Prosecution Insights
Last updated: April 18, 2026
Application No. 18/959,092

Display Device

Non-Final OA §103§112
Filed
Nov 25, 2024
Examiner
SHEN, PEIJIE
Art Unit
2622
Tech Center
2600 — Communications
Assignee
LG Display Co., Ltd.
OA Round
3 (Non-Final)
79%
Grant Probability
Favorable
3-4
OA Rounds
2y 6m
To Grant
97%
With Interview

Examiner Intelligence

Grants 79% — above average
79%
Career Allow Rate
266 granted / 337 resolved
+16.9% vs TC avg
Strong +18% interview lift
Without
With
+18.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
16 currently pending
Career history
353
Total Applications
across all art units

Statute-Specific Performance

§101
1.8%
-38.2% vs TC avg
§103
49.5%
+9.5% vs TC avg
§102
22.1%
-17.9% vs TC avg
§112
22.7%
-17.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 337 resolved cases

Office Action

§103 §112
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed has been entered. Response to Arguments From previous office action on 1/27/26: claims 1, 4, 5, 7, and 13-19 are allowed. Claim 8 has been rejected under prior arts, and claims 9-12 have been rejected under 35 U.S.C. 112. Applicant has amended “one subpixel” from claim 8 to “at least one subpixel”, and incorporate subject matter of previous claim 9 into claim 8 to recite: “wherein the compensating circuit obtains the property value from two subpixels among the plurality of subpixels”. Applicant's arguments filed have been fully considered but they are not persuasive, for the amended claim does not overcome 35 U.S.C. 112 issue (see 35 U.S.C. 112 rejection below for detail). Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 8, 10-12 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Amended claim 8 recite, inter alia: “a controlling circuit configured to select at least one subpixel as a sensing subject from the plurality of subpixels in one pixel of the plurality of pixels based on a deterioration information of the plurality of subpixels, and supply the data signal from the data driving circuit to the at least one subpixel; and a compensating circuit configured to obtain a property value of the at least one subpixel, wherein the deterioration information is an accumulated data obtained by adding the data signals of multiple instances supplied to the at least one subpixel based on a predetermined equation, wherein the controlling circuit selects the at least one subpixel estimated to have a greatest deterioration from the plurality of subpixels based on the accumulated data, and wherein the compensating circuit obtains the property value from two subpixels among the plurality of subpixels. Instant application has given example of interpretation of “at least one” from paragraph 29 of specification: [0029] The term “at least one” should be understood as including any and all combinations of one or more of the associated listed items. For example, the meaning of “at least one of a first element, a second element, and a third element” encompasses the combination of all three listed elements, combinations of any two of the three elements, as well as each individual element, the first element, the second element, or the third element. The scope of various limitations of claim 8 in which “at least one subpixel” is recited, therefore, cover the scope wherein one subpixel, three subpixel, or four subpixel are selected among the plurality of subpixels of one subpixel. The newly amended part of claim 8, however, specifically require two subpixels from each pixels to be selected. The scope of claim 8 is therefore indefinite as it is unclear how many subpixels are selected among each pixel. In addition, limitations of claim 8 of “the controlling circuit selects at least one subpixel estimated to have a greatest deterioration from the plurality of subpixels” and “obtains the property value from two subpixels among the plurality of subpixels” are inconsistent with each other, for the claim is unclear on how subpixels are selected differently when only one subpixel has greatest deterioration, or when two or more subpixels have same largest deterioration amount among plurality of subpixels. From corresponding disclosure in specification of instant application, the only disclosed embodiment from specification wherein two subpixels are selected from subpixels from a same pixel for data sensing is found in fig. 4, paragraphs 67-75. Based on corresponding disclosure from fig. 4 of instant application, each pixel in the embodiment disclosed in pending application include four colored subpixels: red, green, blue and white. From the only embodiment disclosed in which two subpixels from each pixel are selected for sensing data: One subpixel is always selected between a red subpixel and a white subpixel, the one subpixel selected from the red or white subpixel is the subpixel having accumulated greater amount of deterioration among the red and white subpixels If the red subpixel and white subpixel are deemed to have same amount of accumulated deterioration, the subpixel having greater maximum luminance among red subpixel and white subpixel are selected (e.g. white subpixel) One subpixel is always selected between a blue subpixel and a green subpixel, the one subpixel selected from the blue or green subpixel