Prosecution Insights
Last updated: July 17, 2026
Application No. 18/888,816

MEASURING A LEAKAGE CURRENT FOR POWER TOKEN ALLOCATIONS

Non-Final OA §102
Filed
Sep 18, 2024
Priority
Feb 05, 2024 — provisional 63/549,955
Examiner
MAHONEY, CHRISTOPHER E
Art Unit
2852
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology Inc.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
899 granted / 1082 resolved
+15.1% vs TC avg
Moderate +12% lift
Without
With
+11.7%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
21 currently pending
Career history
1100
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
70.1%
+30.1% vs TC avg
§102
12.8%
-27.2% vs TC avg
§112
5.5%
-34.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1082 resolved cases

Office Action

§102
DETAILED ACTION Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-2 and 8-9 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Monferrer (U.S. Publication No. 2008/0244278). Monferrer teaches determining a temperature associated with a system (fig. 1, 108-1, 108-2); driving the system into an idle state responsive to determining the temperature (¶28, “Moreover, in one embodiment, dynamic calibration of an IC component may be performed in idle mode (e.g., where there is no dynamic power consumption). In such situation, the temperature increase (over a controlled ambient temperature) in each portion (e.g., blocks) of the IC component may be dependant upon the leakage power.”); measuring a leakage current of the system while in the idle state (¶28 “The leakage values may then be computed based on the static temperatures of the portions (since other constants may be known, such as supply voltage, threshold voltage, and ambient temperature); associating the temperature with the measured leakage current (¶27); and allocating a power token based on the temperature and the measured leakage current (¶11 “manage power consumption of one or more components of the corresponding domain.” See also ¶12). Regarding claim 2, there are only three possible allocations, static, dynamic or combined. Since all three are claimed, at least one is anticipated. ¶12 teaches dynamic power estimation. Regarding claim 8, Monferrer teaches a voltage regulator 110 to regulate an amount of voltage supplied to a system; a temperature sensor 108 to measure a temperature associated with the system; a current sensor to measure a leakage current of the system (106, determining power leakage is determining current leakage) while the system is in an idle state (¶28); a circuitry coupled to the voltage regulator, the temperature sensor, and the current sensor, wherein the circuitry is configured to: associate the amount of voltage supplied and the measured temperature with the measured leakage current; and store the measured leakage current associated with the amount of voltage supplied and the measured temperature and a current date and time in a data structure ((¶¶13-14); and a resource manager (¶11 “manage power consumption of one or more components of the corresponding domain.” See also ¶12) to allocate a power token based on the amount of voltage supplied, the measured temperature, the measured leakage current, and the current date and time stored in the data structure. Regarding claim 9, the data structure includes a plurality of temperatures corresponding to a plurality of voltages (¶14); the stored temperature is one of the plurality of temperatures and the stored voltage is one of a plurality of voltages; and the resource manager is to allocate the power token based on the one of the plurality of temperatures and the one of the plurality of voltages (figs. 2A, 2B). Allowable Subject Matter Claims 3-7 and 10-15 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claims 16-20 are allowed. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to CHRISTOPHER E MAHONEY whose telephone number is (571)272-2122. The examiner can normally be reached 9-5:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Stephanie Bloss can be reached at 571-272-3555. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHRISTOPHER E MAHONEY/Primary Examiner, Art Unit 2852
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Prosecution Timeline

Sep 18, 2024
Application Filed
Jun 03, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
95%
With Interview (+11.7%)
1y 11m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1082 resolved cases by this examiner. Grant probability derived from career allowance rate.

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