DETAILED ACTION
This Office Action is in response to the amendment filed on 05/09/2025, wherein claims 1-17 have been examined and are pending.
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claims 4-5 and 10 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
Claim 4 recites “at least the second portion (510b) of the reference light beam (510) from the object iv (800)”. It is unclear what the limitation “the object iv (800)” is referred to since (800) is cited as imaging lens before.
Claim 5 recites “preferably”.
A broad range or limitation together with a narrow range or limitation that falls within the broad range or limitation (in the same claim) is considered indefinite, since the resulting claim does not clearly set forth the metes and bounds of the patent protection desired. See MPEP § 2173.05(c). Note the explanation given by the Board of Patent Appeals and Interferences in Ex parte Wu, 10 USPQ2d 2031, 2033 (Bd. Pat. App. & Inter. 1989), as to where broad language is followed by i.e. "such as" and then narrow language. The Board stated that this can render a claim indefinite by raising a question or doubt as to whether the feature introduced by such language is (a) merely exemplary of the remainder of the claim, and therefore not required, or (b) a required feature of the claims. Note also, for example, the decisions of Ex parte Steigewald, 131 USPQ 74 (Bd. App. 1961); Ex parte Hall, 83 USPQ 38 (Bd. App. 1948); and Ex parte Hasche, 86 USPQ 481 (Bd. App. 1949).
Claim 5 recites a broad recitation “the measurement apparatus (100, 101, 102) is formed and arranged such that the intensity of the reference light beam (510) is reducible along the optical path of the reference light beam (510)”, and “preferably between the imaging lens (800) and the light source (500)” which is narrower statement of the range/limitation.
Claim 10 depends on claim 7 and recites “the first light divider”. The limitation “first light divider” is not cited in claim 7. There is insufficient antecedent basis for this in claim 10. The claim languages “the first light divider” appear for the first time in claim 10, however, read as though it has already been defined.
Appropriate correction is required.
Claim Rejections - 35 USC § 102
The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action:
A person shall be entitled to a patent unless –
(a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention.
Claims 1-2, 4-11, 13-15 and 17 are rejected under AIA 35 U.S.C. 102(a)(1) as being anticipated by Podoleanu (U.S. 2014/0176693).
Regarding claim 1, Podoleanu discloses measurement apparatus (100, 101, 102) comprising a first imaging sensor (200) for 20 imaging (Fig. 7, [0187]-[0188], [0191]-[0195]: receiver or camera 261 for microscopy image) and a second imaging sensor (300) for 3D imaging (Fig. 7, [0192]-[0195]: sensor 3 and volume acquisition and depth of object can be obtained), wherein the measurement apparatus (100, 101, 102) is configured and arranged to be focused on a common region (950) of an object (900), wherein the measurement apparatus (100,101, 102) additionally comprising:
- a light source (500) that is configured and arranged to emit, in use, an illumination light beam (520) onto the common region (950), and the light source (500) is further configured and arranged to emit a reference light beam (510) onto the second imaging sensor (300) (Fig. 7, [0186]-[0193], [0194]-[0196], [0058]-[0061]: light from light sources 4 or 6 to illuminate light toward object 100 as in [0124], [0168]: [0061]: light reflected by optical splitter 25 to parts of object 100; [0079], [0083]: a reference path is added to create a reference beam and depth value from object can be acquired; [0174]: reference beam 32 and object beam 31 are sent to two available cameras, [0187]: reference beam 32 reflected by beamsplitter 75);
- an imaging lens (800) comprising at least one optical element arranged so that, in use, light that is reflected from the common region (950) as a measurement light beam (530) enters the imaging lens (800) together with the reference light beam (510) of the light source (500) enters the imaging lens (800), wherein the imaging lens (800) is additionally formed and arranged to (Figs. 4-7, [0168]-[0169], [0181]: light from object is returned to photodetector array via lens 41, 13, 62, 64 and 21; [0081]: reference beam is returned to optical splitter 25 which then can go to lens 62 as in Fig. 4; Fig. 7, [0174], [0187]: object beam 31, i.e. measured light beam, and reference beam 32 go to beamsplitter 75 so that the aperture of the receiver 261 intercepts the object beam only)