is the subpixel having accumulated greater amount of deterioration among the blue and green subpixels If the blue subpixel and green subpixel are deemed to have same amount of accumulated deterioration, the subpixel having greater maximum luminance among blue subpixel and green subpixel is selected (e.g. green subpixel) In summary, one subpixel having greater deterioration is selected from red and white subpixel, and another subpixel having greater deterioration is selected from blue and green subpixel; if white/red subpixels have same deterioration, white subpixel is selected; and if blue/green subpixels have same deterioration, green subpixel is selected. It is further noted that based on disclosure of specification from fig. 4, the two subpixel having greatest deterioration are not necessarily always selected. Consider, for example the following scenario: Subpixel Color Red White Blue Green Deterioration Amount 300 300 500 500 Maximum Luminance 300 600 300 600 According to method is disclosed in fig. 4, in the above scenario, white and green subpixel would be selected, while blue and green subpixel are the two subpixels having the greatest amount of deterioration instead. Claims 10-12 are rejected for dependency on rejected claim 8. Applicant is encouraged to review specification, claims 8, and 10-12 to ensure claims are amended to be definitive and supported by corresponding disclosure. For the purpose of this office action, “two subpixels” from claim 8 is interpreted as “at least one subpixel”. Allowable Subject Matter Claims 1, 4, 5, 7, 13-19 are allowed. The following is a statement of reasons for the indication of allowable subject matter: Regarding independent claim 1 and dependent claims thereof, none of cited prior art disclose as a whole: a controlling circuit configured to select one subpixel as a sensing subject from the plurality of subpixels in one pixel of the plurality of pixels based on a deterioration information of the plurality of subpixels, and supply the data signal from the data driving circuit to the one subpixel; and a compensating circuit configured to obtain a property value of the one subpixel, wherein the deterioration information is an accumulated data obtained by adding the data signals of multiple instances supplied to the one subpixel based on a predetermined equation, wherein each of the plurality of pixels includes a first subpixel which is not selected as the sensing subject and a second subpixel which is selected as the sensing subject, and wherein the compensating circuit estimates the property value of the first subpixel of the one pixel based on the accumulated data of the first subpixel of the one pixel and the property value obtained from the second subpixel of other pixels of the plurality of pixels. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claim 8 is rejected under 35 U.S.C. 103 as being unpatentable over Yoo et al., US 20220208129 (hereinafter “Yoo”), in further view of Ok et al., US 20200372861 A1 (hereinafter “Ok”). Regarding claim 1, Yoo discloses a display device (fig. 1, paragraphs 30-32, display device with LED pixels), comprising: a pixel array having a plurality of pixels disposed as a matrix (fig. 1, 9, paragraphs 39, 61, pixel array of pixels SP) and a gate line (fig. 1, 9, paragraphs 35, 39, gate lines GL1~GLm connected to pixel array), each of the plurality of pixels including a plurality of subpixels (fig. 1, 9, 15, paragraphs 61, “one pixel P includes a red sub-pixel SPR, a white sub-pixel SPW, a green sub-pixel SPG, and a blue sub-pixel SPB”), and the plurality of subpixels in one row commonly sharing the gate line (fig. 1, pixel/subpixels of same row shares a same gate line); PNG media_image1.png 778 1082 media_image1.png Greyscale a gate driving circuit (fig. 1, scan driver 130) configured to supply a gate signal to the plurality of subpixels through the gate line (paragraph 35, “The scan driver 130 may output a scan signal (or scan voltage) in response to the gate timing control signal GDC supplied from the timing controller 120. The scan driver 130 may supply the scan signal to sub-pixels included in the display panel 150 through gate lines GL1 to GLm”); a data driving circuit configured to supply a data signal to each of the plurality of subpixels in one column of the matrix through a data line (fig. 1 data driver 140, paragraph 36, “The data driver 140 may sample and latch the data signal DATA in response to the data timing control signal DDC supplied from the timing controller 120, convert the resulting digital data signal into an analog data voltage based on a gamma reference voltage, and output the converted analog data voltage. The data driver 140 may supply the data voltage to the sub-pixels included in the display panel 150 through data lines DL1 to DLn”, see fig. 1, each data line DL1~DLn configured to supply data signal to one column of subpixels); a controlling circuit configured to select at least one subpixel from the plurality of subpixels in one pixel of the plurality of pixels, and supply the data signal from the data driving circuit to the at least one subpixel; and a compensating circuit configured to obtain a property value of the at least one subpixel, wherein the compensating circuit