Prosecution Insights
Last updated: July 17, 2026
Application No. 18/955,964

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

Non-Final OA
Filed
Nov 21, 2024
Priority
Jan 04, 2024 — JP 2024-000325
Examiner
DOUMBIA, MOHAMED
Art Unit
2877
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Kabushiki Kaisha Toshiba
OA Round
1 (Non-Final)
72%
Grant Probability
Favorable
1-2
OA Rounds
1y 4m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 72% — above average
72%
Career Allowance Rate
57 granted / 79 resolved
+4.2% vs TC avg
Strong +31% interview lift
Without
With
+30.6%
Interview Lift
resolved cases with interview
Typical timeline
3y 0m
Avg Prosecution
14 currently pending
Career history
90
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
93.0%
+53.0% vs TC avg
§102
3.3%
-36.7% vs TC avg
§112
3.3%
-36.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 79 resolved cases

Prosecution Timeline

Nov 21, 2024
Application Filed
May 12, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12680955
PHOTODETECTOR AND BEATING SPECTROSCOPY DEVICE
3y 4m to grant Granted Jul 14, 2026
Patent 12680960
SYSTEM AND METHOD FOR MEASURING OPTICAL DETECTOR SIGNALS HAVING EXTENDED DYNAMIC RANGE
2y 9m to grant Granted Jul 14, 2026
Patent 12674706
LIGHTING DEVICE
1y 11m to grant Granted Jul 07, 2026
Patent 12669377
SYSTEM FOR MEASURING AN ESTIMATED DEGREE OF LINEAR POLARIZATION OF AN ELECTROMAGNETIC RADIATION REFLECTED BY A SCENE
3y 0m to grant Granted Jun 30, 2026
Patent 12660556
USING UN-PATTERNED AND PATTERNED METROLOGY TARGETS FOR IN SITU PROCESS MONITORING
2y 5m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
72%
Grant Probability
99%
With Interview (+30.6%)
3y 0m (~1y 4m remaining)
Median Time to Grant
Low
PTA Risk
Based on 79 resolved cases by this examiner. Grant probability derived from career allowance rate.

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