- direct and focus at least a first portion (530a) of the measurement light beam (530) onto the first imaging sensor (200) (Fig. 7, [0174], [0187], [0168]: object beam 31, i.e. measured light beam, go to dispersing element 75 and 42 such as beamsplitter 75 so that the aperture of the receiver 261 intercepts the object beam only); and/or
- direct at least a second portion (530b) of the measurement light beam (530) and a second portion (510b) of the reference light beam (510) onto the second imaging sensor (300) and focusing them (Fig. 7, [0186]-[0196], [0174]: object beam 31 and reference beam 32 can reach sensor 3 using dispersing element 75 and 42 for OCT image);
and the measurement apparatus (100, 101, 102) is formed and arranged to reduce or extinguish the intensity of a first portion (510Oa) of the reference light beam (510) receivable at the first imaging sensor (200) (510) when the measurement apparatus (100, 101, 102) is operated in a 2D imaging mode (Fig. 7, [0187]: eliminate the reference beam from the aperture of the receiver 261 so the receiver 261 intercepts with the object beam only).
Regarding claim 2, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the first imaging sensor (200) is a 2D imaging sensor and the second imaging sensor (300) is a 3D imaging sensor (Podoleanu [0220], [0054], [0191]-[0192]: depth information of object can be obtained using scans such as A-scan of sensor 3. OCT volume acquisition using sensor 3 and imaging using photodetector 261).
Regarding claim 4, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses transmit at least the second portion (510b) of the reference light beam (510) from the object iv (800) in the direction of the second imaging sensor (300) if the measurement apparatus (100, 101, 102) is operated in a 3D imaging mode (Fig. 7, [0186]-[0196], [0174]: reference beam 32 can reach sensor 3 using dispersing element 75 and 42 for OCT image; [0220], [0054], [0191]-[0192]: depth information of object can be obtained using scans such as A-scan of sensor 3. OCT volume acquisition using sensor 3 and imaging using photodetector 261, hence 3D imaging mode).
Regarding claim 5, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) is formed and arranged such that the intensity of the reference light beam (510) is reducible along the optical path of the reference light beam (510), preferably between the imaging lens (800) and the light source (500) (Podoleanu Figs. 4-7, [0168]-[0169], [0181]: light from object is returned to photodetector array via lens 41, 13, 62, 64 and 21; [0081]: reference beam is returned to optical splitter 25 which then can go to lens 62 as in Fig. 4; Fig. 7, [0174], [0187]: object beam 31, i.e. measured light beam, go to beamsplitter 75 and element 42 so that the aperture of the receiver 261 intercepts the object beam only).
Regarding claim 6, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) is formed and arranged such that the intensity of the reference light beam (510) in the light source (500) is reducible (Podoleanu [0187]: intensity of the light beam can be reduced. Reference beam 32 and object beam 31 go to beam splitter 75 so that the aperture of the receiver 261 intercepts the object beam only. Hence, intensity of reference beam is reducible in the path of the receiver 261).
Regarding claim 7, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) includes a beam intensity reducer (700) in the form of one or more of the following elements, namely an diaphragm, a shutter, a mechanical iris, a mirror, a dichroic mirror, a dielectric mirror, a prism, a corner cube, a beam splitter, a lens element, a coating, an optical filter, a compensation plate, or any combination thereof, each formed and arranged such that the intensity of the first portion (510a) of the reference light beam (510) receivable by the first imaging sensor (200) is reducible therewith in operation in 2D imaging mode (Podoleanu [0187]: intensity of the light beam can be reduced. Reference beam 32 and object beam 31 go to beam splitter 75 so that the aperture of the receiver 261 intercepts the object beam only. Hence, intensity of reference beam is reducible in the path of the receiver 261).
