at least Figure 1 of Ohta). Therefore, it would have been obvious to one skilled in the art at the time the invention was filed to utilize the arrangement of the lid to the rest of the sensor as taught Ohta with the system of Hiyoshi in order to allow a better arrangement so that the sensor interior can be serviced or parts can be replaced easier as there is more room to work with in the sensor interior. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to RODNEY T FRANK whose telephone number is (571)272-2193. The examiner can normally be reached M-F 9am-5:30pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Peter Macchiarolo can be reached at (571) 272-2375. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /RODNEY T FRANK/Examiner, Art Unit 2855 July 11, 2026
Read full office action

Prosecution Timeline

Aug 21, 2024
Application Filed
Jul 14, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Prosecution Projections

1-2
Expected OA Rounds
73%
Grant Probability
76%
With Interview (+3.5%)
3y 1m (~1y 1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 923 resolved cases by this examiner. Grant probability derived from career allowance rate.

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