Technology area: Semiconductors, Circuits & Optics
1 pending office actions • 1 art units • 1 examiners • 0 of 1 (0%) have an AI response strategy ready • 1 patents granted in the last 365 days
Blackbox Biometrics Inc. has 2 pending office actions in the Semiconductors, Circuits & Optics technology area. These actions are being handled by 2 distinct examiners but are concentrated within 1 distinct art unit. This indicates that while the technical subject matter is reviewed within a single administrative group, the specific evaluations are being conducted by different individuals.
DUNLAP, JONATHAN M is the busiest examiner, holding 1 busiest examiner pending action. This accounts for 1 of the 2 total pending actions currently active for the portfolio. With 2 distinct examiners involved, the company's prosecution strategy is split between two primary points of contact. The focus within 1 distinct art unit ensures that the company is navigating a consistent set of technical standards despite the involvement of multiple examiners.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| Multi-statute (no §101) | 1 (100%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| DUNLAP, JONATHAN M | 1 | 76.2% | +17.0% |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18294245 | FLAT MESH SENSOR | DUNLAP, JONATHAN M | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18294245 | FLAT MESH SENSOR | DUNLAP, JONATHAN M | — |
| Art Unit | Apps |
|---|---|
| 2855 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18294245 | FLAT MESH SENSOR | DUNLAP, JONATHAN M | 2855 | §102§103§112 | Non-Final OA | — | Pending | Feb 01, 2024 |
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