Regarding claim 8, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) further comprises a first light divider (600) that is formed and arranged such that the measurement light beam (530) can be received by the imaging lens (800) and that the first portion (530a) of the measurement light beam (530) can be directed onto the first imaging sensor (200) and/or the second portion (530b) of the measurement light beam (530) can be directed onto the second imaging sensor (300) (Podoleanu Fig. 7, [0187]: Reference beam 32 and object beam 31 go to beam splitter 75, i.e. light divider, so that the aperture of the receiver 261 intercepts the object beam only. Hence, intensity of reference beam is reducible in the path of the receiver 261; Fig. 7, [0186]-[0196], [0174]: object beam 31 and reference beam 32 can reach sensor 3 using dispersing element 75 and 42 for OCT image).
Regarding claim 9, Podoleanu discloses all limitations of claim 7.
Podoleanu discloses wherein the first light divider (600) is also formed and arranged such that, in operation in a 3D imaging mode, the reference light beam (510) is receivable by the imaging lens (800) and that at least the second portion (510b) of the reference light beam (510) is transmissible in the direction of the second imaging sensor (300) (Podoleanu Figs. 4-7, [0168]-[0169], [0181]: light from object is returned to photodetector array via lens 41, 13, 62, 64 and 21; [0081]: reference beam is returned to optical splitter 25 which then can go to lens 62 as in Fig. 4;Fig. 7, [0186]-[0196], [0174]: object beam 31 and reference beam 32 can reach sensor 3 using dispersing element 75 and 42 for OCT image).
Regarding claim 10, Podoleanu discloses all limitations of claim 7.
Podoleanu discloses wherein the first light divider (600) comprises one or more of the following: a mirror, a dichroic dielectric mirror, prism, corner cube, beam splitter, optical element, coating, optical filter, compensating plate, and/or any combination thereof (Podoleanu Figs. 4-7, [0168]-[0169], [0181]: light from object is returned to photodetector array via lens 41, 13, 62, 64 and 21; [0081]: reference beam is returned to optical splitter 25 which then can go to lens 62 as in Fig. 4;Fig. 7, [0186]-[0196], [0174]: object beam 31 and reference beam 32 can reach sensor 3 using beam splitter 75, i.e. light divider, and element 42 for OCT image).
Regarding claim 11, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the imaging lens (800) comprises one or more compound lenses (Podoleanu Figs. 4-7, [0168]-[0169], [0181], [0081]: light from object and reference beam is returned to photodetector array via splitter 25 and lens 41, 13, 62, 64 and 21).
Regarding claim 13, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) is formed and arranged such that it provides one or more fields of view of the common region (950) of the object (900) (Podoleanu [0083]: image and measurements from different parts of the object 100 can be obtained, hence a common region of object can have one or more parts or fields of views).
Regarding claim 14, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) further comprises a second light divider (650) formed and arranged such that, in operation in a 3D imaging mode, an incoming light beam (505) from the light source (500) and at least a portion of the incident light beam (505) is directable as an illumination light beam (520) onto the common region (950), and at least a portion of the incident light (505) is directable as a reference light beam (510) onto the imaging lens (800) (Podoleanu Figs. 4-7, [0168]-[0169], [0181], [0081]: light from object and reference beam is directed to photodetector array via splitter 25, i.e. second light divider, and to lens 13, 62, 64 and 21; [0061]: light reflected by splitter 25 passes to object 100).
Regarding claim 15, Podoleanu discloses all limitations of claim 1.
Podoleanu discloses wherein the measurement apparatus (100, 101, 102) is configured and arranged to be operable in a 3D imaging mode such as white-light interferometry, optical coherence tomography (OCT), parallel optical coherence tomography (pOCT), or any combination thereof (Podoleanu [0001], [0026], [0031], [0033]-[0040], [0186]-[0197]: Optical coherence tomography OCT can be used).
