CTNF 19/038,854 CTNF 79985 Notice of Pre-AIA or AIA Status 07-03-aia AIA 15-10-aia The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA. Claim Rejections - 35 USC § 102 07-07-aia AIA 07-07 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – 07-08-aia AIA (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. 07-15 AIA Claim (s) 1, 2, 6, 9, 13 and 15-18 are rejected under 35 U.S.C. 102( a)(1 ) as being anticipated by Ishii et al. (US PGPUB 20200045258) . [Claim 1] A photoelectric conversion device comprising a plurality of pixels (Paragraph 33, Similarly, each pixel block in which 4×4 light-receiving pixels 304 , namely 16 light-receiving pixels 304 in total are arranged is referred to as an open pixel block 303 ), and a correction unit (digital signal processing circuit 208) configured to correct, in accordance with correction data, a black level of pixel signals output from the plurality of pixels (Paragraph 67, or example, pixel signals of the OB pixel blocks 301 are read out earlier by a period of time for reading out one pixel. The digital signal processing circuit 208 then clamps mainly dark current components using the pixel signals of the OB pixel blocks that have been read out earlier. Hereinafter, the clamp processing is referred to as “dark current correction”. More specifically, an OB pixel 302 is read out from each of the plurality of OB pixel blocks 301 , and calculation is performed on a plurality of acquired pixel signals, and the resulting value is used as a correction value of dark current correction), wherein the correction unit is configured to change a level of a selection signal from a first level to a second level if a state of a photoelectric conversion system where the photoelectric conversion device is arranged changes in one frame period during which signals for generating one image are obtained (Paragraph 67, pixel signals of the OB pixel blocks 301 are read out earlier by a period of time for reading out one pixel. The digital signal processing circuit 208 then clamps mainly dark current components using the pixel signals of the OB pixel blocks that have been read out earlier. Hereinafter, the clamp processing is referred to as “dark current correction”. More specifically, an OB pixel 302 is read out from each of the plurality of OB pixel blocks 301 , and calculation is performed on a plurality of acquired pixel signals, and the resulting value is used as a correction value of dark current correction (This is a first level). Paragraph 70, A clamp value used for the correction of change-in-level during readout is calculated based on the result of calculating an average value of pixel signals of the plurality of OB pixel blocks 301 read out at the same timing, and pixel signals of the open area are corrected. Note that, at this time, it is favorable that the OB area is set large, but the area of the image sensor 103 would increase as a result, and thus the OB area cannot be very large, and it is usually difficult to set the number of OB pixels 302 for obtaining pixel signals for the correction of change-in-level during readout to be very large. In that case, there is a possibility that, if noise during readout is large, an error of a correction value is large. In view of this, for example, a configuration may also be adopted in which a change level is calculated based on the difference from the black level used for dark current correction, and, furthermore, the change level is multiplied by a correction coefficient and used for clamping in order to prevent erroneous correction ( This is a change from level 1 to level 2). ; and select a setting for generating the correction data from a plurality of settings in accordance with the level (Paragraphs 67 and 70, correction or clamping data is changed according to change in level during readout from a first to a second level). [Claim 2] The device according to claim 1, wherein the correction unit generates, using the setting according to the level, the correction data from a signal value based on a light shielded signal output from a pixel arranged in a light shielded region among the plurality of pixels (Paragraph 67, In this second embodiment, as shown in FIG. 10, for example, pixel signals of the OB pixel blocks 301 are read out earlier by a period of time for reading out one pixel. The digital signal processing circuit 208 then clamps mainly dark current components using the pixel signals of the OB pixel blocks that have been read out earlier. Hereinafter, the clamp processing is referred to as “dark current correction”. More specifically, an OB pixel 302 is read out from each of the plurality of OB pixel blocks 301 , and calculation is performed on a plurality of acquired pixel signals, and the resulting value is used as a correction value of dark current correction). [Claim 6] The device according to claim 1, wherein the correction unit includes a detector configured to detect a change of the state and generate the selection signal, and the detector sets the level to the second level over a detection period during which a change of the state is detected (Paragraph 68, On the other hand, pixel signals of the OB pixel blocks 301 read out at the same timing as pixel signals of the open pixel blocks 303 are used for clamping these pixel signals of the open pixel blocks 303 . This processing is for correcting a change in the power supply and GND during a readout operation of pixel signals, and is hereinafter referred to as “correction of change-in-level during readout”. Note that, when the pixel signals read out at the same timing are transmitted to the digital signal processing circuit 208 , the pixel signals of the OB pixel blocks 301 are prioritized. Also, similarly to dark current correction, based on the pixel signals of the plurality of OB pixels 302 that have been respectively read out from the plurality of OB pixel blocks 301 , a correction value for the correction of change-in-level during readout is calculated and used). [Claim 9] The device according to claim 6, wherein a signal indicating a change of the state is supplied from a control circuit of the photoelectric conversion system to the detector (Paragraph 29, Note that some signal processing functions such as reference level adjustment may be provided in the image sensor 103 . A timing generation circuit 105 outputs a driving timing signal to the image sensor 103 and the signal processing circuit 104 ). [Claim 13] The device according to claim 1, wherein if a power supply voltage of the device fluctuates, the correction unit changes the level from the first level to the second level (Paragraphs 65-70). [Claim 15] The device according to claim 1, further comprising a driving circuit configured to drive the plurality of pixels, wherein if the number of pixels driven by the driving circuit among the plurality of pixels changes, the correction unit changes the level from the first level to the second level (Paragraph 69, Note that the number of pixels of the OB pixel blocks 