Prosecution Insights
Last updated: October 27, 2026
Application No. 19/122,236

SYSTEMS AND METHODS FOR FAST CONTROL OF IMPEDANCE ASSOCIATED WITH AN OUTPUT OF A PLASMA SOURCE

Non-Final OA §102
Filed
Apr 17, 2025
Priority
Oct 24, 2022 — provisional 63/418,876 +2 more
Examiner
LE, TUNG X
Art Unit
2845
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Lam Research Corporation
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
5m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
1457 granted / 1675 resolved
+19.0% vs TC avg
Minimal +3% lift
Without
With
+3.3%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
25 currently pending
Career history
1715
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
38.9%
-1.1% vs TC avg
§102
37.7%
-2.3% vs TC avg
§112
9.7%
-30.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1675 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . This Office Action is in response to the Applicant’s communication filed on April 17, 2025. In virtue of this communication, claims 1-20 are currently presented in the instant application. Information Disclosure Statement The information disclosure statement (IDS) submitted on 4/17/2025 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-5, 7-10 and 12-20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Long et al. (US 2019/0385821). With respect to claim 1, Long discloses in figure 6 a system for control of impedance associated with an output (Vin) of a plasma source (620, e.g., an RF generator or an RF source or a plasma source), comprising: the plasma source configured to generate a radio frequency (RF) signal (Vin, e.g., an RF signal); a load (Cathode or load) coupled to the plasma source via an RF connection (RFC, e.g., an RF connection), wherein the RF connection has a point (P, e.g., a point); a tunable impedance match (650-654, e.g., a matching network having tunable or variable capacitors C1-C2 thereof) coupled to the point between the plasma source and the load (see figure 6), wherein the tunable impedance match includes a dependent voltage source (410, e.g., a DC source or a dependent voltage source thereof) and a circuit network (L1-L8, C1-C7, e.g., a matching network), wherein the dependent voltage source is coupled in series with the circuit network (see figure 6, e.g., having a serial feature thereof). PNG media_image1.png 638 932 media_image1.png Greyscale With respect to claim 2, Long discloses that wherein the circuit network includes a capacitor (C1-C7) or an inductor (L1-L8) or a combination thereof (see figure 6), wherein the dependent voltage source includes a direct current (DC) voltage source (410 is a DC voltage source), the system comprising a processor (644, e.g., a controller), wherein the processor is configured to modify a voltage output from the DC voltage source to achieve the control of impedance (see figure 6 and paragraph 0061, e.g., “one or more microprocessors”). With respect to claim 3, Long discloses that wherein the dependent voltage source includes a direct current (DC) voltage source (410) and an inverter circuit (138), wherein the DC voltage source is coupled in parallel to the inverter circuit (see figure 6). With respect to claim 4, Long discloses that wherein the DC voltage source is configured to modify a voltage output (VDC) from the DC voltage source for the control of impedance (see figure 6). With respect to claim 5, Long discloses that wherein the dependent voltage source includes a plurality of pulse signal sources (144, 146, e.g., pulse sources) including a first pulse source (144) and a second pulse source (146), wherein the inverter circuit includes a first transistor (140) and a second transistor (142), wherein the first pulse source is coupled to the first transistor to provide a first pulse signal (S1) to the first transistor and the second pulse source is coupled to the second transistor to provide a second pulse signal (S2) to the second transistor, wherein the first pulse source is configured to modify a phase of the first pulse signal and the second pulse source is configured to modify a phase of the second pulse signal to achieve the control of impedance (see paragraph 0052). With respect to claim 7, Long discloses that wherein the dependent voltage source includes a capacitor (C5) and an inverter circuit (138), wherein the capacitor is coupled in parallel to the inverter circuit (see figure 6). With respect to claim 8, Long discloses in figures 6-7 a system for control of impedance associated with an output (Vin) of a plasma source (620, e.g., an RF generator or an RF source or a plasma source), comprising: the plasma source configured to generate a radio frequency (RF) signal (Vin, e.g., an RF signal); a load (Cathode or Load) coupled to the plasma source via an RF connection (RFC), wherein the RF connection has a point (P, e.g., a point); a plurality of tunable impedance matches (650-1, 650-2, e.g., matching networks) coupled to the point between the plasma source and the load (see figure 7), wherein the plurality of tunable impedance matches include a first tunable impedance match (650-1) and a second tunable impedance match (650-2), wherein the first tunable impedance matches includes a first dependent voltage source (410) and a first circuit network (C4-C7, L5-L8), wherein the second tunable impedance matches includes a second dependent voltage source (410) and a second circuit network (C4-C7, L5-L8), wherein the first dependent voltage source is coupled in series with the first circuit network (see figure 7, e.g., having a serial feature thereof), wherein the second dependent voltage source is coupled in series with the second circuit network (see figure 7, e.g., having a serial feature thereof). With respect to claim 9, Long discloses that wherein the first circuit network includes a first capacitor (C4) or a first inductor (L5) or a combination thereof (see figure 7), wherein the second circuit network includes a second capacitor (C4) or a second inductor (L5) or a combination thereof (see figure 7), wherein the plasma source is a matchless plasma source or a radio frequency (RF) generator (620, e.g., an RF generator), and the load includes a plasma chamber (Load is a plasma chamber). With respect to claim 10, Long discloses that wherein the plurality of tunable impedance matches are configured to modify an impedance of the RF signal to output a modified RF signal (Vo), wherein the modified RF signal is provided to the load, wherein the RF signal is a sinusoidal signal and the load includes a plasma chamber (figure 6, e.g., Load is a plasma chamber). With respect to claim 12, Long discloses in figure 7 that wherein the first dependent voltage source includes a first direct current (DC) voltage source (VDC), a first pulse source (144), a second pulse source (146), and a first inverter circuit (138), and the second dependent voltage source includes a second DC voltage source (VDC), a third pulse source (144), a fourth pulse source (146), and a second inverter circuit (138). With respect to claim 13, Long discloses that wherein the first DC voltage source is coupled in parallel with the first inverter circuit and the second DC voltage source is coupled in parallel with the second inverter circuit (figure 7 shows parallel features thereof). With respect to claim 14, Long discloses in figure 7 that wherein the first dependent voltage source includes a first capacitor (C4) and the second dependent voltage source includes a second capacitor (C4). With respect to claim 15, Long discloses that wherein the first capacitor is coupled in parallel with the first inverter circuit and the second capacitor is coupled in parallel with the second inverter circuit (see figure 7). With respect to claim 16, Long discloses in figure 6 a system for control of impedance associated with an output (Vin) of a radio frequency (RF) generator (620, e.g., an RF generator), comprising: the RF generator configured to generate an RF signal (Vin, e.g., an RF signal); a tunable impedance match (650-654, e.g., a matching network having tunable or variable capacitors C1-C2 thereof) coupled to the RF generator via an RF cable (RFC) to receive the RF signal (see figure 6), wherein the tunable impedance match includes a dependent voltage source (410), wherein the tunable impedance match is configured to modify an impedance of the RF signal to output a modified RF signal (Vo); and a load (Cathode or Load) coupled to the tunable impedance match via an RF transmission line (having a transmission line from a point P to the load) to receive the modified RF signal (see figure 6). With respect to claim 17, Long discloses that further comprising: an additional tunable impedance match (650-2) coupled to the RF generator via the RF cable (see figure 7), wherein the additional tunable impedance match includes an additional dependent voltage source (410), wherein the additional tunable impedance match is configured to modify the impedance of the RF signal to output the modified RF signal (see figure 7). With respect to claim 18, Long discloses in figure 7 that further comprising a match (C4-C7 and L5-L8) including the tunable impedance match, wherein the match includes a mechanical circuit (L5-L8) component coupled to the tunable impedance match (see figure 7). With respect to claim 19, Long discloses in figure 7 that wherein the mechanical circuit component is a mechanical capacitor (C4) or a mechanical inductor (L5). With respect to claim 20, Long discloses that wherein the tunable impedance match includes an inductor-capacitor network (C4-L5) that is coupled to the dependent voltage source (see figure 7). Allowable Subject Matter Claims 6 and 11 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Prior art Yamazawa et al. – US 8,741,097 Prior art Morii – US 2021/0194462 Prior art Luu et al. – US 2018/034903 Prior art Shimomoto et al. – US 2014/0091875 Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUNG X LE whose telephone number is (571)272-6010. The examiner can normally be reached Monday to Friday from 10am to 6pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Alexander H. Taningco can be reached at 571-272-8048. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUNG X LE/Primary Examiner, Art Unit 2845 August 13, 2026
Read full office action

Prosecution Timeline

Apr 17, 2025
Application Filed
Aug 17, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12770854
Digital Panning for Rare Earth Elements
2y 5m to grant Granted Oct 20, 2026
Patent 12772359
AUTOMATIC TOGGLING OF STADIUM UPLIGHT STRUCTURES
1y 8m to grant Granted Oct 20, 2026
Patent 12756086
ANTENNA AND WIRELESS TERMINAL PROVIDED WITH SAME
2y 8m to grant Granted Oct 06, 2026
Patent 12755952
MASS SPECTROMETER
2y 4m to grant Granted Oct 06, 2026
Patent 12756105
ANTENNA STRUCTURE
1y 8m to grant Granted Oct 06, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
90%
With Interview (+3.3%)
2y 0m (~5m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1675 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month