Regarding claim 17, Podoleanu discloses inspection system comprising:
- an image capture system for capturing one or more fields of view of an object (900) to be inspected; and - a processor that is formed and arranged such that it derives one or more measured values of the object (900) to be inspected from the one or more fields of view, wherein the processor can be used to determine from the one or more measured values whether a fault in the form of a defect or a deviation from a nominal size has occurred in the object (900) to be inspected, wherein the image capture system comprises one or more measurement apparatuses (100, 101, 102) according to claim 1 as discussed on claim 1 above (Podoleanu, Fig. 7, [0186]-[0197]: see rejection of claim 1 above. Abstract, [0090], Claim 20: imaging system for inspection of object such as eye, skin, teeth, to evaluate object damage as in [0008]).
Claims 1-2 and 4 are rejected under AIA 35 U.S.C. 102(a)(1) as being anticipated by Inglese et al. (U.S. 2020/0129069) hereinafter Inglese.
Regarding claim 1, Inglese discloses measurement apparatus (100, 101, 102) comprising a first imaging sensor (200) for 20 imaging (Fig. 15-17F, [0119], [0121]-[0124], [0128]-[0132]: camera 212 sensing visible light from object S) and a second imaging sensor (300) for 3D imaging (Fig. 15-17F, [0121]: OCT signal detector 224), wherein the measurement apparatus (100, 101, 102) is configured and arranged to be focused on a common region (950) of an object (900), wherein the measurement apparatus (100,101, 102) additionally comprising:
- a light source (500) that is configured and arranged to emit, in use, an illumination light beam (520) onto the common region (950), and the light source (500) is further configured and arranged to emit a reference light beam (510) onto the second imaging sensor (300) (Fig. 15-17F, [0120]: system uses broadband near-IR (BNIR) light from a light source used for OCT imaging; [0120]-[0121]: couple FC splits the BNIR light into reference arm 42 and sample arm 40. Light in sample arm 40 is conveyed to sample S. Light in reference arm 42 is retro-reflected by reference mirror 222 and coupled to fiber coupler FC as reference light. A portion of BNIR that is backscattered by the sample S is collected by sample arm 40);
- an imaging lens (800) comprising at least one optical element arranged so that, in use, light that is reflected from the common region (950) as a measurement light beam (530) enters the imaging lens (800) together with the reference light beam (510) of the light source (500) enters the imaging lens (800), wherein the imaging lens (800) is additionally formed and arranged to (Fig. 15-17F, [0120]: system uses broadband near-IR (BNIR) light from a light source used for OCT imaging; [0120]-[0121]: couple FC splits the BNIR light into reference arm 42 and sample arm 40. Light in sample arm 40 is conveyed to sample S. Light in reference arm 42 is retro-reflected by reference mirror 222 and coupled to fiber coupler FC as reference light. A portion of BNIR that is backscattered by the sample S is collected by sample arm 40; Figs. 17B-17C, [0128]-[0132]: lens L3 can be used to direct light to and from sample S to camera 212)
- direct and focus at least a first portion (530a) of the measurement light beam (530) onto the first imaging sensor (200) (Fig. 15-17F, [0120]-[0121], [0128]-[0132]: camera 212 senses only visible light reflected from object S; Figs. 17B-17C, [0128]-[0132]: lens L3 can be used to direct light from sample S to camera 212); and/or
- direct at least a second portion (530b) of the measurement light beam (530) and a second portion (510b) of the reference light beam (510) onto the second imaging sensor (300) and focusing them (Fig. 15-17F, [0120]-[0121]: couple FC splits the BNIR light into reference arm 42 and sample arm 40. Light in sample arm 40 is conveyed to sample S. Light in reference arm 42 is retro-reflected by reference mirror 222 and coupled to fiber coupler FC as reference light. Ensure that only broad band NIR interference light is detected by OCT signal detector 224, wherein a portion of BNIR that is backscattered by the sample S is collected by sample arm 40);
and the measurement apparatus (100, 101, 102) is formed and arranged to reduce or extinguish the intensity of a first portion (510Oa) of the reference light beam (510) receivable at the first imaging sensor (200) (510) when the measurement apparatus (100, 101, 102) is operated in a 2D imaging mode ([0120]-[0121], [0128]-[0132]: camera 212 senses visible light reflected from object S; [0120]-[0121]: couple FC splits the BNIR light into reference arm 42 and sample arm 40. Light in sample arm 40 is conveyed to sample S. Light in reference arm 42 is retro-reflected by reference mirror 222 and coupled to fiber coupler FC as reference light. Ensure that only broad band NIR interference light is detected by OCT signal detector 224, wherein a portion of BNIR that is backscattered by the sample S is collected by sample arm 40).
