Prosecution Insights
Last updated: October 02, 2026
Application No. 19/039,045

INFORMATION PROCESSING APPARATUS, METHOD OF CONTROLLING INFORMATION PROCESSING APPARATUS, AND INSPECTION SYSTEM

Non-Final OA §102
Filed
Jan 28, 2025
Priority
Jan 30, 2024 — JP 2024-011552
Examiner
CRUZ, IRIANA
Art Unit
Tech Center
Assignee
Canon Inc.
OA Round
1 (Non-Final)
82%
Grant Probability
Favorable
1-2
OA Rounds
1y 1m
Est. Remaining
91%
With Interview

Examiner Intelligence

Grants 82% — above average
82%
Career Allowance Rate
628 granted / 768 resolved
+21.8% vs TC avg
Moderate +10% lift
Without
With
+9.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
26 currently pending
Career history
783
Total Applications
across all art units

Statute-Specific Performance

§101
10.0%
-30.0% vs TC avg
§103
55.7%
+15.7% vs TC avg
§102
22.9%
-17.1% vs TC avg
§112
9.3%
-30.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 768 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-17 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Nakada (US 2021/0304385 A1). With respect to Claim 1, Nakada’385 shows an information processing apparatus (figure 1 printing system including an image processing apparatus) configured to perform setting to inspect a printed sheet (paragraph [0032] setting unit with region setting unit 202 sets inspection regions and detection sensitivity setting unit 203 sets detection sensitivities for defects in each of the inspection regions), comprising: at least one memory that stores instructions (figure 1 storage device 104); and at least one processor (figure 1 CPU 101) that executes the instructions to: set an inspection region for each inspection level indicating accuracy of the inspection based on a first user instruction for a reference image, which is a reference for the inspection (Figure 3: set reference image S301, set inspection regions S302, set detection sensitivities S303); and extract an object existing in the reference image (figure 3 extract local pattern region S304, local pattern/object), wherein in a case where a plurality of inspection regions which have the different inspection levels are set for the extracted object based on the first user instruction (paragraph [0035] sets detection sensitivities for defects in each of the inspection regions based on an instruction from the user acquired via the UI, sets detection sensitivities for a point-like defect and a line-like defect in each of the inspection regions at three levels, namely high, medium, and low see figures 5-6), one inspection region is determined from the plurality of the inspection regions based on a proportion of each of the plurality of the inspection regions included in the object (paragraph [0037] in figure 9 S901 (included in s305) object pattern edge regions utilized for dividing/determining inspection region, paragraph [0036] an edge region is extracted as the region corresponding to the line-like pattern (object)), and the inspection level corresponding to the determined one inspection region is set as the inspection level for the object (paragraph [0037] setting sensitivity S902). With respect to Claim 2, Nakada’385 shows the information processing apparatus according to claim 1, wherein the at least one processor executes the instructions further to: determine the inspection level designated for an inspection region having the largest proportion included in the object as the inspection level corresponding to the one inspection region (Figure 11 S1105 inspection processing unit 207 detects, among pixels in the defect-enhanced image, a pixel having a pixel value greater than or equal to the threshold Th.sub.1, as a defect pixel by the threshold process. In step S1105, the inspection processing unit 207 performs a threshold process on the areas of defect regions in the defect-enhanced image using the threshold Th.sub.2). With respect to Claim 3, Nakada’385 shows the information processing apparatus according to claim 1, wherein the at least one processor executes the instructions further to: make an inquiry to a user is made after the inspection level corresponding to the one inspection region is set as the inspection level for the object; and set the inspection level for the object again based on a second user instruction in response to the inquiry to the user (paragraph [0035] shows inspection instruction from the user acquired via the UI panel 108, paragraph [0038] determines whether the processing is to be ended based on an instruction from the user acquired through the UI panel 108). With respect to Claim 4, Nakada’385 shows the information processing apparatus according to claim 1, wherein the at least one processor executes the instructions further to: make an inquiry to a user after the inspection level corresponding to the one inspection region is set as the inspection level for the object in a case where a predetermined condition is satisfied; and set the inspection level for the object again based on a second user instruction in response to the inquiry to the user (paragraph [0035] shows inspection instruction from the user acquired via the UI panel 108, paragraph [0038] determines whether the processing is to be ended based on an instruction from the user acquired through the UI panel 108). With respect to Claim 5, Nakada’385 shows the information processing apparatus according to claim 4, wherein the at least one processor executes the instructions further to: determine the inspection level designated for an inspection region having the largest proportion included in the object as the inspection level corresponding to the one inspection region in a case where the predetermined condition is not satisfied (Figure 11 S1105 inspection processing unit 207 detects, among pixels in the defect-enhanced image, a pixel having a pixel value greater than or equal to the threshold Th.sub.1, as a defect pixel by the threshold process. In step S1105, the inspection processing unit 207 performs a threshold process on the areas of defect regions in the defect-enhanced image using the threshold Th.sub.2). With respect to Claim 6, Nakada’385 shows the information processing apparatus according to claim 4, wherein the predetermined condition is that there are a plurality of the inspection regions having the proportions included in the object, which are equal to or larger than a first threshold (paragraph [0036] local pattern extraction unit 204 performs a threshold process on pixels in the line-enhanced image and extracts a pixel having a pixel value greater than a threshold, as an edge pixel included in the edge region. A known morphological process may be applied to the extracted edge region, thereby correcting the edge region). With respect to Claim 7, Nakada’385 shows the information processing apparatus according to claim 6, wherein the first threshold is 50% (figure 10A for region Be detection sensitivity of medium/50%). With respect to Claim 8, Nakada’385 shows the information processing apparatus according to claim 4, wherein the predetermined condition is that there is the inspection region having the proportion included in the object in which a difference from the largest proportion included in the object is equal to or smaller than a second threshold (Figure 11 S1105 inspection processing unit 207 detects, among pixels in the defect-enhanced image, a pixel having a pixel value greater than or equal to the threshold Th.sub.1, as a defect pixel by the threshold process. In step S1105, the inspection processing unit 207 performs a threshold process on the areas of defect regions in the defect-enhanced image using the threshold Th.sub.2). With respect to Claim 9, Nakada’385 shows the information processing apparatus according to claim 8, wherein the second threshold is 25% (figure 10A for region Be detection sensitivity of low/25%). With respect to Claim 10, Nakada’385 shows the information processing apparatus according to claim 1, wherein the at least one processor executes the instructions further to: control a display unit; and display the proportion of each of the plurality of the inspection regions included in the object on the display unit (paragraph [0030] UI panel 108 is a display device such as a liquid crystal display and functions as a user interface for notifying the user of the current state and settings of the image processing apparatus 100). With respect to Claim 11, Nakada’385 shows a method of controlling an information processing apparatus (figure 1 printing system including an image processing apparatus) configured to perform setting to inspect a printed sheet (paragraph [0032] setting unit with region setting unit 202 sets inspection regions and detection sensitivity setting unit 203 sets detection sensitivities for defects in each of the inspection regions); comprising: setting an inspection region for each inspection level indicating accuracy of the inspection based on a first user instruction for a reference image, which is a reference for the inspection (Figure 3: set reference image S301, set inspection regions S302, set detection sensitivities S303); and extracting an object existing in the reference image (figure 3 extract local pattern region S304, local pattern/object); and in a case where a plurality of inspection regions having the different inspection levels are set for the extracted object in the extracting step (paragraph [0035] sets detection sensitivities for defects in each of the inspection regions based on an instruction from the user acquired via the UI, sets detection sensitivities for a point-like defect and a line-like defect in each of the inspection regions at three levels, namely high, medium, and low see figures 5-6), determining one inspection region from the plurality of the inspection regions based on a proportion of each of the plurality of the inspection regions included in the object (paragraph [0037] in figure 9 S901 (included in s305) object pattern edge regions utilized for dividing/determining inspection region, paragraph [0036] an edge region is extracted as the region corresponding to the line-like pattern (object)), and setting the inspection level corresponding to the determined one inspection region as the inspection level for the object (paragraph [0037] setting sensitivity S902). With respect to Claim 12, Nakada’385 shows an inspection system (figure 1 printing system), comprising: a printing apparatus configured to perform printing on a sheet based on image data designated by a printing job (figure 1 printing apparatus 190); an information processing apparatus configured to perform setting to inspect a printed sheet (figure 1 image processing apparatus 100); and an inspection apparatus configured to perform the inspection on the printed sheet based on the setting set by the information processing apparatus (paragraph [0032] setting unit with region setting unit 202 sets inspection regions and detection sensitivity setting unit 203 sets detection sensitivities for defects in each of the inspection regions), wherein the information processing apparatus comprises: at least one memory that stores instructions (figure 1 storage device 104); and at least one processor that executes the instructions to (figure 1 CPU 101): set an inspection region for each inspection level indicating accuracy of the inspection based on a first user instruction for a reference image, which is a reference for the inspection (Figure 3: set reference image S301, set inspection regions S302, set detection sensitivities S303); and extract an object existing in the reference image (figure 3 extract local pattern region S304, local pattern/object), wherein in a case where a plurality of inspection regions which have the different inspection levels are set for the extracted object based on the first user instruction (paragraph [0035] sets detection sensitivities for defects in each of the inspection regions based on an instruction from the user acquired via the UI, sets detection sensitivities for a point-like defect and a line-like defect in each of the inspection regions at three levels, namely high, medium, and low see figures 5-6), one inspection region is determined from the plurality of the inspection regions based on a proportion of each of the plurality of the inspection regions included in the object (paragraph [0037] in figure 9 S901 (included in s305) object pattern edge regions utilized for dividing/determining inspection region, paragraph [0036] an edge region is extracted as the region corresponding to the line-like pattern (object)), and the inspection level corresponding to the determined one inspection region is set as the inspection level for the object (paragraph [0037] setting sensitivity S902). With respect to Claim 13, rejection analogous to those presented for claim 2, are applicable. With respect to Claim 14, rejection analogous to those presented for claim 3, are applicable. With respect to Claim 15, rejection analogous to those presented for claim 4, are applicable. With respect to Claim 16, rejection analogous to those presented for claim 5, are applicable. With respect to Claim 17, rejection analogous to those presented for claim 10, are applicable. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Kawabe et al. (US 2024/0319931 A1): shows in paragraph [0059] instead of setting the inspection level for the entire pressure-bonded surface specified in S106 to be high, the information processing system 30 may set the level only for the region in which there is an image to be printed in the pressure-bonded surface, or the level only for a region obtained by expanding the above region by a predetermined ratio, to be high Any inquiry concerning this communication or earlier communications from the examiner should be directed to IRIANA CRUZ whose telephone number is (571)270-3246. The examiner can normally be reached 10-6. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Akwasi M. Sarpong can be reached at (571) 270-3438. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /IRIANA CRUZ/Primary Examiner, Art Unit 2681
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Prosecution Timeline

Jan 28, 2025
Application Filed
Aug 28, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
82%
Grant Probability
91%
With Interview (+9.5%)
2y 9m (~1y 1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 768 resolved cases by this examiner. Grant probability derived from career allowance rate.

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