Prosecution Insights
Prosecution Insights
Technology area: Communications
1 pending office actions • 1 art units • 1 examiners • 0 of 1 (0%) have an AI response strategy ready • 3 patents granted in the last 365 days
Camtek Ltd. is active in the Communications technology area with 1 pending office action. This action is assigned to 1 distinct examiner, SETH, MANAV, and 1 distinct art unit. SETH, MANAV is the busiest examiner for the company, holding 1 pending office action. This single matter defines the current prosecution activity for the portfolio.
The presence of the pending matter across the assigned examiner and 1 distinct art unit indicates a highly focused prosecution state. This alignment ensures that the company's prosecution is contained within a single technical channel under the oversight of SETH, MANAV. The concentration of the case in the assigned art unit reflects a specific technical focus for the company's current filings in the Communications sector.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| Multi-statute (no §101) | 1 (100%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| SETH, MANAV | 1 | 90.7% | +8.0% |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18641395 | METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFECT IMAGES, BASED ON DEEP LEARNING | SETH, MANAV | — |
| Art Unit | Apps |
|---|---|
| 2672 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18641395 | METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFECT IMAGES, BASED ON DEEP LEARNING | SETH, MANAV | 2672 | §103§112Other | Non-Final OA | — | Pending | Apr 21, 2024 |
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