Regarding claim 2, Inglese discloses all limitations of claim 1.
Inglese discloses wherein the first imaging sensor (200) is a 2D imaging sensor and the second imaging sensor (300) is a 3D imaging sensor (Inglese [0105]-[0110]: surface point cloud data of object can be extracted from the OCT content, hence OCT detector is 3D imaging sensor which can also be used for 2D imaging).
Regarding claim 4, Inglese discloses all limitations of claim 1.
Inglese discloses transmit at least the second portion (510b) of the reference light beam (510) from the object iv (800) in the direction of the second imaging sensor (300) if the measurement apparatus (100, 101, 102) is operated in a 3D imaging mode (Inglese Fig. 15-17F, [0120]-[0122]: couple FC splits the BNIR light into reference arm 42 and sample arm 40. Light in sample arm 40 is conveyed to sample S. Light in reference arm 42 is retro-reflected by reference mirror 222 and coupled to fiber coupler FC as reference light. Ensure that only broad band NIR interference light is detected by OCT signal detector 224, wherein a portion of BNIR that is backscattered by the sample S is collected by sample arm 40).
Claim Rejections - 35 USC § 103
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action:
A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made.
The text of those sections of Title 35, U.S. Code not included in this action can be found in a prior Office action.
The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows:
1. Determining the scope and contents of the prior art.
2. Ascertaining the differences between the prior art and the claims at issue.
3. Resolving the level of ordinary skill in the pertinent art.
4. Considering objective evidence present in the application indicating obviousness or nonobviousness.
Claim 3 is under AIA 35 U.S.C. 103 as being unpatentable over Podoleanu (U.S. 2014/0176693), in view of Pei et al. (U.S. 2017/0307759) hereinafter Pei, further in view of Woodman et al. (U.S. 2017/0054968) hereinafter Woodman.
Regarding claim 3, Podoleanu discloses all limitations of claim 1.
Podoleanu broadly discloses wherein the first imaging sensor (200) is a 3D imaging sensor and the second imaging sensor (300) is a 3D imaging sensor, wherein the imaging sensor (200) is formed and arranged such that the imaging sensor (200) is operable in a 2D imaging mode (Podoleanu [0220], [0054], [0191]-[0192]: depth information of object can be obtained using scans such as A-scan of sensor 3).
Pei discloses wherein the first imaging sensor (200) is a 3D imaging sensor and the second imaging sensor (300) is a 3D imaging sensor (Pei Fig. 5, [0040]-[0041]: imaging system includes first three-dimensional sensor 510 and second three-dimensional sensor 520, wherein interferometry sensor can be used)
It would have been obvious to a person of ordinary skill in the art before the effective filing date of the claimed invention to use the method and system, as disclosed by Podoleanu, and further incorporate having the first imaging sensor (200) is a 3D imaging sensor and the second imaging sensor (300) is a 3D imaging sensor, as taught by Pei, for better image quality and calibration (Pei [0045], [0040]-[0041]).
