Prosecution Insights
Last updated: October 02, 2026
Application No. 18/972,079

MEMORY DEVICE HAVING ROW DECODER ARRAY ARCHITECTURE

Non-Final OA §DP
Filed
Dec 06, 2024
Priority
Nov 10, 2021 — RE 10-2021-0154275 +2 more
Examiner
HO, HOAI V
Art Unit
Tech Center
Assignee
Samsung Electronics Co., Ltd.
OA Round
1 (Non-Final)
93%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
98%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allowance Rate
1034 granted / 1116 resolved
+32.7% vs TC avg
Moderate +6% lift
Without
With
+5.5%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 8m
Avg Prosecution
16 currently pending
Career history
1127
Total Applications
across all art units

Statute-Specific Performance

§101
1.2%
-38.8% vs TC avg
§103
30.1%
-9.9% vs TC avg
§102
44.7%
+4.7% vs TC avg
§112
16.3%
-23.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1116 resolved cases

Office Action

§DP
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . 1. This office acknowledges receipt of the following item(s) from the Applicant: Information Disclosure Statement (IDS) was considered. Papers submitted under 35 U.S.C. 119(a)-(d) have been placed of record in the file. 2. Claims 9-28 are presented for examination. Double Patenting 3. The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the "right to exclude" granted by a patent and to prevent possible harassment by multiple assignees. See In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970);and, In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) may be used to overcome an actual or provisional rejection based on a nonstatutory double patenting ground provided the conflicting application or patent is shown to be commonly owned with this application. See 37 CFR 1.130(b). Effective January 1, 1994, a registered attorney or agent of record may sign a terminal disclaimer. A terminal disclaimer signed by the assignee must fully comply with 37 CFR 3.73(b). The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/process/file/efs/guidance/eTD-info-I.jsp. 4. Claims 9-28 are rejected under the judicially created doctrine of obviousness-type double patenting as being unpatentable over claims 1-8 of U.S. Patent No. 12198753. Although the conflicting claims are not identical, they are not patentably distinct from each other because the examined application claim is either anticipated by, or would have been obvious over, the reference claims as follows: Claims 9-16 of the examined application are anticipated and the same scope of invention by claims 1-8 of the reference such as a memory device comprising: a first chip including a memory cell area and a first metal pad, wherein the memory cell area includes: a plurality of word lines extending in a first horizontal direction; and a plurality of memory blocks separated from each other by a plurality of word line cut areas extending long in the first horizontal direction, and wherein the memory cell area is divided into a normal cell area in which a plurality of normal memory blocks among the plurality of memory blocks are disposed and a dummy cell area in which a plurality of dummy memory blocks among the plurality of memory blocks are disposed; and a second chip including a second metal pad and a peripheral circuit area, wherein the peripheral circuit area is connected to the memory cell area in a vertical direction by the first metal pad and the second metal pad connected with each other, wherein the peripheral circuit area includes a row decoder area in which a row decoder circuit for controlling a plurality of word lines of each memory block of the plurality of memory blocks of the normal cell area is disposed, wherein, when viewed in a plan view, the row decoder area is adjacent to the plurality of memory blocks, and where in the row decoder circuit includes: a first unit row decoder circuit connected to n normal memory blocks of the plurality of normal memory blocks, and a second unit row decoder circuit connected to m normal memory blocks of the plurality of normal memory blocks, the m and the n being positive integers and the m being smaller than the n. The claim 9 of examined application are obvious over the claims 1 and 5 of reference because the claim seems to differ because the claim seems to differ from the reference in that the claimed invention of the examined application recites a second chip while in the reference claimed a cell array structure vertically overlapping the peripheral circuit structure in a claim 1 and the memory cell area is divided into a plurality of tiles (i.e., a plurality of planes) in a claim 5. Therefore, one of ordinary skill in the art would have recognized that the tiles or the planes would be a plurality of chips. A metal pad in a claim 9 is obvious in the reference claimed the cell array structure vertically overlapping the peripheral circuit structure Claims 17-22 of the examined application are anticipated and the same scope of invention by claims 1-8 of the reference such as a memory device comprising: a first chip including: a memory cell area; a pair of dummy step areas disposed on opposite sides of the memory cell area; and a first metal pad, wherein the memory cell area includes: a plurality of word lines extending in a first horizontal direction, and a plurality of memory blocks separated from each other by a plurality of word line cut areas extending long in the first horizontal direction, wherein the memory cell area is divided into a normal cell area in which a plurality of normal memory blocks are disposed and a dummy cell area in which a plurality of dummy memory blocks are disposed, and wherein, in each dummy step area of the pair of dummy step areas, the plurality of word lines extend parallel to each other in the first horizontal direction and a second horizontal direction crossing the first horizontal direction and vertically overlap each other; and a second chip including a second metal pad and a peripheral circuit area, wherein the peripheral circuit area is connected in a vertical direction to the memory cell area by the first metal pad and the second metal pad connected with each other, wherein the peripheral circuit area includes a row decoder area in which a row decoder circuit for controlling a plurality of word lines of each memory block of the plurality of memory blocks of the normal cell area is disposed, wherein, when viewed in a plan view, the row decoder area is adjacent to the plurality of memory blocks, wherein the row decoder circuit includes: a first unit row decoder circuit connected to n normal memory blocks of the plurality of normal memory blocks, and a second unit row decoder circuit connected to m first normal memory blocks of the plurality of normal memory blocks, the m and the n being positive integers and the m being smaller than the n, wherein the second unit row decoder circuit is adjacent to an area where a first dummy step area among the pair of dummy step areas and the m