Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2881
This examiner grants 64% of resolved cases
Laura Eloise Gourlie is an examiner in Tech Center 2800, Art Unit 2881. Her record of 59 resolved cases shows an allowance rate of 64.4 percent. This suggests a relatively balanced prosecution environment where applications are frequently allowed.
The interview lift for Gourlie is 38.8 percent, which is a very strong indicator of the value of direct communication. This high lift suggests that Gourlie is particularly responsive to the interview process, and practitioners should prioritize scheduling interviews to resolve any outstanding rejections. The 38.8 percent increase in allowance probability is a significant advantage that should not be overlooked.
The median time to allowance is 1168 days. This timeline is standard for Tech Center 2800. Given the 59 resolved cases, the data suggests that a strategy focusing on early interviews is likely to be successful, as the 64.4 percent allowance rate is substantially bolstered by the 38.8 percent lift associated with direct examiner engagement.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18366355 | GUIDE PIN, SYSTEM FOR PRECISELY CONTROLLING SPECIMEN INCLUDING THE SAME, AND METHOD FOR OBSERVING SPECIMEN USING THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 17978693 | PRE-CALCULATED COLLIMATOR MODEL FOR DOSE CALCULATION SOURCE MODELING | Non-Final OA | Siemens Healthineers International AG |
| 18865208 | AIR-TIGHT AMBIENT MASS SPECTROMETRY | Non-Final OA | Ohio State Innovation Foundation |
| 18293052 | DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER FOR SIDE ENTRY ELECTRON MICROSCOPES | Final Rejection | Ohio State Innovation Foundation |
| 18591293 | MASS SPECTROMETER | Final Rejection | Kioxia Corporation |
| 18415326 | ION EXTRACTION OPTICS FOR ION PROCESSING SYSTEM | Final Rejection | Applied Materials, Inc. |
| 18107819 | System and Method for Reducing Particle Formation in a Process Chamber of an Ion Implanter | Final Rejection | Applied Materials, Inc. |
| 18413929 | MASS SPECTROMETRY IMAGE PROCESSING METHOD, IMAGE PROCESSING METHOD AND MASS SPECTROMETRY APPARATUS | Final Rejection | SHIMADZU CORPORATION |
| 18039574 | QUADRUPOLE MASS SPECTROMETER AND RESIDUAL GAS ANALYSIS METHOD | Final Rejection | HORIBA STEC, Co., Ltd. |
| 17917672 | NANOTIP ION SOURCES AND METHODS | Final Rejection | Brown University |
| 17591569 | COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE IMAGING | Final Rejection | KLA Corporation |
| 18043591 | PULSE SPECTROSCOPY DEVICE | Final Rejection | Ushio Denki Kabushiki Kaisha |
| 18909067 | CARRIER GAS ION SCAVENGER TO REDUCE PEAK TAILING AND REACTIONS | Non-Final OA | Thermo Finnigan LLC |
| 18857662 | Detection Saturation Correction and De-Coalescence by Ion Beam Modulation | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18448430 | METHOD AND SYSTEM FOR PREPARING A SPECIMEN | Final Rejection | FEI Company |
| 17747597 | MECHANISM FOR CURING ADHESIVE IN A ROBOTIC ASSEMBLY CELL | Non-Final OA | DIVERGENT TECHNOLOGIES, INC. |
| 17797684 | POLE PIECE FOR A TRANSMISSION ELECTRON MICROSCOPE | Final Rejection | THE PROVOST, FELLOWS, SCHOLARS AND OTHER MEMBERS OF BOARD OF TRINITY COLLEGE DUBLIN |
| 18413612 | METHOD FOR ANALYZING DISTURBING INFLUENCES IN A MULTI-BEAM PARTICLE MICROSCOPE, ASSOCIATED COMPUTER PROGRAM PRODUCT AND MULTI-BEAM PARTICLE MICROSCOPE | Non-Final OA | Carl Zeiss MultiSEM GmbH |
| 17983220 | PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTICLE MICROSCOPE | Non-Final OA | Carl Zeiss MultiSEM GmbH |
| 18643765 | METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-REFERENCE-MATERIALS | Non-Final OA | INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES |
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