Prosecution Insights
Last updated: October 02, 2026
Application No. 18/851,450

COPPER PARTICLE AND METHOD FOR PRODUCING SAME, PASTE COMPOSITION, SEMICONDUCTOR DEVICE, ELECTRICAL COMPONENT, AND ELECTRONIC COMPONENT

Non-Final OA §103
Filed
Sep 26, 2024
Priority
Mar 31, 2022 — JP 2022-061331 +3 more
Examiner
FERRE, ALEXANDRE F
Art Unit
Tech Center
Assignee
Kyocera Corporation
OA Round
1 (Non-Final)
59%
Grant Probability
Moderate
1-2
OA Rounds
1y 1m
Est. Remaining
79%
With Interview

Examiner Intelligence

Grants 59% of resolved cases
59%
Career Allowance Rate
428 granted / 726 resolved
-1.0% vs TC avg
Strong +20% interview lift
Without
With
+20.1%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
51 currently pending
Career history
781
Total Applications
across all art units

Statute-Specific Performance

§101
1.1%
-38.9% vs TC avg
§103
58.1%
+18.1% vs TC avg
§102
17.3%
-22.7% vs TC avg
§112
16.4%
-23.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 726 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 1-5 and 8-11 in the reply filed on 07/09/2026 is acknowledged. Claims 6-7 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected invention, there being no allowable generic or linking claim. Claim Objections Claim 4 is objected to under 37 CFR 1.75 as being a substantial duplicate of claim 3. When two claims in an application are duplicates or else are so close in content that they both cover the same thing, despite a slight difference in wording, it is proper after allowing one claim to object to the other as being a substantial duplicate of the allowed claim. See MPEP § 608.01(m). The terms “electronic” and “electrical” would cover the same components and are synonymous with one another. As such, the claims are substantially identical. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Claims 1, 3-5 and 8-11 are rejected under 35 U.S.C. 103 as being unpatentable over Akizawa et al. (U.S. App. Pub. No. 2024/0139804). Regarding claim 1, Akizawa et al. discloses copper particles and methods of making thereof having a (111) crystallite size to (220) crystallite size ratio of 1.35 or less (Abstract) and wherein the (111) crystallite size is 10-60 nm. (par. [0026]). As set forth in MPEP 2144.05, in the case where the claimed range “overlap or lie inside ranges disclosed by the prior art”, a prima facie case of obviousness exists, In re Wertheim, 541 F.2d 257, 191 USPQ 90 (CCPA 1976); In re Woodruff, 919 F.2d 1575, 16 USPQ2d 1934 (Fed. Cir. 1990). Regarding claim 3, Akizawa et al. discloses that the copper particles sizes have dimensions of 100-500 nm (par. [0023]), equivalent to the presently claimed “major axis”. thickness of the particles. As can be seen in Fig. 3, the thickness of the copper particles appears to be slightly less than 50 nm but more than 5 nm based on the 100 nm bar on the bottom right of the figure. PNG media_image1.png 342 340 media_image1.png Greyscale Regarding claim 4, Akizawa et al. teaches that the surface of the particles can be coated with organic materials such as fatty acids (par. [0083]), which would meet the limitation of “a shell made of carboxylic acid” as presently claimed. Regarding claim 5, Akizawa et al. teaches that polyphosphoric acids absorb onto the crystal planes (i.e. surface) of the copper particles during growth. (par. [0078]-[0079]). The surface of the particles where the polyphosphoric acid would therefore meet the limitation of “a shell” and the core would be the copper interior to the surface. Regarding claims 8-11, Akizawa et al. teaches forming a conductive paste with the copper particles (par. [0122]) and applying the paste onto a printed circuit board (i.e. an electronic/electrical component/semiconductor device). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ALEXANDRE F FERRE whose telephone number is (571)270-5763. The examiner can normally be reached M-F: 8 am to 4 pm ET. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Alicia Chevalier can be reached at 5712721490. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ALEXANDRE F FERRE/Primary Examiner, Art Unit 1788 08/26/2026
Read full office action

Prosecution Timeline

Sep 26, 2024
Application Filed
Sep 26, 2024
Response after Non-Final Action
Aug 28, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
59%
Grant Probability
79%
With Interview (+20.1%)
3y 1m (~1y 1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 726 resolved cases by this examiner. Grant probability derived from career allowance rate.

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