Prosecution Insights
Last updated: October 01, 2026
Application No. 19/048,995

ELECTRONIC DEVICE

Non-Final OA §DP
Filed
Feb 10, 2025
Priority
Dec 06, 2019 — provisional 62/944,375 +3 more
Examiner
NGUYEN, VINH P
Art Unit
Tech Center
Assignee
Innolux Corporation
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
7m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
1193 granted / 1380 resolved
+26.4% vs TC avg
Strong +16% interview lift
Without
With
+16.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
19 currently pending
Career history
1395
Total Applications
across all art units

Statute-Specific Performance

§101
3.3%
-36.7% vs TC avg
§103
32.5%
-7.5% vs TC avg
§102
11.8%
-28.2% vs TC avg
§112
43.1%
+3.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1380 resolved cases

Office Action

§DP
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Specification The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed. Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The filing of a terminal disclaimer by itself is not a complete reply to a nonstatutory double patenting (NSDP) rejection. A complete reply requires that the terminal disclaimer be accompanied by a reply requesting reconsideration of the prior Office action. Even where the NSDP rejection is provisional the reply must be complete. See MPEP § 804, subsection I.B.1. For a reply to a non-final Office action, see 37 CFR 1.111(a). For a reply to final Office action, see 37 CFR 1.113(c). A request for reconsideration while not provided for in 37 CFR 1.113(c) may be filed after final for consideration. See MPEP §§ 706.07(e) and 714.13. The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The actual filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/apply/applying-online/eterminal-disclaimer. Claims 1-8 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-8 of U.S. Patent No. 12,253,557 in view of Kawaura (Pat# 7,821,285). Pending application SN# 19/048,995 U.S. Pat # 12,253,557 1. An electronic device, comprising: a pixel array; a plurality of signal lines, electrically connected to the pixel array; and a testing circuit, comprising a plurality of output channels electrically connected to some of the plurality of signal lines and a plurality of switches, wherein the plurality of switches are connected to the plurality of signal lines via the plurality of output channels, wherein the plurality of output channels of the testing circuit are less than the plurality of signal lines in quantity, and there are at least two via holes overlapping one of the plurality of output channels. 2. The electronic device of claim 1, wherein one of the at least two via holes is electrically connected to a first metal layer, and another one of the at least two via holes is electrically connected to a second metal layer, wherein the first metal layer and the second metal layer are not directly electrically connected. 3. The electronic device of claim 1, wherein the plurality of switches are controlled according to a plurality of control signals. 4. The electronic device of claim 1, further comprising: an isolation circuit, located between the testing circuit and the plurality of signal lines. 5. The electronic device of claim 4, wherein the isolation circuit comprises: a plurality of other switches, wherein one of the plurality of other switches is electrically connected between one of the plurality of output channels and one of the plurality of signal lines. 6. The electronic device of claim 5, wherein adjacent two of the plurality of other switches are electrically connected to the same one of the plurality of output channels, and are respectively electrically connected to adjacent two of the plurality of signal lines. 7. The electronic device of claim 5, wherein adjacent two of the plurality of other switches are respectively electrically connected to adjacent two of the plurality of output channels. 8. The electronic device of claim 5, wherein the isolation circuit comprises: a control signal input terminal, electrically connected to a control terminal of at least one of the plurality of other switches. 1. An electronic device, comprising: a plurality of signal lines; and a testing circuit, comprising a plurality of output channels electrically connected to some of the plurality of signal lines and a plurality of switches, wherein the plurality of switches are connected to the plurality of signal lines via the plurality of output channels, wherein the plurality of output channels of the testing circuit are less than the plurality of signal lines in quantity, and there are at least two via holes overlapping one of the plurality of output channels. 2. The electronic device of claim 1, wherein one of the at least two via holes is electrically connected to a first metal layer, and another one of the at least two via holes is electrically connected to a second metal layer, wherein the first metal layer and the second metal layer are not directly electrically connected. 3. The electronic device of claim 1, wherein the plurality of switches are controlled according to a plurality of control signals. 4. The electronic device of claim 1, further comprising: an isolation circuit, located between the testing circuit and the plurality of signal lines. 5. The electronic device of claim 4, wherein the isolation circuit comprises: a plurality of other switches, wherein one of the plurality of other switches is electrically connected between one of the plurality of output channels and one of the plurality of signal lines. 6. The electronic device of claim 5, wherein adjacent two of the plurality of other switches are electrically connected to the same one of the plurality of output channels, and are respectively electrically connected to adjacent two of the plurality of signal lines. 7. The electronic device of claim 5, wherein adjacent two of the plurality of other switches are respectively electrically connected to adjacent two of the plurality of output channels. 8. The electronic device of claim 5, wherein the isolation circuit comprises: a control signal input terminal, electrically connected to a control terminal of at least one of the plurality of other switches. As to claim 1, claim 1 of U.S. Patent No. 12,253,557 disclose an electronic including the limitation of the instant claim 1withouut a pixel array. Kawaura et al disclose a test apparatus having a testing circuit (40) with signal lines connected to a pixel array (10) as shown in figure 1. It would have been well known for one of ordinary skill in the art to have the electronic circuit of U.S. Patent No. 12,253,557 connected to a pixel array as taught by Kawaura et al for the purpose of testing pixels within the pixel array. As to claims 2-8, claims 2-8 of U.S. Patent No. 12,253,557 disclose the limitations of the instant claims 2-8. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Lee et al (Pat# 11,455,924) disclose System And Method For LCD Display Panel Failure Diagnostics. Kim et a l (Pat# 9,925,585) disclose Display Device And Method Of Testing The Same. Liquid Crystal Display Apparatus And Testing Method For Liquid Crystal Display Apparatus. Nakano et al (Pat# 7,091,738) disclose Inspection System For Active Matrix Panel, Inspection Method For Active Matrix Panel And Manufacturing Method For Active Matrix OLED Panel. Any inquiry concerning this communication or earlier communications from the examiner should be directed to VINH P NGUYEN whose telephone number is (571)272-1964. The examiner can normally be reached M-F 6:00am-4:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Phan Huy can be reached on 571-272-7924. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /VINH P NGUYEN/Primary Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Feb 10, 2025
Application Filed
Sep 08, 2026
Non-Final Rejection mailed — §DP (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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POWER SUPPLY CIRCUIT, VOLTAGE MONITORING CIRCUIT, AND POWER SUPPLY DEVICE
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ELECTROLUMINESCENCE INSPECTION APPARATUS
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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+16.1%)
2y 3m (~7m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1380 resolved cases by this examiner. Grant probability derived from career allowance rate.

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