Prosecution Insights
Last updated: October 27, 2026
Application No. 19/315,725

PLASMA PROCESSING APPARATUS AND METHOD OF CONTROLLING THE SAME

Non-Final OA §103
Filed
Sep 01, 2025
Priority
Sep 11, 2024 — JP 2024-157823
Examiner
LE, TUNG X
Art Unit
2844
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Tokyo Electron Limited
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
1457 granted / 1675 resolved
+19.0% vs TC avg
Minimal +3% lift
Without
With
+3.3%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
25 currently pending
Career history
1715
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
38.9%
-1.1% vs TC avg
§102
37.7%
-2.3% vs TC avg
§112
9.7%
-30.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1675 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . This Office Action is in response to the Applicant’s communication filed on September 01, 2025. In virtue of this communication, claims 1-6 are currently presented in the instant application. Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Information Disclosure Statement The information disclosure statement (IDS) submitted on 09/01/2025 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-2 and 5-6 are rejected under 35 U.S.C. 103 as being unpatentable over Abe et al. (US 2008/0093024) in view of Wheatley et al. (US 2013/0038136). PNG media_image1.png 692 779 media_image1.png Greyscale With respect to claims 1 and 6, Abe discloses in figure 3 and 7A a plasma processing apparatus and a method thereof comprising: a radio-frequency power supply (58, e.g., a RF generator or a RF power source); a pair of plasma electrodes (56A-56B, e.g., electrodes); a matching box (74, e.g., a matching box) located between the pair of plasma electrodes and the radio-frequency power supply and having an impedance matching circuit (L1-L2, C1-C2, e.g., a matching circuit) including a first variable inductor (L1, e.g., a first variable inductor in figure 7A) and a second variable inductor (L2, e.g., a second variable inductor in figure 7A); and a controller (78, e.g., a controller), wherein the controller has an efficiency that correlates an inductance of the first variable inductor and an inductance of the second variable inductor with an efficiency of the matching box (paragraph 0030, e.g., “the voltage to be applied to both the plasma electrodes can be significantly increased by properly adjusting the impedance, as such increasing the plasma density as well as enhancing the efficiency of generating plasma”), and wherein the controller is configured to execute: performing impedance matching by varying the inductance of the first variable inductor and the inductance of the second variable inductor (figure 7A shows variable inductors L1-L2 for performing impedance matching features thereof); obtaining the efficiency of the matching box based on the inductance of the first variable inductor and the inductance of the second variable inductor after the impedance matching and the efficiency (see paragraph 0030), and calculating output power of the radio-frequency power supply based on the obtained efficiency of the matching box and supply power supplied to the plasma electrodes (figure 3 shows the controller receiving a measured power from a power detector 76 for controlling, estimating or calculating the power applied to the electrodes 56A-56B thereof) ; and controlling the output power of the radio-frequency power supply based on the calculated output power (paragraph 0063, e.g., “the control unit 78 adjusts the load of the high frequency matching circuit and plasma P”). PNG media_image2.png 270 624 media_image2.png Greyscale Abe does not explicitly disclose that the controller has an efficiency map. Wheatley discloses in figure 11 an apparatus comprising a power source (1124), a matching circuit (1126), a controller (having a controller, not shown, for providing a control signal 1102 to control the power source 1124 thereof) and a load (1150), wherein the controller has an efficiency map (paragraph 0113, e.g., “the filter circuit 1126 and operating frequency to shift a reactance in order to map the high efficiency curve 902 to the transformed impedance curve of the filter circuit 1126”). It would have been obvious to one of ordinary skill in the art at the time the invention was made to modify the apparatus of Abe with an efficiency map as taught by Wheatley for improving a high efficiency matching impedance applied to the plasma electrodes thereof since this configuration for the stated purpose would have been deemed obvious to a person skilled in the art. With respect to claim 2, the combination of Abe and Wheatley disclose that wherein the controller is further configured to execute: repeating, as one cycle, the performing the impedance matching, the calculating the output power of the radio-frequency power supply, and the controlling the output power of the radio-frequency power supply (figures 4, 6 and 10 shows a repeating cycle for operating power thereof). With respect to claim 5, the combination of Abe and Wheatley disclose that wherein the performing the impedance matching includes selecting a matching position of the inductance of the first variable inductor and the inductance of the second variable inductor such that the efficiency of the matching box in the efficiency map is 80% or more (figures 7A and 9B of Abe shows the selecting impedance matching features to enhance a high efficiency thereof). Allowable Subject Matter Claims 3-4 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Prior art Kobayashi – US 2023/0235460 Prior art Kobayashi et al. – US 2022/0293394 Prior art Ulrich et al. – US 2020/0126765 Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUNG X LE whose telephone number is (571)272-6010. The examiner can normally be reached Monday to Friday from 10am to 6pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Alexander H. Taningco can be reached at 571-272-8048. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUNG X LE/Primary Examiner, Art Unit 2845 September 14, 2026
Read full office action

Prosecution Timeline

Sep 01, 2025
Application Filed
Sep 23, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
90%
With Interview (+3.3%)
2y 0m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1675 resolved cases by this examiner. Grant probability derived from career allowance rate.

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