Prosecution Insights
Last updated: October 02, 2026
Application No. 18/985,924

POWER ELECTRONIC SYSTEM WITH CONDUCTOR HAVING DAMPING FUNCTION

Non-Final OA §103
Filed
Dec 18, 2024
Priority
Dec 19, 2023 — provisional 63/611,814
Examiner
TRA, ANH QUAN
Art Unit
Tech Center
Assignee
Delta Electronics Inc.
OA Round
1 (Non-Final)
73%
Grant Probability
Favorable
1-2
OA Rounds
7m
Est. Remaining
78%
With Interview

Examiner Intelligence

Grants 73% — above average
73%
Career Allowance Rate
823 granted / 1129 resolved
+12.9% vs TC avg
Moderate +5% lift
Without
With
+5.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
37 currently pending
Career history
1167
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
59.1%
+19.1% vs TC avg
§102
23.9%
-16.1% vs TC avg
§112
8.3%
-31.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1129 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1, 7 and 9-13 is/are rejected under 35 U.S.C. 103 as being unpatentable over Nad et al. (US 20190229082) in view of Takeshita et al. (US 20010050182) and/or Sheffield et al. (US 8123927). As to claim 12, Nad et al. teaches a power electronic system, comprising: power components (not shown chips that are connected with the “chip to chip interconnection”, ¶0005, or not shown components that “metal trace”, ¶0004, is connected between); and a conductor (metal trace), configured to connect the power components, and comprising a damping part (roughness) on a surface of the conductor. Nad et al.’s fails to teach that the damping part has an average roughness greater than 20 μm and/or a maximum height roughness greater than 50 μm. However, Takeshita et al.’s ¶0090 teaches that the surface roughness can be set three times as great as the skin depth. Sheffield et al.’s col.3, lines 23-30, that “[t]he term high frequency generally refers to a frequency range where the amplitude of the surface roughness equals or exceeds the skin depth in the conductor… typical frequency ranges that result in significant signal deterioration due to the skin effect include frequencies from 1 Megahertz (MHz) to hundreds of Gigahertz (GHz), depending at least in part on the properties of the conductor.” Nad et al.’s ¶0005 teaches that “[a]t 1 MHz signal transfer this skin depth is typically about 66 μm”. Therefore, at 1 MHz signal transfer or high frequency, setting the average roughness to be greater than 20 μm and/or a maximum height roughness to be greater than 50 μm (three times as great as 66 mm or “equals or exceeds” 66 mm) is seen as an obvious design preference to ensure optimum performance, MPEP 2144.05. As to claim 13, Sheffield et al.’s figure 1A shows that its conductor comprises two damping parts (roughness) on two opposite surfaces (top 122A and bottom 124A) of the conductor. As to claim 1, the modified Nad et al.’s reference teaches power components (chips); and a conductor (metal trace), configured to connect the power components (further see Sheffield et al.’s figure 1A), and comprising a damping part (roughness) disposed on a surface of the conductor (further see Sheffield et al.’s figure 1A), wherein the damping part is at least partially formed with a damping material having different resistances at different frequencies (Takeshita et al.’s ¶0090), and a relative permeability of the damping material is greater than 1 at a frequency higher than 1 MHz (Sheffield et al.’s col. 3, lines 45-50 teaches that “[t]he circuit trace 112A may include any of a variety of circuit trace materials used in circuit devices, including, for example, wrought foils, electroplated foils or deposited conductive material and may include any of a variety of conductive substances, such as copper, aluminum, gold, nickel, silver and the like.” selecting the material for the conductor/trace such that its relative permeability to be greater than 1 at frequency higher than 1HMz is seen as an obvious design preference to ensure optimum performance), wherein the damping part forms first and second paths for first and second power currents flowing between the power components respectively, the first power current is at a frequency higher than 1 MHz, the second power current is at a frequency lower than 1 MHz, and a resistance of the first path is higher than a resistance of the second path. As to claim 7, the modified Nad et al.’s reference teaches that the conductor comprises two said damping parts on two opposite surfaces of the conductor (see the rejection of claim 13). As to claim 9, Takeshita et al.’s figure 1 shows that its conductor comprises a plurality of body parts (3, 5 6) and insulation layer (2) arranged between the body parts. It would have been obvious to arrange Nad et al.’s conductor as claimed for the purpose of saving space. As to claim 10, selecting the materials for the damping part is seen as an obvious design preference to ensure optimum performance, see Sheffield et al.’s col. 3, lines 45-50. As to claim 11, the modified Nad et al.’s reference teaches that the conductor is configured as a trace of a printed circuit board, a terminal pin of a device package, or a trace, a clip or a lead frame terminal of a power module package. Allowable Subject Matter Claims 2-6 and 8 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ANH-QUAN TRA whose telephone number is (571)272-1755. The examiner can normally be reached Mon-Fri from 8:00 A.M.-5:00 P.M. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Andrea Lindgren Baltzell can be reached at 571-272-5918. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /QUAN TRA/ Primary Examiner Art Unit 2843
Read full office action

Prosecution Timeline

Dec 18, 2024
Application Filed
Sep 24, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
73%
Grant Probability
78%
With Interview (+5.3%)
2y 4m (~7m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1129 resolved cases by this examiner. Grant probability derived from career allowance rate.

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