obtains the property value from at least one subpixel among the plurality of subpixels (fig. 8, 15-17 paragraphs 69-102, a pixel comprising red, green, blue, and white subpixels, wherein as an example the white subpixel is selected by Sense and Scan signal to have sensing of property value to be performed by a compensation circuit; in particular, the subpixel selected is supplied with a sensing data voltage, and black data voltage supplied to other subpixels of green, blue and red within the pixel, and property value of selected white subpixel is obtained, paragraphs 52, 56, “The sensing transistor ST is a type of compensation circuit which is additionally provided to compensate for deterioration (in a threshold voltage or the like) of the driving transistor DT or organic light emitting diode OLED. The sensing transistor ST may enable physical threshold voltage sensing based on a source follower operation of the driving transistor DT. The sensing transistor ST may operate to acquire a sensed voltage through a sensing node defined between the driving transistor DT and the organic light emitting diode OLED”, paragraphs 58, 72, 73, 75, “The sampling circuit SAM may operate with the sensing controller SIW to perform a sampling operation for acquiring a sensed voltage through the first reference line REF1. The analog-to-digital converter ADC may convert an analog sensed voltage acquired by the sampling circuit SAM into a digital sensed voltage and output the converted digital sensed voltage”, “The panel driving circuit 141 may drive the white data voltage output unit DAC[W] for the sensing time to output a sensing voltage … Upon receiving the sensing voltage and the pre-charge voltage through the switching transistor TR and the sensing transistor ST turned on by the scan signal Scan and the sense signal Sense, the white sub-pixel SPW may enter a sensing enable state”, “When the sampling signal Sam is changed from logic low L to logic high H, the sampling circuit SAM may perform a sampling operation for acquiring a sensed voltage Vsen through the white sub-pixel SPW connected to the first reference line REF1.”) PNG media_image2.png 1024 1032 media_image2.png Greyscale PNG media_image3.png 1062 1282 media_image3.png Greyscale Yoo does not disclose in particular: wherein the deterioration information is an accumulated data obtained by adding the data signals of multiple instances supplied to the at least one subpixel based on a predetermined equation, and wherein the controlling circuit selects the at least one subpixel estimated to have a greatest deterioration from the plurality of subpixels based on the accumulated data, In similar field of endeavor of sensing subpixel property value for deterioration information, Ok discloses motivation and technique of selecting subpixels to be sensed for subpixel property value based on deterioration information of the plurality of subpixels, and wherein the deterioration information for each subpixel is obtained and stored by adding data signals of multiple instances supplied to the subpixel until a timing when the sensing signal is supplied to the subpixel based on a predetermined equation, and wherein the selected subpixel for sensing is the subpixel having higher or highest level of deterioration. See Ok, fig. 1, paragraphs 32, 33, 46, display device with a pixel array (note the “pixel” of Ok corresponds to “subpixel” of pending claim, and “pixel block” of Ok may corresponds to “pixel” of pending claim); fig. 2, 8, paragraphs 39, 61, 62, 86, 87, 98, 99, sensing controller 214 with associated ADC and sensing line connected to each subpixels to sense subpixel property value: “In the sensing mode, electrical characteristics of the pixel PX may be measured. The switching transistor SWT may supply a sensing data voltage applied via the data line DL to the driving transistor DT. When the sensing transistor SST is turned on, a current IDT proportional to the difference between a voltage of the gate node N1 and a voltage of the source node N2 of the driving transistor DT, e.g., the driving voltage Vgs, may flow to the sensing line SL … a sensing signal SS received via the sensing line SL may be converted into sensing data SDT by the ADC”. fig. 2, 9, 10A, 10B, paragraphs 47, 59, 105, 106, 114, 115, deterioration information for each subpixel is accumulated by adding data supplied to the subpixel since display device start to display image: “The accumulator 212 may receive the compensated data CDT, and calculate and accumulate degradation values to generate an accumulated degradation value, based on the compensated data CDT. The accumulated degradation value indicates a degree of deterioration of the pixel over time, and thus, is to be updated over time, starting from a time point at which the display panel 20 of FIG. 1 starts to display an image”, “The accumulator 212 may generate an accumulated degradation value ADV(N) of a current frame, e.g., an N-th frame, by reading an accumulated degradation value ADV(N−1) of a previous frame, e.g., an (N−1)th frame (hereinafter referred to as a ‘previous accumulated degradation value’), from the nonvolatile memory 213, and then, accumulating (e.g., adding) the degradation value DV to the previous accumulated degradation