Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2852 2862
This examiner grants 81% of resolved cases
Diana Robert Hancock is an examiner in Art Unit 2852 within Tech Center 2800. The examiner has 662 resolved cases and an allowance rate of 81.3 percent. This substantial case history provides a reliable baseline for prosecution expectations in this semiconductor or electronic technology area. The 81.3 percent rate indicates a high probability of success for applications reaching a final disposition.
The median time to reach an allowance is 789 days. This duration reflects an efficient path to grant, which is a key consideration for applicants managing their patent portfolios. The 789-day figure serves as a benchmark for the typical pendency of successful applications. Understanding this timeline helps practitioners set realistic expectations for their clients regarding the speed of the examination process in Art Unit 2852.
The data indicates an interview lift of 6.0 percent. This positive lift suggests that direct engagement with the examiner is an effective strategy for overcoming rejections and moving toward a grant. In an environment with an 81.3 percent allowance rate, a 6.0 percent increase in the probability of success following an interview is a meaningful tactical advantage. Practitioners should consider scheduling a formal discussion to resolve outstanding issues and further improve their odds of an allowance.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18768674 | PLASTIC PART AND METHOD OF PROVIDING RECYCLING INFORMATION | Non-Final OA | RICOH COMPANY, LTD. |
| 18895990 | ADAPTER DEVICE, IMAGING APPARATUS, AND ACCESSORY | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18924454 | CAMERA ACCESSORY | Non-Final OA | NIKON CORPORATION |
| 18580072 | INERTIAL MEASUREMENT DEVICE, METHOD OF OPERATING INERTIAL MEASUREMENT DEVICE, IMAGING DEVICE, DISPLAY DEVICE, AND PROGRAM | Final Rejection | Sony Group Corporation |
| 18789174 | METHOD AND SYSTEM FOR ESTIMATING ELECTRODE DENSITY IN SECONDARY BATTERIES | Non-Final OA | SAMSUNG SDI CO., LTD. |
| 18834382 | INSPECTION SYSTEM AND INSPECTION METHOD | Non-Final OA | Tsinghua University |
| 18685800 | METHOD FOR QUANTITATIVELY DETERMINING CURRENT OPERATING-STATE-DEPENDENT VARIABLES, MORE PARTICULARLY THE CURRENT CONVEYED VOLUMETRIC FLOW RATE, OR A FAN, AND FAN FOR APPLICATION OF THE METHOD | Final Rejection | ZIEHL-ABEGG SE |
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