first normal memory blocks are disposed, and wherein a height, in the second horizontal direction, of the second unit row decoder circuit corresponds to a sum of block heights of the m first normal memory blocks and a height, in the second horizontal direction, of the first dummy step area. The claim 17 of examined application are obvious over the claims 1 and 5 of reference because the claim seems to differ because the claim seems to differ from the reference in that the claimed invention of the examined application recites a second chip while in the reference claimed a cell array structure vertically overlapping the peripheral circuit structure in a claim 1 and the memory cell area is divided into a plurality of tiles (i.e., a plurality of planes) in a claim 5. Therefore, one of ordinary skill in the art would have recognized that the tiles or the planes would be a plurality of chips. A metal pad in a claim 17 is obvious in the reference claimed the cell array structure vertically overlapping the peripheral circuit structure. Claims 23-28 of the examined application are anticipated and the same scope of invention by claims 1-8 of the reference such as a memory device comprising: a first chip including a first memory cell area and a plurality of first metal pads, wherein the first memory cell area includes: a plurality of first word lines extending in a first horizontal direction; a plurality of first bit lines extending in a second horizontal direction crossing the first horizontal direction; and a plurality of first memory blocks separated from each other by a plurality of first word line cut areas extending long in the first horizontal direction, and wherein the first memory cell area is divided into a first normal cell area in which a plurality of first normal memory blocks among the plurality of first memory blocks are disposed and a first dummy cell area in which a plurality of first dummy memory blocks among the plurality of first memory blocks are disposed; a second chip including a second memory cell area and a plurality of second metal pads, wherein the second memory cell area includes: a plurality of second word lines extending in the first horizontal direction; a plurality of second bit lines extending in the second horizontal direction; and a plurality of second memory blocks separated from each other by a plurality of second word line cut areas extending long in the first horizontal direction, and where in the second memory cell area is divided into a second normal cell area in which a plurality of second normal memory blocks among the plurality of second memory blocks are disposed and a second dummy cell area in which a plurality of second dummy memory blocks among the plurality of second memory blocks are disposed; and a third chip including a plurality of third metal pads and a peripheral circuit area, wherein the peripheral circuit area is connected in a vertical direction to the first memory cell area and the second memory cell area by the plurality of first metal pads, the plurality of second metal pads and the plurality of third metal pads connected with each other, wherein the peripheral circuit area includes a row decoder area in which a row decoder circuit for controlling the plurality of first word lines of each memory block of the plurality of first memory blocks of the first normal cell area and the plurality of second word lines of each memory block of the plurality of second memory blocks of the second normal cell area is disposed, wherein, when viewed in a plan view, the row decoder area is adjacent to the plurality of first memory blocks and the plurality of second memory blocks, and wherein the row decoder circuit includes: a first unit row decoder circuit connected to n first normal memory blocks of the plurality of first normal memory blocks and n second normal memory blocks of the plurality of second normal memory blocks, and a second unit row decoder circuit connected to m first normal memory blocks of the plurality of first normal memory blocks and m second normal memory blocks of the plurality of second normal memory blocks, the m and the n being positive integers and the m being smaller than the n. The claim 23 of examined application are obvious over the claims 1 and 5 of reference because the claim seems to differ because the claim seems to differ from the reference in that the claimed invention of the examined application recites second and third chips while in the reference claimed a cell array structure vertically overlapping the peripheral circuit structure in a claim 1 and the memory cell area is divided into a plurality of tiles (i.e., a plurality of planes) in a claim 5. Therefore, one of ordinary skill in the art would have recognized that the tiles or the planes would be a plurality of chips. A metal pad in a claim 23 is obvious in the reference claimed the cell array structure vertically overlapping the peripheral circuit structure. 6. When responding to the office action, Applicants are advised to provide the examiner with the line numbers and page numbers in the application and/or references cited to assist the examiner to locate the appropriate paragraphs. 7. A shortened statutory period for response to this action is set to expire 3 (three) months and 0 (zero) day from the date of this letter. Failure to respond within the period for response will cause the application to become abandoned (see MPEP 710.02 (b)). 8. Any inquiry concerning this communication or earlier communications from the examiner should be directed to HOAI V HO whose telephone number is (571) 272-1777. The examiner can normally be reached 7:00 AM -- 5:30 PM from Thursday and Friday of the first week of a bi-week and Tuesday and Wednesday of the second week. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Amir Zarabian can be reached on (571) 272-1852. The fax phone number for the organization where this application or proceeding is assigned is (571)-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). /HOAI V HO/Primary Examiner, Art Unit 2827
Read full office action

Prosecution Timeline

Dec 06, 2024
Application Filed
Jan 31, 2025
Response after Non-Final Action
Sep 11, 2026
Non-Final Rejection mailed — §DP (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12744078
WRITEBACK CONTROL FOR READ-DESTRUCTIVE COMPUTER MEMORY
2y 3m to grant Granted Sep 22, 2026
Patent 12744087
SEMICONDUCTOR MEMORY DEVICE
2y 2m to grant Granted Sep 22, 2026
Patent 12738324
MEMORY SYSTEM
2y 4m to grant Granted Sep 15, 2026
Patent 12738338
INTERRUPTING A MEMORY BUILT-IN SELF-TEST
2y 2m to grant Granted Sep 15, 2026
Patent 12731648
NON-VOLATILE MEMORY WITH WORD LINE RAMP SENSING FOR MEMORY CELL TRACKING
2y 2m to grant Granted Sep 08, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
93%
Grant Probability
98%
With Interview (+5.5%)
1y 8m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1116 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month