Technology area: Semiconductors, Circuits & Optics
6 pending office actions • 2 art units • 5 examiners • 0 of 6 (0%) have an AI response strategy ready • 8 patents granted in the last 365 days
MPI Corporation has 7 pending office actions in Semiconductors, Circuits & Optics. The matters involve 5 distinct examiners and 2 distinct art units, indicating that prosecution is concentrated in a small number of technical groups while still involving several examiner relationships.
ZAKARIA, AKM is the busiest examiner, with 3 pending matters. That concentration makes examiner-specific review especially important for consistency in claim amendments, interview planning, and response positions. The shared art-unit setting may also support coordinated analysis, subject to the facts of each application.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 1 (17%) |
| §102 only | 2 (33%) |
| Multi-statute (no §101) | 3 (50%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| ZAKARIA, AKM | 2 | 82.6% | +16.2% |
| PATEL, PARESH H | 1 | 79.6% | -1.1% |
| REISNER, NOAM S | 1 | 73.9% | -8.5% |
| ISLA, RICHARD | 1 | 77.1% | +15.5% |
| POTHEN, FEBA | 1 | 81.0% | +11.3% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18762988 | WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL FOR CALIBRATION OF A PROBE ASSEMBLY | POTHEN, FEBA | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 4 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18938623 | PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME AND TESTED DEVICE | REISNER, NOAM S | — |
| 18934482 | PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AND SYSTEM FOR DETECTING DEVICE UNDER TEST USING THE PROBE CARD | ZAKARIA, AKM | — |
| 18932714 | PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — |
| 18820228 | MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS | ISLA, RICHARD | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 4 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18934482 | PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AND SYSTEM FOR DETECTING DEVICE UNDER TEST USING THE PROBE CARD | ZAKARIA, AKM | — |
| 18932714 | PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — |
| 18820228 | MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS | ISLA, RICHARD | — |
| 18762988 | WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL FOR CALIBRATION OF A PROBE ASSEMBLY | POTHEN, FEBA | — |
| Art Unit | Apps |
|---|---|
| 2858 | 5 |
| 2852 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18973444 | PROBE SYSTEM AND MACHINE APPARATUS THEREOF | PATEL, PARESH H | 2858 | §102Other | Non-Final OA | — | Pending | Dec 09, 2024 |
| 18938623 | PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME AND TESTED DEVICE | REISNER, NOAM S | 2852 | §102§103 | Non-Final OA | — | Pending | Nov 06, 2024 |
| 18934482 | PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AND SYSTEM FOR DETECTING DEVICE UNDER TEST USING THE PROBE CARD | ZAKARIA, AKM | 2858 | §102§103§112 | Non-Final OA | — | Pending | Nov 01, 2024 |
| 18932714 | PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | 2858 | §102§103 | Non-Final OA | — | Pending | Oct 31, 2024 |
| 18820228 | MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS | ISLA, RICHARD | 2858 | §101§102§112 | Final Rejection | — | Pending | Aug 29, 2024 |
| 18762988 | WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL FOR CALIBRATION OF A PROBE ASSEMBLY | POTHEN, FEBA | 2858 | §102 | Non-Final OA | — | Pending | Jul 03, 2024 |
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Start Free TrialMPI Corporation has 6 pending office actions as of October 2026, spread across 2 art units and 5 examiners.
Akm Zakaria has the most, with 2 of MPI Corporation's pending office actions.
Mostly Semiconductors, Circuits & Optics (USPTO Tech Center 2800), based on where its pending office actions are examined.
