Prosecution Insights
Last updated: July 17, 2026
Application No. 19/034,738

Method and system for correcting cone beam scan CT for intensity drop-off

Non-Final OA §102§Other
Filed
Jan 23, 2025
Priority
Feb 09, 2024 — provisional 63/551,730
Examiner
SONG, HOON K
Art Unit
Tech Center
Assignee
Carl Zeiss X-Ray Microscopy Inc.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
1315 granted / 1527 resolved
+26.1% vs TC avg
Moderate +8% lift
Without
With
+8.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
26 currently pending
Career history
1552
Total Applications
across all art units

Statute-Specific Performance

§101
1.2%
-38.8% vs TC avg
§103
61.8%
+21.8% vs TC avg
§102
12.4%
-27.6% vs TC avg
§112
5.3%
-34.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1527 resolved cases

Office Action

§102 §Other
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-14 is/are rejected under 35 U.S.C. 102a1 as being anticipated by Chen et al. (“Compensating the intensity fall-off effect in cone-beam tomography by an empirical weighted formula”, applied optics, society of America, Washington, DC, US, vol. 47, no 32, 10 November 2008, pages 6033-6039, XP001519511, ISSN: 0003-6935, DOI: 10.1364/AO.47.006033). Regarding claim 1, Chen teaches a method for cone beam CT intensity correction, comprising: determining an intensity compensation for a selected scanning configuration by forward projecting using the selected scanning configuration (section 2.B Longitudinal Fall-Off effect in Cone-beam tomography and figure 2); performing a reconstruction of forward projected data and using reconstructed data to generate the intensity compensation (section 2.B Longitudinal Fall-Off effect in Cone-beam tomography and figure 2); and applying the intensity compensation to a reconstructed volume of interest to produce an intensity compensated volume (section 2. C volume reconstruction by weighted backproejction, see PCT written opinion). Regarding claim 2, Chen teaches the selected scanning configuration is a circular or other suitable scanning configuration (circle and line, ellipse, sine wave, double circle, etc.) (section 1, intoruction). Regarding claim 3, Chen teaches the forward projection has the same dimensions and voxel size as the reconstructed volume of interest (implicit). Regarding claim 4, Chen teaches the forward projection is performed of a volume that is instantiated with each voxel being filled with a constant (figure 2). Regarding claim 5, Chen teaches a voxel-by-voxel intensity compensation is generated by inverting the reconstructed forward projected data (section 2.C. column reconstruction by weighted backprojection). Regarding claim 6, Chen teaches the reconstructed volume of interest and the reconstruction of forward projected data are performed using FDK (section 2.C. column reconstruction by weighted backprojection). Regarding claim 7, Chen teaches a computer software product for cone beam CT intensity correction implementing the method of claim 1 (section 2.C. column reconstruction by weighted backprojection). Regarding claim 8, Chen teaches a computer software product of claim 7, stored in a non-transitory storage medium such as an electronic or magnetic storage medium (implicit). Regarding claim 9, Chen teaches an x-ray tomography system, comprising: an x-ray system including an x-ray source system for generating an x-ray beam and a detector system for detecting the x-ray beam after transmission through a sample to generate projection data; and a computer system for determining an intensity compensation for a selected scanning configuration by forward projecting using the selected scanning configuration, performing a reconstruction of forward projected data and using reconstructed data to generate the intensity compensation, and applying the intensity compensation to a reconstructed volume of interest to produce an intensity compensated volume. Regarding claim 10, Chen teaches the selected scanning configuration is a circular or other suitable scanning configuration (circle and line, ellipse, sine wave, double circle, etc.) (section 1, intoruction). Regarding claim 11, Chen teaches the forward projection has the same dimensions and voxel size as the reconstructed volume of interest (implicit). Regarding claim 12, Chen teaches the forward projection is performed of a volume that is instantiated with each voxel being filled with a constant (figure 2). Regarding claim 13, Chen teaches a voxel-by-voxel intensity compensation is generated by the computer system by inverting the reconstructed forward projected data (section 2.C. column reconstruction by weighted backprojection). Regarding claim 14, Chen teaches the reconstructed volume of interest and the reconstruction of forward projected data are performed using FDK (section 2.C. column reconstruction by weighted backprojection). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to HOON K SONG whose telephone number is (571)272-2494. The examiner can normally be reached M to Th 10am to 7pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, David Makiya can be reached at 571-272-2273. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HOON K SONG/Primary Examiner, Art Unit 2884
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Prosecution Timeline

Jan 23, 2025
Application Filed
Jun 17, 2026
Non-Final Rejection mailed — §102, §Other (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
94%
With Interview (+8.4%)
2y 4m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1527 resolved cases by this examiner. Grant probability derived from career allowance rate.

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