Prosecution Insights
Last updated: July 17, 2026
Application No. 18/872,184

SEMICONDUCTOR SWITCHING ELEMENT DRIVE CIRCUIT

Non-Final OA §102§112
Filed
Dec 05, 2024
Priority
Sep 13, 2022 — nonprovisional of PCTJP2022034156
Examiner
LAM, TUAN THIEU
Art Unit
2843
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Mitsubishi Electric Corporation
OA Round
1 (Non-Final)
78%
Grant Probability
Favorable
1-2
OA Rounds
6m
Est. Remaining
91%
With Interview

Examiner Intelligence

Grants 78% — above average
78%
Career Allowance Rate
791 granted / 1020 resolved
+9.5% vs TC avg
Moderate +13% lift
Without
With
+13.2%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 2m
Avg Prosecution
32 currently pending
Career history
1051
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
53.7%
+13.7% vs TC avg
§102
23.0%
-17.0% vs TC avg
§112
12.8%
-27.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1020 resolved cases

Office Action

§102 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 112 Claims 1-8 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. In claim 1, the recitation of “wherein the output voltage for generating the switching signal by the output voltage detection circuitry in a case where the temperature is a first temperature is larger than the output voltage for generating the switching signal by the output voltage detection circuitry in a case where the temperature is a second temperature lower than the first temperature” is not fully understood. It is unclear as to what are the conditions being set. Did the applicant mean the switching signal is generated when first temperature is larger than the output voltage and the first temperature is larger than a second temperature? Thus, the metes and bounds of the claim cannot be determined renders the claim indefinite. Claims 2-8 are indefinite because of the technical deficiencies of claim 1. Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, insofar as being understood, is/are rejected under 35 U.S.C. 10(a)(1) as being anticipated by Kondou et al. (US 2017/0021733). Regarding claim 1, Koudou et al.’s figure 2 shows A semiconductor switching element drive circuit (43) that drives a gate of a semiconductor switching element (30), the semiconductor switching element drive circuit comprising: a control circuitry (44) that switches a switching speed during turn-off operation of the semiconductor switching element (transistors 461, 462, 481, 482 controls the turn off speed of the switching element 30; paragraph 0082) based on a switching signal (output from 12; figure 1); and an output voltage detection circuitry (12) that generates the switching signal based on a temperature (62) related to the semiconductor switching element and an output voltage of the semiconductor switching element (sensed voltage through resistor 37; figure 2; paragraph 0075), wherein the output voltage for generating the switching signal by the output voltage detection circuitry in a case where the temperature is a first temperature is larger than the output voltage for generating the switching signal by the output voltage detection circuitry in a case where the temperature is a second temperature lower than the first temperature (insofar as being understood are disclosed in paragraphs 0112, 0116, 0132, 0136) as called for in claim 1. Claim(s) 1, insofar as being understood, is/are rejected under 35 U.S.C. 10(a)(1) as being anticipated by Chen et al. (USP 10,491,095). Regarding claim 1, Chen et al.’s figure 4 shows A semiconductor switching element drive circuit (402) that drives a gate of a semiconductor switching element (404), the semiconductor switching element drive circuit comprising: a control circuitry (402, 302) that switches a switching speed during turn-off operation of the semiconductor switching element (transistors 316, 324, 318, 326 control the turn off speed of the switching element 304) based on a switching signal (336); and an output voltage detection circuitry (306, 308, 412, 414) that generates the switching signal based on a temperature (410) related to the semiconductor switching element and an output voltage of the semiconductor switching element (sensed voltage of voltage divider in 308), wherein the output voltage for generating the switching signal by the output voltage detection circuitry in a case where the temperature is a first temperature is larger than the output voltage for generating the switching signal by the output voltage detection circuitry in a case where the temperature is a second temperature lower than the first temperature as called for in claim 1. Allowable Subject Matter Claims 2-8 would be allowable if rewritten to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, set forth in this Office action and to include all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUAN THIEU LAM whose telephone number is (571)272-1744. The examiner can normally be reached Monday-Friday, 8:30 am to 5:00 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Regis Betsch can be reached at 571-270-7101. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUAN T LAM/Primary Examiner, Art Unit 2843 3/20/2026
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Prosecution Timeline

Dec 05, 2024
Application Filed
Apr 16, 2026
Non-Final Rejection mailed — §102, §112
Jun 23, 2026
Interview Requested
Jul 02, 2026
Applicant Interview (Telephonic)
Jul 02, 2026
Examiner Interview Summary

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
78%
Grant Probability
91%
With Interview (+13.2%)
2y 2m (~6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1020 resolved cases by this examiner. Grant probability derived from career allowance rate.

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