Prosecution Insights
Last updated: April 19, 2026
Application No. 18/858,758

DRIVING CIRCUIT AND DRIVING METHOD FOR POWER SEMICONDUCTOR ELEMENT, AND POWER MODULE

Non-Final OA §102
Filed
Oct 22, 2024
Examiner
LAM, TUAN THIEU
Art Unit
2842
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Mitsubishi Electric Corporation
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
2y 1m
To Grant
91%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allow Rate
775 granted / 1001 resolved
+9.4% vs TC avg
Moderate +13% lift
Without
With
+13.3%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
34 currently pending
Career history
1035
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
36.8%
-3.2% vs TC avg
§102
36.3%
-3.7% vs TC avg
§112
20.0%
-20.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1001 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 2, 12 and 13-14 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Kaeriyama (US 2017/0373676). Regarding claims 1 and 12, Kaeriyama’s figures 3-4 shows a driving circuit for power semiconductor device TR, the driving circuit comprising a first gate voltage control circuit (a controller CTR, a plurality of registers REG to REGn, a selection circuit SEL, and a variable current driver circuit IDVC) to control a gate voltage of the power semiconductor element in response to a turn-on command of the power semiconductor element(turn-on instruction TON (corresponding to ”a turn-on command”), in a first tiem region (a current Il is generated by a register REG] during a period of STl (figures 4 and 5A corresponding to "a first time region”), and a current I2a is generated by a register REG2a (corresponding to ”a second time region”) during a period of ST2a (figure 14A) is generated by a register REG2b during a period of ST2b (figure 14A, corresponding to "a third time region”) in different manners, the gate voltage reaching the mirror voltage in the second time region or the third time region according to magnitude of a main current flowing through the power semiconductor element (according to a), collector-emitter current Ice, and a Miller plateau period in which a gate-emitter voltage Vge becomes substantially flat is entered), the driving circuit further comprising a second gate voltage control circuit to control the gate voltage greater than or equal to the mirror voltage ( the inter-emitter voltage Vge is increased by the register REG3 (corresponding to the ”second gate voltage control circuit”) during the period of ST3) as called for in claim 1. Regarding claim 2, The driving circuit for a power semiconductor element according to claim 1, wherein the first gate voltage control circuit is configured to: increase the gate voltage to a first voltage at a first slope in the first time region (slope of Vge in ST1 time region); increase the gate voltage from the first voltage at a second slope gentler than the first slope in the second time region (ST2a slope in the second time region) ; and increase the gate voltage to the mirror voltage at a third slope (ST2b) gentler than the first slope and steeper than second slope in the third time region when the gate voltage has not reached the mirror voltage in the second time region, and the second gate voltage control circuit is configured to increase the gate voltage from the mirror voltage at a fourth slope steeper than the third slope (ST3). Regarding claim 13, A method of driving a power semiconductor element, the method comprising: increasing a gate voltage of the power semiconductor element to a first voltage at a first slope in a first time region after receipt of a turn-on command of the power semiconductor element (slope of Vge in ST1 time region); increasing the gate voltage from the first voltage at a second slope gentler than the first slope in a second time region following the first time region (ST2a slope in the second time region); increasing, when the gate voltage has not reached a mirror voltage in the second time region, the gate voltage to the mirror voltage at a third slope (ST2b) gentler than the first slope and steeper than the second slope in a third time region following the second time region; and increasing the gate voltage from the mirror voltage at a fourth slope (ST3) steeper than the third slope. Regarding claim 14, wherein increasing the gate voltage from the mirror voltage at the fourth slope (ST3) is performed when a predetermined period has elapsed since receipt of the turn- on command (TON). Allowable Subject Matter Claims 3-11 and 15-16 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUAN THIEU LAM whose telephone number is (571)272-1744. The examiner can normally be reached Monday-Friday, 8:30 am to 5:00 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lincoln Donovan can be reached at 571-272-1988. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUAN T LAM/Primary Examiner, Art Unit 2842 1/10/2026
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Prosecution Timeline

Oct 22, 2024
Application Filed
Jan 14, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
91%
With Interview (+13.3%)
2y 1m
Median Time to Grant
Low
PTA Risk
Based on 1001 resolved cases by this examiner. Grant probability derived from career allow rate.

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