Prosecution Insights
Last updated: April 19, 2026
Application No. 19/300,316

RFID TAG

Non-Final OA §102
Filed
Aug 14, 2025
Examiner
MIKELS, MATTHEW
Art Unit
2876
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Fujitsu Frontech Limited
OA Round
1 (Non-Final)
81%
Grant Probability
Favorable
1-2
OA Rounds
2y 3m
To Grant
99%
With Interview

Examiner Intelligence

Grants 81% — above average
81%
Career Allow Rate
1044 granted / 1292 resolved
+12.8% vs TC avg
Strong +20% interview lift
Without
With
+20.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
32 currently pending
Career history
1324
Total Applications
across all art units

Statute-Specific Performance

§101
1.6%
-38.4% vs TC avg
§103
43.0%
+3.0% vs TC avg
§102
38.4%
-1.6% vs TC avg
§112
4.4%
-35.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1292 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claims 1-7 are pending. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-2, 4 and 6 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Albrecht, et al. (English translation of EP 2103561A2, herein Albrecht).1 2 Regarding claim 1, Albrecht teaches an RFID tag, comprising: an inlay that has a long shape (paragraph 0036: transponder 12) and has: a semiconductor element (paragraph 0005: integrated circuit); a substrate with an antenna pattern (paragraph 0005: antenna), which is formed to be connected to the semiconductor element (paragraph 0005: integrated circuit); and a protective member, which protects both surfaces of the substrate in a thickness direction (paragraph 0036: carrier element 11); and a tube member having elasticity and having the inlay housed therein from one end portion to another end portion of the inlay in a longitudinal direction, wherein the inlay has a size formed to be smaller than an inner diameter of the tube member, the size being in a lateral direction of the inlay, and has an engagement portion, which is formed at the other end portion of the inlay in the longitudinal direction, the engagement portion having been extended in the lateral direction of the inlay and engaging with an inner surface of the tube member (paragraph 0036: central cavity 15). Regarding claim 2, Albrecht teaches the engagement portion has an inclined surface, which is formed to be inclined with respect to the longitudinal direction of the inlay, the inclined surface being at an end of the engagement portion, the end being near the one end portion (paragraph 0024), and the inclined surface is inclined to form an obtuse angle to an outer peripheral surface of the engagement portion, the outer peripheral surface extending along the inner surface of the tube member (paragraph 0024). Regarding claim 4, Albrecht teaches the tube member has a cross sectional shape that is formed in a flattened shape flattened in a thickness direction of the inlay (paragraph 0036: central cavity 15). Regarding claim 6, Albrecht teaches the engagement portion is formed on both sides of the inlay in the lateral direction (paragraph 0036: central cavity 15). Allowable Subject Matter Claims 3, 5 and 7 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The cited art fails to disclose the particular structure of the inlay as recited in these claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MATTHEW MIKELS whose telephone number is (571)270-5470. The examiner can normally be reached Monday to Thursday 7:00 AM ET - 4:30 PM ET, Friday 7:00 AM ET - 11:00 AM ET, the Examiner is on central time.3 Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Michael G Lee can be reached at 571-272-2398. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MATTHEW MIKELS/Primary Examiner, Art Unit 2876 1 In addition to the cited portions, please see also the associated figures. 2 A copy of the Espacenet translation is attached to this Office Action. A copy of the original EPO document is also attached. 3 The Examiner can also be reached at matthew.mikels@uspto.gov.
Read full office action

Prosecution Timeline

Aug 14, 2025
Application Filed
Mar 17, 2026
Non-Final Rejection — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
81%
Grant Probability
99%
With Interview (+20.4%)
2y 3m
Median Time to Grant
Low
PTA Risk
Based on 1292 resolved cases by this examiner. Grant probability derived from career allow rate.

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