Prosecution Insights
Last updated: October 26, 2026
Application No. 19/132,615

FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT METHOD

Non-Final OA §102
Filed
May 23, 2025
Priority
Dec 06, 2022 — JP 2022-194697 +1 more
Examiner
KO, TONY
Art Unit
2877
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Hamamatsu Photonics K.K.
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
11m
Est. Remaining
91%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
790 granted / 900 resolved
+19.8% vs TC avg
Minimal +3% lift
Without
With
+2.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
21 currently pending
Career history
926
Total Applications
across all art units

Statute-Specific Performance

§101
1.6%
-38.4% vs TC avg
§103
29.6%
-10.4% vs TC avg
§102
45.8%
+5.8% vs TC avg
§112
19.7%
-20.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 900 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 2 and 7 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Bullock et al (US 20180286650). Regarding claim 1, Bullock et al teach (Figs. 1-7) A film thickness measurement device and method comprising: a spectral separation unit (245) configured to spectrally separate measurement light outputted from a light source and reflected by a sample (110); a detection unit (250) configured to detect spectral images of the measurement light spectrally separated by the spectral separation unit; a generation unit (280) configured to generate spectrum data for analysis by using spectrum data obtained from a result of detection of spectral images of the measurement light; and an analysis unit (270) configured to analyze a film thickness ([0028]) of the sample on the basis of the spectrum data for analysis, wherein the spectral separation unit subjects the measurement light to wavelength resolution in a first direction and forms spectral images on a wavelength basis each in a second direction intersecting the first direction ([0033]), the detection unit has a first pixel region (310) and a second pixel region (311) divided in the second direction, and receives spectral images of the measurement light with the first pixel region with a first type of exposure time and receives spectral images of the measurement light with the second pixel region with a second type of exposure time longer than the first type of exposure time, and the generation unit combines data in a long wavelength region in a first type of measurement spectrum data obtained from the first pixel region and data in a short wavelength region in a second type of measurement spectrum data obtained from the second pixel region (see [0032] where it teaches the various regions can be independently controlled), and generates the spectrum data for analysis. Regarding claim 2, Bullock et al teach the detection unit is a CCD photodetector including: a first horizontal shift register ([0073]) to which charge generated in each column of the first pixel region (310) is transferred; and a second horizontal shift register ([0073] – shift register) to which charge generated in each column of the second pixel region (311) is transferred. Allowable Subject Matter Claims 3-6 are objected to as being dependent upon a rejected base claim but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TONY KO whose telephone number is (571)272-1926. The examiner can normally be reached Monday-Friday 9-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Georgia Epps can be reached at 571-272-2328. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TONY KO/Primary Examiner, Art Unit 2878 TK
Read full office action

Prosecution Timeline

May 23, 2025
Application Filed
Sep 24, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
91%
With Interview (+2.8%)
2y 4m (~11m remaining)
Median Time to Grant
Low
PTA Risk
Based on 900 resolved cases by this examiner. Grant probability derived from career allowance rate.

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