Prosecution Insights
Last updated: October 01, 2026
Application No. 19/042,173

MAGNETIC FIELD MEASUREMENT DEVICE

Non-Final OA §103
Filed
Jan 31, 2025
Priority
Mar 05, 2024 — JP 2024-032925
Examiner
RODAK, LEE E
Art Unit
Tech Center
Assignee
TDK Corporation
OA Round
1 (Non-Final)
72%
Grant Probability
Favorable
1-2
OA Rounds
1y 0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 72% — above average
72%
Career Allowance Rate
270 granted / 374 resolved
+12.2% vs TC avg
Strong +34% interview lift
Without
With
+34.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
36 currently pending
Career history
407
Total Applications
across all art units

Statute-Specific Performance

§101
2.5%
-37.5% vs TC avg
§103
52.9%
+12.9% vs TC avg
§102
21.6%
-18.4% vs TC avg
§112
19.5%
-20.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 374 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-5 are rejected under 35 U.S.C. 103 as being unpatentable over Kawabata et al. (Pub NO. US 2020/0237243 A1; hereinafter Kawabata) in view of Aoki et al. (Pub NO. US 2005/0216231 A1; hereinafter Aoki). Regarding Claim 1, Kawabata teaches a magnetic field measurement device (measurement device in Fig. 4 and Fig. below; See [0062]-[0070]) comprising: a first sensor unit (first sensor unit 11 in Fig. 4 and Fig. below; See [0066]) having one or more magnetic sensors (11 having plurality of magnetic sensors 1 in Fig. 4 and Fig. below; See [0065]); a second sensor unit (second sensor unit 14 and S in Fig. 4 and Fig. below; See [0066]) having one or more magnetic sensors (14 having plurality of magnetic sensors 1 in Fig. 4 and Fig. below; See [0065]); and a moving mechanism configured to change a relative positional relationship between the first and second sensor units (14 has moving mechanism to move towards 11 in Fig. 4 and Fig. below; See [0067]). PNG media_image1.png 750 882 media_image1.png Greyscale Kawabata teaches second sensor unit (4 in Fig. 4; See [0065]), However Kawabata is silent about second sensor unit having one or more magnetic field generating coils. Aoki teaches second sensor unit having one or more magnetic field generating coils (second sensor unit 4 having plurality of magnetic field generating coils 51 in Fig. 7; See [0125]). Therefore it would have been obvious to one of ordinary skill in the art before the effective filling date of the claimed invention was made to the second sensor unit of Kawabata by using second sensor unit having one or more magnetic field generating coils, as taught by Aoki in order to detect position and posture of device (Aoki; [0003]). Regarding Claim 2, Kawabata in view of Aoki teaches the magnetic field measurement device as claimed in claim 1. Kawabata further teaches wherein the first sensor unit includes a plurality of the magnetic sensors with fixed relative positional relationship (11 has plurality of fixed sensors 1 in Fig. 4), and wherein the second sensor unit includes a plurality of the magnetic sensors with fixed relative positional relationship (14 has plurality of fixed sensors 1 in Fig. 4). Regarding Claim 3, Kawabata in view of Aoki teaches the magnetic field measurement device as claimed in claim 2. Aoki further teaches wherein the second sensor unit includes a plurality of the magnetic field generating coils with fixed relative positional relationship (second sensor unit 4 includes plurality of magnetic field generating coils 51 with fixed relationship in Fig. 7; See [0125]), and wherein the plurality of magnetic sensors included in the second sensor unit (plurality of magnetic sensors 52 included in the second sensor unit 4 in Fig. 7; See [0125]) and the plurality of magnetic field generating coils included in the second sensor unit have fixed relative positional relationship (all 51’s and 52’s are n fixed positional relationship in Fig. 7; See [0125]). Regarding Claim 4, Kawabata in view of Aoki teaches the magnetic field measurement device as claimed in claim 3. Kawabata further teaches wherein the moving mechanism is configured to change a distance and an angle between the first and second sensor units (14 has moving mechanism to change direction and angle between 14 and 11 in Fig. 4; See [0067]). Regarding Claim 5, Kawabata teaches the magnetic field measurement device as claimed in claim 1. Kawabata further teaches wherein the magnetic field generating coil is disposed at a position not protruding from a sensor head included in the second sensor unit in a direction toward the first sensor unit (See the position of S relative to 11 and 14 in Fig. 4). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. OKATAKE et al. (Pub NO. US 2021/0345898 A1) discloses Magnetic Field Measurement device with sensor array with respect to one or more position. Alford et al. (Pub NO. US 2020/0241094 A1) discloses Magnetic Field Measurement of weak signal. Martinez et al. (Pub NO. US 2020/0057115 A1) discloses Magnetic Field Shaping component. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ZANNATUL FERDOUS whose telephone number is (571)270-0399. The examiner can normally be reached Monday through Friday 8am to 5pm (PST). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Rodak Lee can be reached at 5471-270-5628. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ZANNATUL FERDOUS/Examiner, Art Unit 2858 /JERMELE M HOLLINGTON/Primary Examiner, Art Unit 2858
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Prosecution Timeline

Jan 31, 2025
Application Filed
Aug 10, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
72%
Grant Probability
99%
With Interview (+34.1%)
2y 8m (~1y 0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 374 resolved cases by this examiner. Grant probability derived from career allowance rate.

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