Prosecution Insights
Last updated: October 04, 2026
Application No. 19/076,373

METHOD FOR SETTING TEMPERATURE COMPENSATION FOR A PLURALITY OF PROXIMITY SENSORS OF THE SAME KIND

Non-Final OA §102
Filed
Mar 11, 2025
Priority
Mar 13, 2024 — EU 24163319.7
Examiner
PHAN, MINH Q
Art Unit
Tech Center
Assignee
Optosys SA
OA Round
1 (Non-Final)
76%
Grant Probability
Favorable
1-2
OA Rounds
8m
Est. Remaining
71%
With Interview

Examiner Intelligence

Grants 76% — above average
76%
Career Allowance Rate
646 granted / 852 resolved
+15.8% vs TC avg
Minimal -5% lift
Without
With
+-4.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
28 currently pending
Career history
870
Total Applications
across all art units

Statute-Specific Performance

§101
2.8%
-37.2% vs TC avg
§103
46.5%
+6.5% vs TC avg
§102
28.1%
-11.9% vs TC avg
§112
16.0%
-24.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 852 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-12 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Hasegawa (US Pub. No. 2019/094404, cited by applicant). Regarding claims 1-12, Hasegawa teaches a method for setting temperature compensation for a plurality of proximity sensors of the same kind, each including a memory, the method comprising the steps of: S1) arranging the plurality of proximity sensors in a temperature control chamber (para. 92); S2) capturing an output signal of each of the plurality of proximity sensors at different temperatures (para. 105-106); S3) based on the output signal captured, determining for each of the plurality of proximity sensors an individual correction as a function of a temperature, the individual correction serves for determining a corrected output signal, which has a reduced drift with regard to temperature changes (para. 35-37); and S4) storing for each of the plurality of proximity sensors information on the individual correction determined in the memory (para. 37); wherein in the step S1 the output signal is captured for each of the plurality of proximity sensors in an absence of a target altering magnetic field produced by a proximity sensor (Fig. 7, the calibration process is performed during the proximity sensors are placed in a thermal chamber without any target object) [claim 2]; wherein in step S3 for determining the individual correction an influence of a presence of a target is taken into account by adjusting the output signal captured based on separate measurements of at least one proximity sensor of the same kind, in which measurements the output signal is captured in the presence of a target (para. 35) [claim 3]; wherein the separate measurements are made under outside temperature of the control chamber (para. 35) [claim 4]; wherein each of the plurality of proximity sensors measures an actual temperature by means of a temperature probe in a proximity sensor (para. 42-44) [claim 5]; wherein each of the plurality of proximity sensors includes a resonant circuit and is configured to detect a target based on a damping of a resonant circuit, wherein in step S3 for determining the individual correction an influence of a presence of a target is taken into account based on separate measurements of at least one proximity sensor of the same kind, in which a damping resistance in the presence and in an absence of the target is determined at least at one specific temperature (para. 38-39) [claim 6]; wherein each of the plurality of proximity sensors comprises a computing component (Fig. 3, item 32) for determining the corrected output signal based on the information stored in step S4 (para. 41) [claim 7]; wherein the computing part component is part of the ASIC (para. 33-34) [claim 8]; wherein for exposing the plurality of proximity sensors to different temperatures in step S2, a setpoint temperature in the temperature control chamber satisfied: the setpoint temperature is maintained at a constant level (para. 105) [claim 9]; wherein the plurality of proximity sensors is arranged on a carrier equipment (310) which includes a communication component (312) for communication with a computer system arranged outside of the temperature control chamber (Fig. 7) [claim 10]; wherein each of the plurality of proximity sensors includes at least one of the following: a sensing coil arranged in a head portion of a proximity sensor (16) and configured to produce a magnetic field (para. 55) [claim 11]; and prior to step S1, a manufacture process, in which the plurality of proximity sensors of the same kinds are produced in the same way, so that they include the same components and have the same dimensions (implicit steps to obtain a plurality of proximity sensors) [claim 12]. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MINH Q PHAN whose telephone number is (571)270-3898. The examiner can normally be reached Mon-Fri 9am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Stephanie Bloss can be reached at 571-272-3555. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. MINH Q. PHAN Primary Examiner Art Unit 2852 /MINH Q PHAN/Primary Examiner, Art Unit 2852
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Prosecution Timeline

Mar 11, 2025
Application Filed
Sep 21, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
76%
Grant Probability
71%
With Interview (-4.7%)
2y 2m (~8m remaining)
Median Time to Grant
Low
PTA Risk
Based on 852 resolved cases by this examiner. Grant probability derived from career allowance rate.

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