Prosecution Insights
Last updated: October 02, 2026
Application No. 19/081,288

DEVICE FOR DETERMINING A MAGNETIC FIELD OF INTEREST AT A MEASUREMENT LOCATION

Non-Final OA §102
Filed
Mar 17, 2025
Priority
Mar 27, 2024 — DE 10 2024 202 903.3
Examiner
PHAN, MINH Q
Art Unit
Tech Center
Assignee
Robert Bosch GmbH
OA Round
1 (Non-Final)
76%
Grant Probability
Favorable
1-2
OA Rounds
8m
Est. Remaining
71%
With Interview

Examiner Intelligence

Grants 76% — above average
76%
Career Allowance Rate
646 granted / 852 resolved
+15.8% vs TC avg
Minimal -5% lift
Without
With
+-4.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
28 currently pending
Career history
870
Total Applications
across all art units

Statute-Specific Performance

§101
2.8%
-37.2% vs TC avg
§103
46.5%
+6.5% vs TC avg
§102
28.1%
-11.9% vs TC avg
§112
16.0%
-24.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 852 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claim 11 is objected to because of the following informalities: the abbreviation/acronym “ODMR” needs to be fully written. Appropriate correction is required. Claim 13 objected to because of the following informalities: on the last line of the claim, remove “crystal”, replace with -- crystals --. Appropriate correction is required. Claim 15 objected to because of the following informalities: on the 1st line of the claim, remove “crystal”, replace with -- crystals --. Appropriate correction is required. Claim 18 is objected to because of the following informalities: on the first line, remove “ o measure”, replace with -- to measure--. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 10, 13 and 15-18 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Brenneis et al. (WO 2023156059). Regarding claim 10, 13 and 15-18, Brenneis teaches a device for determining a magnetic field of interest at a measurement location, comprising: a first sensor crystal (101) and a second sensor crystal (102) having color centers, wherein the first sensor crystal is arranged at the measurement location, and the second sensor crystal is arranged at a distance from the measurement location; an excitation light generator (120) configured to generate a pulsed excitation light which irradiates the first sensor crystal and the second sensor crystal; a field generator (140) configured to generate a magnetic field, wherein the first and the second sensor crystal are arranged in the magnetic field; and a measuring arrangement (130) configured to detect a fluorescent light emanating from the first and the second sensor crystals; wherein the device is configured to apply the same magnetic field and the same excitation light to the first and the second sensor crystal (pg. 5, 3rd para.); wherein the device is configured to directly measure a difference between the magnetic fields at the location of the first sensor crystal and at the location of the second sensor crystal; wherein the device is configured to direct excitation light generated by the excitation light generator equally onto the first and second sensor crystals using a beam splitter (pg. 5, 2nd paragraph) [claim 13]; wherein the first and second sensor crystals having color centers are diamond crystals having nitrogen vacancy centers (pg. 2, para. 6) [claim 15]; and wherein the device is configured to measure the difference between the magnetic field at the location of the first sensor crystal and at the location of the second sensor crystal as the magnetic field of interest [claim 16]; wherein the device is configured to measure a local gradient of the difference between the magnetic fields at the location of the first crystal and at the location of the second sensor crystal as the magnetic field of interest (pg. 5, last paragraph to pg. 6, 1st paragraph) [claim 17]; and wherein the device is configured to measure the magnetic field that is created during contraction of a cardiac muscle (pg. 8, last paragraph) [claim 18]. Claim(s) 10-16 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Sako et al. (US Pub. No. 2026/0211064). Regarding claims 10-16, Sako teaches a device for determining a magnetic field of interest at a measurement location, comprising: a first sensor crystal (1) and a second sensor crystal (1R) having color centers, wherein the first sensor crystal is arranged at the measurement location, and the second sensor crystal is arranged at a distance from the measurement location (para. 27); an excitation light generator (12) configured to generate a pulsed excitation light which irradiates the first sensor crystal and the second sensor crystal; a field generator (2, 2R) configured to generate a magnetic field, wherein the first and the second sensor crystal are arranged in the magnetic field (para. 35); and a measuring arrangement (13) configured to detect a fluorescent light emanating from the first and the second sensor crystals; wherein the device is configured to apply the same magnetic field and the same excitation light to the first and the second sensor crystal (para. 35); wherein the device is configured to directly measure a difference between the magnetic fields at the location of the first sensor crystal and at the location of the second sensor crystal; wherein the device is configured to measure the difference between the magnetic field at the location of the first sensor crystal and at the location of the second sensor crystal using a pulsed ODMR measurement (para. 3) [claim 11]; wherein the device is configured to measure the difference between the magnetic field at the location of the first sensor crystal and at the location of the second sensor crystal using a Ramsey measurement (para. 64) [claim 12]; wherein the device is configured to direct excitation light generated by the excitation light generator equally onto the first and second sensor crystals using a beam splitter (para. 55) [claim 13]; wherein the field generator is configured to generate an alternating electrical signal, which is applied to a first coil arrangement and to a second coil arrangement, wherein the first coil arrangement generates a first magnetic field at the location of the first sensor crystal, and the second coil arrangement generates a second magnetic field at the location of the second sensor crystal, wherein a strength and temporal profile of the first and the second magnetic field are identical (para. 35, 38) [claim 14]; wherein the first and second sensor crystals having color centers are diamond crystals having nitrogen vacancy centers (para. 3) [claim 15]; and wherein the device is configured to measure the difference between the magnetic field at the location of the fist sensor crystal and at the location of the second sensor crystal as the magnetic field of interest (para. 80) [claim 16]. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MINH Q PHAN whose telephone number is (571)270-3898. The examiner can normally be reached Mon-Fri 9am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Stephanie Bloss can be reached at 571-272-3555. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. MINH Q. PHAN Primary Examiner Art Unit 2852 /MINH Q PHAN/Primary Examiner, Art Unit 2852
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Prosecution Timeline

Mar 17, 2025
Application Filed
Sep 18, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
76%
Grant Probability
71%
With Interview (-4.7%)
2y 2m (~8m remaining)
Median Time to Grant
Low
PTA Risk
Based on 852 resolved cases by this examiner. Grant probability derived from career allowance rate.

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