Woodman discloses 3D imaging sensor is operable in a 2D imaging mode (Woodman [0017]: imaging system having first and second camera which has a 2D capture mode or 3D capture mode).
It would have been obvious to a person of ordinary skill in the art before the effective filing date of the claimed invention to use the method and system, as disclosed by Podoleanu, and further incorporate having the imaging sensor (200) is formed and arranged such that the imaging sensor (200) is operable in a 2D imaging mode, as taught by Woodman, for imaging flexibility with different imaging modes when desired (Woodman [0027]).
Claim 12 is under AIA 35 U.S.C. 103 as being unpatentable over Podoleanu (U.S. 2014/0176693), in view of Ulrich et al. (U.S. 2003/0039388) hereinafter Ulrich.
Regarding claim 12, Podoleanu discloses all limitations of claim 1.
Podoleanu does not explicitly disclose wherein the imaging lens (800) is a telecentric imaging lens.
However, Ulrich discloses the imaging lens (800) is a telecentric imaging lens (Ulrich Figs. 3-5, [0065]: interferometry sensor system for 3D imaging of object; [0069]: pattern projector 402 for reference beam. Imager 404 to image object 99 and having imaging lens 420 which is a telecentric lens as in [0072], [0148]).
It would have been obvious to a person of ordinary skill in the art before the effective filing date of the claimed invention to use the method and system, as disclosed by Clucas, and further incorporate having the imaging lens (800) is a telecentric imaging lens, as taught by Ulrich, for increased accuracy across the field of view of imaging (Ulrich [0148]).
Claim 16 is under AIA 35 U.S.C. 103 as being unpatentable over Clucas et al. (U.S 2018/0362270) hereinafter Clucas, in view of Podoleanu (U.S. 2014/0176693).
Regarding claim 16, Clucas discloses manufacturing system for sorting objects (900) and/or for picking-and-placing an object (900) on a substrate, wherein the manufacturing system comprises the following:
- at least one pick-and-place head with at least one tool each for upholding the object (900) in a releasable manner (Clucas Figs. 1-4, [0142]-[0143], [0198], [0230]: robot system having manipulator 162 for pick up and holding object, Fig. 60, [0322]: manipulator head 6004 for picking up object);
- robot system for capturing a relative movement of the pick-and-place head between a receiving position for an object (900) and the substrate (Clucas [0359]: vision system 8126 provides information including locations of object for removal; [0198]: the robot system can pick-up, retrieve items within an unloading area, such as from a carton pile, and place the items on a substrate such as a conveyor system); and –
- an image capture system for capturing one or more common regions (950) of the object (900) to be captured (Clucas Fig. 81, [0358]: the robot system includes a vision system 8126 that comprises sensor devices including cameras, 3D sensors to provide depth perception and 3D image of a wall of items for pickup).
Clucas does not explicitly discloses wherein the image capture system comprises one or more measurement apparatuses (100, 101,102) according to claim 1.
However, Podolenau discloses the image capture system comprises one or more measurement apparatuses (100, 101,102) according to claim 1 as discussed in claim 1 above (Podoleanu [0187]-[0197]).
It would have been obvious to a person of ordinary skill in the art before the effective filing date of the claimed invention to use the method and system, as disclosed by Clucas, and further incorporate having the image capture system comprises one or more measurement apparatuses (100, 101,102) according to claim 1, as taught by Podolenau, for a compact high depth resolution measurement and imaging system, portable and of lower cost (Podolenau [0009]).
Conclusion
Any inquiry concerning this communication or earlier communications from the examiner should be directed to KATHLEEN V NGUYEN whose telephone number is (571)270-0626. The examiner can normally be reached on M-F 9:00am-6:00pm.
If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jamie Atala can be reached on 571-272-7384. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300.
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/KATHLEEN V NGUYEN/Examiner, Art Unit 2486
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