Prosecution Insights
Last updated: July 17, 2026
Application No. 18/949,205

SEMICONDUCTOR INSPECTION APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

Non-Final OA
Filed
Nov 15, 2024
Priority
Jan 25, 2024 — RE 10-2024-0011727
Examiner
TABA, MONICA TERESA
Art Unit
2878
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
89%
Grant Probability
Favorable
1-2
OA Rounds
5m
Est. Remaining
93%
With Interview

Examiner Intelligence

Grants 89% — above average
89%
Career Allowance Rate
186 granted / 210 resolved
+20.6% vs TC avg
Minimal +4% lift
Without
With
+4.3%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
30 currently pending
Career history
233
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
86.3%
+46.3% vs TC avg
§102
4.7%
-35.3% vs TC avg
§112
7.8%
-32.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 210 resolved cases

Prosecution Timeline

Nov 15, 2024
Application Filed
Jun 02, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12682862
FIELD REPAIR RECALIBRATION
1y 11m to grant Granted Jul 14, 2026
Patent 12669373
PHOTOELECTRIC SENSOR CAPABLE OF RESISTING HIGH-FREQUENCY LIGHT INTERFERENCE
2y 8m to grant Granted Jun 30, 2026
Patent 12663374
SYSTEMS AND METHODS FOR PRECISION NONLINEAR MICROSCOPY
2y 4m to grant Granted Jun 23, 2026
Patent 12656254
METHOD AND SYSTEM FOR CONTROLLING THE MANUFACTURE OF RUBBER PRODUCTS IN RESPONSE TO THE PHYSICOCHEMICAL PROPERTIES OF A RUBBER MIXTURE
2y 1m to grant Granted Jun 16, 2026
Patent 12652876
IMAGE SENSOR
2y 7m to grant Granted Jun 09, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
89%
Grant Probability
93%
With Interview (+4.3%)
2y 1m (~5m remaining)
Median Time to Grant
Low
PTA Risk
Based on 210 resolved cases by this examiner. Grant probability derived from career allowance rate.

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