Technology area: Semiconductors, Circuits & Optics
1 pending office actions • 1 art units • 1 examiners • 0 of 1 (0%) have an AI response strategy ready
UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY manages a patent portfolio in the Semiconductors, Circuits & Optics technology area. The portfolio currently features 1 pending office action. This action is assigned to 1 distinct examiner and 1 distinct art unit, which reflects a highly focused prosecution strategy. The presence of 1 distinct art unit suggests that the university's research in this area is concentrated within a specific technical classification.
The busiest examiner for the foundation is NOH, JAE NAM, who is responsible for the 1 pending office action. Because there is 1 distinct examiner listed, NOH, JAE NAM is the sole official handling the current pending workload. The active office action represents the total active administrative volume for the Semiconductors, Circuits & Optics portfolio. Practitioners should note that the progress of the university's patent filings in this sector currently depends on the resolution of the matter under NOH, JAE NAM.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §102 only | 1 (100%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| NOH, JAE NAM | 1 | 86.3% | -9.2% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18833914 | METHOD AND APPARATUS FOR MONITORING DEFECT OF SEMICONDUCTOR STRUCTURE | NOH, JAE NAM | — |
| Art Unit | Apps |
|---|---|
| 2884 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18833914 | METHOD AND APPARATUS FOR MONITORING DEFECT OF SEMICONDUCTOR STRUCTURE | NOH, JAE NAM | 2884 | §102 | Non-Final OA | — | Pending | Jul 28, 2024 |
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