value ADV(N−1)”, “even when the compensated data CDT represents the same gradations, the level of the driving signal may vary according to the gamma characteristic or the luminance characteristics. Therefore, to more accurately reflect the driving signal DS applied to the pixel, in other words, a stress applied to the pixel, for generation of an accumulated degradation value ADV, the accumulator 212 may convert the compensated data CDT into the driving data DD, based on the gamma control signal GMC or the luminance control signal LC, and generate the accumulated degradation value ADV, based on the driving data DD.” Paragraphs 48, 68, 69, 75, subpixels selected for sensing of property value is based on deterioration information of the plurality of subpixels, with subpixel selected based on higher accumulated deterioration information: “The sensing controller 214 may determine a sensing pixel block, the electrical characteristics of which are to be sensed, based on a plurality of accumulated degradation values of the plurality of pixel blocks (S120). The sensing controller 214 may determine, as a sensing pixel block, at least one pixel block having a relatively high accumulated degradation value among the plurality of pixel blocks”; “When the degree of degradation is high, a consistency ratio between the accumulated degradation value and a degradation rate may decrease. Accordingly, the sensing controller 214 may control electrical data sensing to be performed on the sensing pixel block to correct an accumulated degradation value of a pixel block whose degree of degradation is estimated to be highest.” It would have been obvious to one of ordinary skill in the art at the time of filing to incorporate the concept of selecting subpixels to be sensed for subpixel property value based on deterioration information of the plurality of subpixels, and wherein the deterioration information for each subpixel is obtained and stored by adding data signals of multiple instances supplied to the subpixel until a timing when the sensing signal is supplied to the subpixel based on a predetermined equation, and wherein the selected subpixel for sensing is the subpixel having higher or highest level of deterioration, such as disclosed by Ok, into the display device of Yoo which select one subpixel from the plurality of subpixels in one pixel of the plurality of pixels to obtain a property value of the one subpixel, to constitute wherein the deterioration information is an accumulated data obtained by adding the data signals of multiple instances supplied to the at least one subpixel based on a predetermined equation, and wherein the controlling circuit selects the at least one subpixel estimated to have a greatest deterioration from the plurality of subpixels based on the accumulated data, such is incorporation of a known technique into a known device to yield predictable result, the result would have been predictable and would allow display device to more accurately compensate for deterioration of subpixels and improve display quality (see Ok, paragraph 50-52: “When only the degradation model method is used for data compensation to prevent degradation of image quality due to pixel degradation, data compensation efficiency may decrease when a consistency ratio between the degradation model and an actual degradation rate is low according to a driving environment. … when only the characteristic sensing method is used for data compensation, a time for sensing characteristics (e.g., a time for which the sensing mode is driven) is additionally required, … However, when electrical characteristics are sensed simultaneously with the driving of a display, an unintended image may be output on the display panel 20. … the display device according the inventive concept performs data compensation, based on the degradation model method using an accumulated degradation value, and corrects the accumulated degradation value, based on the characteristic sensing method. … a consistency ratio between the accumulated degradation value and an actual degradation rate may be increased … luminous uniformity and reliability of the display panel 20 may be increased”). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PEIJIE SHEN whose telephone number is (571)272-5522. The examiner can normally be reached Monday - Friday 10AM - 6PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Patrick Edouard can be reached at 5712727603. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PEIJIE SHEN/Examiner, Art Unit 2622 /PATRICK N EDOUARD/Supervisory Patent Examiner, Art Unit 2622
Read full office action

Prosecution Timeline

Nov 25, 2024
Application Filed
Sep 28, 2025
Non-Final Rejection — §103, §112
Dec 31, 2025
Response Filed
Jan 23, 2026
Final Rejection — §103, §112
Mar 13, 2026
Response after Non-Final Action
Mar 31, 2026
Request for Continued Examination
Apr 02, 2026
Response after Non-Final Action
Apr 04, 2026
Non-Final Rejection — §103, §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
79%
Grant Probability
97%
With Interview (+18.1%)
2y 6m
Median Time to Grant
High
PTA Risk
Based on 337 resolved cases by this examiner. Grant probability derived from career allow rate.

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