301 that are read out for dark current correction before scanning the open area 402 does not need to be limited to one pixel per pixel block, and may be larger. The larger the number of pixels that are used for clamp value calculation of dark current correction is, more accurately a correction value can be calculated. In this case, the number of pixels that make up an OB pixel block 301 is favorably increased by the number of pixels that are used for calculation of a correction value for dark current correction). [Claim 16] The device according to claim 1, wherein if a smear occurs, the correction unit changes the level from the first level to the second level (Paragraph 68, On the other hand, pixel signals of the OB pixel blocks 301 read out at the same timing as pixel signals of the open pixel blocks 303 are used for clamping these pixel signals of the open pixel blocks 303 . This processing is for correcting a change in the power supply and GND during a readout operation of pixel signals, and is hereinafter referred to as “correction of change-in-level during readout”). [Claim 17] A photoelectric conversion device comprising a plurality of pixels (Paragraph 33, Similarly, each pixel block in which 4×4 light-receiving pixels 304 , namely 16 light-receiving pixels 304 in total are arranged is referred to as an open pixel block 303 ), and a signal processor unit (digital signal processing circuit 208) configured to correct a black level of pixel signals output from the plurality of pixels in accordance with correction data (Paragraph 67, or example, pixel signals of the OB pixel blocks 301 are read out earlier by a period of time for reading out one pixel. The digital signal processing circuit 208 then clamps mainly dark current components using the pixel signals of the OB pixel blocks that have been read out earlier. Hereinafter, the clamp processing is referred to as “dark current correction”. More specifically, an OB pixel 302 is read out from each of the plurality of OB pixel blocks 301 , and calculation is performed on a plurality of acquired pixel signals, and the resulting value is used as a correction value of dark current correction), further comprising a detector configured to detect a fluctuation of a power supply voltage of the device and generate a selection signal, wherein if a fluctuation of the power supply voltage is detected (Paragraph 68, On the other hand, pixel signals of the OB pixel blocks 301 read out at the same timing as pixel signals of the open pixel blocks 303 are used for clamping these pixel signals of the open pixel blocks 303 . This processing is for correcting a change in the power supply and GND during a readout operation of pixel signals, and is hereinafter referred to as “correction of change-in-level during readout”. Note that, when the pixel signals read out at the same timing are transmitted to the digital signal processing circuit 208 , the pixel signals of the OB pixel blocks 301 are prioritized. Also, similarly to dark current correction, based on the pixel signals of the plurality of OB pixels 302 that have been respectively read out from the plurality of OB pixel blocks 301 , a correction value for the correction of change-in-level during readout is calculated and used), the detector changes a level of the selection signal from a first level to a second level (Paragraph 67), and the signal processor is configured to select a setting for generating the correction data from a plurality of settings in accordance with the level (Paragraphs 67 and 70, correction or clamping data is changed according to change in level during readout from a first to a second level). [Claim 18] An apparatus comprising: the photoelectric conversion device according to claim 1 (see claim 1); and a processing device configured to process a signal output from the photoelectric conversion device (Paragraph 29, A signal processing circuit 104 performs signal amplification, various types of correction such as reference level adjustment, rearrangement of data, and the like, on image signals output from the image sensor 103 ). Allowable Subject Matter Claims 3-5, 7, 8, 10-12 and 14 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The prior art fails to teach or suggest as recited in claim 3, “the correction unit includes a generation circuit configured to generate the correction data, and a correction circuit configured to correct the pixel signal in accordance with the correction data, the generation circuit includes a low-pass filter connected to an input node of the signal value, and the setting is a setting of an amount of attenuation of the low-pass filter”. Claims 4 and 5 are dependent from claim 3. Claim 7, “the correction unit includes a memory configured to store signals output from the plurality of pixels, and generates the correction data by using a setting according to the second level with respect to signals output from the plurality of pixels in a detection period during which the detector detects a change of the state and in at least one of a predetermined period before the detection period and a predetermined period after the detection period”, and claim 8, “wherein in at least one of a case where communication is being performed between the photoelectric conversion device and a device in the photoelectric conversion system other than the photoelectric conversion device and a case where a motor of a device in the photoelectric conversion system other than the photoelectric conversion device is being driven, the detector changes the level to the second level”. Claim 10, “wherein a signal at the second level includes signals at a plurality of levels in accordance with a change of the state” and claim 11, “wherein if the state is a predetermined state, the correction unit keeps the level to the first level regardless of a change of the state”. Claim 12 is dependent from claim 11. Claim 14, “wherein if a cyclic change of a value obtained by analog-digital conversion of the power supply voltage at a predetermined cycle exceeds a threshold, the correction unit changes the level to the second level”. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to YOGESH K AGGARWAL whose telephone number is (571)272-7360. The examiner can normally be reached Monday - Friday 9:30-6. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Sinh Tran can be reached at 5712727564. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /YOGESH K AGGARWAL/Primary Examiner, Art Unit 2637 Application/Control Number: 19/038,854 Page 2 Art Unit: 2637 Application/Control Number: 19/038,854 Page 3 Art Unit: 2637 Application/Control Number: 19/038,854 Page 4 Art Unit: 2637 Application/Control Number: 19/038,854 Page 5 Art Unit: 2637 Application/Control Number: 19/038,854 Page 6 Art Unit: 2637 Application/Control Number: 19/038,854 Page 7 Art Unit: 2637 Application/Control Number: 19/038,854 Page 8 Art Unit: 2637 Application/Control Number: 19/038,854 Page 9 Art Unit: 2637
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