Prosecution Insights
Last updated: May 29, 2026
Application No. 18/982,778

Applying and Using Unique Unclonable Physical Identifiers

Final Rejection §102§OTHER§Other
Filed
Dec 16, 2024
Priority
Nov 05, 2019 — provisional 62/930,875 +4 more
Examiner
MAI, THIEN T
Art Unit
2876
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Dust Identity Inc.
OA Round
3 (Final)
59%
Grant Probability
Moderate
4-5
OA Rounds
1y 8m
Est. Remaining
80%
With Interview

Examiner Intelligence

Grants 59% of resolved cases
59%
Career Allowance Rate
403 granted / 684 resolved
-9.1% vs TC avg
Strong +21% interview lift
Without
With
+20.8%
Interview Lift
resolved cases with interview
Typical timeline
3y 2m
Avg Prosecution
26 currently pending
Career history
724
Total Applications
across all art units

Statute-Specific Performance

§101
3.5%
-36.5% vs TC avg
§103
85.6%
+45.6% vs TC avg
§102
5.4%
-34.6% vs TC avg
§112
1.4%
-38.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 684 resolved cases

Office Action

§102 §OTHER §Other
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 38-61 is/are rejected under 35 U.S.C. 102a1 as being anticipated by Gaathon967 (WO 2017155967) Gaathon967 discloses 38. A method, comprising: receiving an object having a unique marker (103a) comprising a distribution of elements; scanning the unique marker of the object and extracting orientation information from the unique marker, the orientation information indicating relative-spatial orientations of the respective elements with respect to one another (Fig. 1B, 12-15); performing integrity verification of the object based on the extracted orientation information, wherein performing the integrity verification comprises: identifying a first area of the unique marker (i.e. a subset within a superset); identifying a second area of the unique marker (i.e. another subset or the superset itself); determining an integrity level for the object based on the first area and the second area (par. 42-43, 117-120, 128-130: each subset is a unique code that comprises elements with unique orientations, size, shape, distance, and respond to a stimulus of specific frequency, polarization, etc.; each element including within a subset has at least location orientation relative to the rest of elements within the global coordinate system of the object); and associating the integrity level with the unique marker of the object (par. 39, 42-43, 128-130). 39.38, wherein the integrity level is determined based on a relationship of the first area of the unique marker to the second area of the unique marker (par. 39, 42-43, 117-120, 130: properties of all elements in the superset are extracted; a subset of element is selected to generate a unique code; each element in the subset has a relationship with another in the superset in terms of i.e. distance, location, orientation, frequency response, … as seen in at least Figs. 1-3). 40.39, wherein the relationship is based on relative size of the first area to the second area (par. 128-130). 41.39, wherein the relationship is based on an orientation of at least one of the first or second areas of the unique marker (see discussion regarding claim 38-39 above). 42.39, wherein the relationship is based on misalignment between the first and second areas of the unique marker (each element in a subset can be mapped relative to the superset and host material, each element is relative to another element in terms of at least separation distance and orientation; i.e. par. 35-36, 39, 42-43, 117-120, 128-130). 43.38, wherein the integrity level is determined based on differential analysis comparison to one or more previous scans of the unique marker (par. 45-47). 44.38, wherein the integrity level is determined based on one or more thresholds (par. 44, 50, 58). 45.38, comprising: flagging the object for inspection based on the integrity level associated with the unique marker (par. 42-43, 128-130, 83, 144, 154). 46.38, comprising: outputting a location of an area of compromised integrity in the first area (Fig. 14, par. 76, 88, 91, 122: deformation of the object causes properties of elements including location to change, which can be extracted via scanning). 47.38, comprising: generating a unique code for the object based on the orientation information (par. 126-130, 171). 48.38, comprising: identifying at least one of the first or second areas of the unique marker based on the relative spatial orientations of the respective elements (par. 87) 49.38, wherein the unique marker is hidden or not visible to the naked eye (par. 32). 50.38, wherein the first area includes evidence of compromised integrity (par. 38-39, 42-43, 76, 88, 91). 51.50, wherein evidence of compromised integrity includes evidence of one or more of the following: environmental stress, removal of elements, replacement of elements, shifting of elements, destruction of elements, mechanical stress, mechanical wear, deformation, article use, or article activation (par. 76, 88, 91). 52.38, comprising: scanning the unique marker of the object at different points in a chain of custody and extracting orientation information from the unique marker at each scan; for each scan of the object at different points, performing integrity verification of the object based on the extracted orientation information for the respective scan; and determining, based on the performed integrity verification, a point in the chain of custody where tamper occurred (Fig. 14, par. 76, 85, 88, 91). 53.38, wherein the unique marker is formed on a surface of the object (Fig. 1). 54.38, wherein the unique marker is formed on a seal, sticker, film, or wrap on the object (Fig. 1). Re claims 55-61, see discussion regarding claims above. Response to Arguments Applicant’s arguments have been considered but are moot in view of new ground of rejection. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to THIEN MAI whose telephone number is (571)272-8283. The examiner can normally be reached M-F 8-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Steven Paik can be reached at 571-272-2404. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /THIEN T MAI/ Primary Examiner, Art Unit 2876
Read full office action

Prosecution Timeline

Show 1 earlier event
Sep 04, 2025
Non-Final Rejection mailed — §102, §OTHER, §Other
Nov 10, 2025
Interview Requested
Nov 17, 2025
Examiner Interview Summary
Nov 17, 2025
Applicant Interview (Telephonic)
Dec 04, 2025
Response Filed
Feb 19, 2026
Final Rejection mailed — §102, §OTHER, §Other
Apr 20, 2026
Response after Non-Final Action
Apr 30, 2026
Final Rejection mailed — §102, §OTHER, §Other (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

4-5
Expected OA Rounds
59%
Grant Probability
80%
With Interview (+20.8%)
3y 2m (~1y 8m remaining)
Median Time to Grant
High
PTA Risk
Based on 684 resolved cases by this examiner. Grant probability derived from career allowance rate.

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