Prosecution Insights
Last updated: October 01, 2026
Application No. 18/865,595

MOUNTING SUBSTRATE AND MOUNTING SUBSTRATE MANUFACTURING METHOD

Non-Final OA §102
Filed
Nov 13, 2024
Priority
May 20, 2022 — JP 2022-083431 +1 more
Examiner
SAWYER, STEVEN T
Art Unit
Tech Center
Assignee
Panasonic Holdings Corporation
OA Round
1 (Non-Final)
72%
Grant Probability
Favorable
1-2
OA Rounds
6m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 72% — above average
72%
Career Allowance Rate
761 granted / 1050 resolved
+12.5% vs TC avg
Strong +30% interview lift
Without
With
+30.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
30 currently pending
Career history
1077
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
64.4%
+24.4% vs TC avg
§102
24.0%
-16.0% vs TC avg
§112
9.6%
-30.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1050 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Group I (claims 1-3) in the reply filed on 8/10/2026 is acknowledged. Claims 4-5 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected subject matter. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-3 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Ko et al. (US Patent 10849225). Regarding claim 1 – Ko teaches a mounting substrate (fig. 1 [title] Ko states, “printed circuit board”) comprising: an insulating layer (12 [column 4 line 6] Ko states, “the insulating layer 12”); and a plurality of conductive bumps (24 & 26 [column 4 lines 5-6] Ko states, “a pad 24, and a post 26”) arranged on or above the insulating layer (both bumps 24 & 26 are considered “on” the insulating layer 12), wherein a variation in height position between a plurality of first end faces (top faces) of the plurality of conductive bumps (24 & 26) on a side opposite to the insulating layer (12) is smaller than a variation in height position between a plurality of second end faces (bottom face) of the plurality of conductive bumps (24 & 26) on a side where the insulating layer (12) is located (annotated figure 1 below shows the top face of conductive bumps 24 & 26 being coplanar having a smaller variation in height than the bottom face of the conductive bumps). PNG media_image1.png 562 880 media_image1.png Greyscale Regarding claim 2 – Ko teaches the mounting substrate according to claim 1, further comprising: a wiring layer (fig. 1, 22 [column 4 line 5] Ko states, “pattern 22”) located on or above the insulating layer (12, the wiring layer 22 is considered to be “on” the insulating layer 12), wherein a height position of a third end face (top surface of wiring layer 22 shown in annotated figure 1 above) of the wiring layer (22) on the side opposite to the insulating layer (12) is closer to the insulating layer (12) than a height position of each of the plurality of first end faces is (figure 1 shows the wiring layer 22 third end face being coplanar closer with the insulating layer 12 than the first end faces that are shown to protrude above the insulating layer 12). Regarding claim 3 – Ko teaches the mounting substrate according to claim 1, wherein the insulating layer (fig. 1, 12) includes a via hole (see via holes below conductive bumps 24 [column 4 lines 50-52] Ko states, “a via passing through the first insulating layer 12 may be connected to the lower surface of the pad 24”), and the mounting substrate further comprises: a via electrode (see conductive material with the via holes) located in the via hole, overlapping with a specific conductive bump (24) of the plurality of conductive bumps (24 & 26) in a plan view, and electrically connected to the specific conductive bump (claimed structure shown in figure 1). Claim(s) 1-2 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Huemoeller et al. (US Patent 7589398). Regarding claim 1 – Huemoeller teaches a mounting substrate (fig. 5D) comprising: an insulating layer (501D [column 19 line 62] Huemoeller states, “dielectric layer 501D”); and a plurality of conductive bumps (508D and combined 565D & 511D [columns 19 & 20 lines 65-66 & 1-2] Huemoeller states, “bias trace 508D…bias trace 565D…bias trace 511D”) arranged on or above the insulating layer (501D), wherein a variation in height position between a plurality of first end faces (top faces) of the plurality of conductive bumps (508D and combined 565D & 511D) on a side opposite to the insulating layer (501D) is smaller than a variation in height position between a plurality of second end faces (bottom face) of the plurality of conductive bumps (508D and combined 565D & 511D) on a side where the insulating layer (501D) is located (figure 5D shows the top face of conductive bumps 508D & 565D/511D being coplanar having a smaller variation in height than the bottom face of the conductive bumps which shows one conductive bump on the upper surface of the insulating layer and the other being embedded within the insulating layer). Regarding claim 2 – Huemoeller teaches the mounting substrate according to claim 1, further comprising: a wiring layer (fig. 5D, 510D [column 19 line 67] Huemoeller states, “signal trace 510D”) located on or above the insulating layer (501D), wherein a height position of a third end face (top surface of wiring layer 510D) of the wiring layer (510D) on the side opposite to the insulating layer (501D) is closer to the insulating layer (501D) than a height position of each of the plurality of first end faces is (figure 1 shows the wiring layer 510D third end face being closer with the insulating layer 501D than the first end faces of the conductive bumps 508D & 565D/511D). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Weng et al. (US Patent 12414232) discloses a substrate structure having minor height variation at an upper surface of contacts. Choi et al. (US PG. Pub. 2017/0176804) discloses bumps with different heights. Kodani (US PG. Pub. 2010/0314254) discloses a wiring substrate with different sized pad thicknesses. Liu et al. (US PG. Pub. 2020/0303334) discloses a semiconductor device and package. Any inquiry concerning this communication or earlier communications from the examiner should be directed to STEVEN T SAWYER whose telephone number is (571)270-5469. The examiner can normally be reached M-F 8:30 am - 5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Timothy Thompson can be reached at 5712722342. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /STEVEN T SAWYER/Primary Examiner, Art Unit 2847
Read full office action

Prosecution Timeline

Nov 13, 2024
Application Filed
Aug 28, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12739968
MULTILAYER DIELECTRIC SUBSTRATE AND METHOD FOR MANUFACTURING MULTILAYER DIELECTRIC SUBSTRATE
3y 7m to grant Granted Sep 15, 2026
Patent 12739969
COLLAPSE-FREE CIRCUIT STRUCTURE WITH LOW CAPACITANCE EFFECT
2y 4m to grant Granted Sep 15, 2026
Patent 12733097
DISK DEVICE
3y 0m to grant Granted Sep 08, 2026
Patent 12733092
WIRING BOARD
2y 10m to grant Granted Sep 08, 2026
Patent 12727078
CIRCUIT BOARD AND MANUFACTURING METHOD THEREOF
3y 1m to grant Granted Sep 01, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
72%
Grant Probability
99%
With Interview (+30.5%)
2y 5m (~6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1050 resolved cases by this examiner. Grant probability derived from career allowance rate.

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