Prosecution Insights
Last updated: October 26, 2026
Application No. 19/131,250

CLOCK DUTY CALIBRATION DEVICE AND METHOD

Non-Final OA §102
Filed
May 20, 2025
Priority
Dec 12, 2022 — RE 10-2022-0172826 +1 more
Examiner
CHEN, SIBIN
Art Unit
2842
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Qualitas Semiconductor Co. Ltd.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
9m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
902 granted / 1041 resolved
+18.6% vs TC avg
Moderate +5% lift
Without
With
+5.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
20 currently pending
Career history
1066
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
44.2%
+4.2% vs TC avg
§102
38.8%
-1.2% vs TC avg
§112
14.4%
-25.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1041 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-3, 8, and 9 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by JP 2015-530820 (‘820). Regarding claim 1, fig. 1 of ‘820 discloses a clock duty calibration device, comprising: a duty control module [102] configured to generate a first clock [112] by adjusting a duty cycle of a received reference clock [110]; a duty measurement module [104, 106] configured to measure a duty cycle of the first clock based on an average voltage level (with LPF 104) of the first clock; and a control module [108] configured to generate a duty control code [122] based on the measured duty cycle so that the duty cycle of the first clock becomes a target duty cycle; and wherein the duty control module adjusts the duty cycle of the reference clock based on the duty control code. Regarding claim 2, fig. 1 of ‘820 discloses wherein: the duty measurement module includes a low-pass filter unit [104]; and the low-pass filter unit generates a first voltage signal corresponding to the average voltage level of the first clock. Regarding claim 3, fig. 1 of ‘820 discloses wherein: the duty measurement module comprises a reference signal generation unit [that generating 116] (not shown); and the reference signal generation unit generates a reference voltage signal [116] corresponding to the target duty cycle. Regarding claims 8 and 9, these claims are merely methods to operate the circuit having structure recited in claims 1-3. Since ‘820 above teaches the structure, the methods to operate such a circuit are similarly disclosed. Allowable Subject Matter Claims 4-7 and 10-14 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Fon describes a testing ADC. Hussain describes a clock signal conversion circuit for high-speed serial data control. Ke describes an apparatus for performing clock and data duty cycle. Addepalli describes a duty cycle and skew corrector. Any inquiry concerning this communication or earlier communications from the examiner should be directed to SIBIN CHEN whose telephone number is (571)270-5768. The examiner can normally be reached 9:00am - 5:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Taelor Kim can be reached at (571) 270-7166. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SIBIN CHEN/Primary Examiner, Art Unit 2836
Read full office action

Prosecution Timeline

May 20, 2025
Application Filed
Oct 07, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
92%
With Interview (+5.2%)
2y 3m (~9m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1041 resolved cases by this examiner. Grant probability derived from career allowance rate.

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