Prosecution Insights
Prosecution Insights
Tech Center 2600 • Art Units: 2624 2661 2665 2668 2671
This examiner grants 78% of resolved cases
Bernard Krasnic is an examiner in Tech Center 2600 and Art Unit 2624, where he has 529 resolved cases. The data shows an allowance rate of 77.7 percent and an interview lift of 57.0 percent. This lift indicates that applicants who conduct an interview see a higher probability of allowance than the baseline. The 57.0 percent interview lift suggests that direct communication is a tool for navigating the process.
The median days to allowance for these 529 resolved cases is 1178. Practitioners should factor this 1178-day timeline into their prosecution strategy. The 77.7 percent allowance rate provides a baseline for success in this art unit. With the resolved cases, the data offers a look at the examiner's historical performance.
In Art Unit 2624, the median days to allowance represents the time required to reach a grant. The interview lift is a metric for applicants to consider when deciding whether to engage the examiner directly. These figures establish the current prosecution environment for this examiner in Tech Center 2600.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18820950 | TABLE-IMAGE RECOGNITION DEVICE, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM, AND TABLE-IMAGE RECOGNITION METHOD | Non-Final OA | Mitsubishi Electric Corporation |
| 18846010 | GAS MONITORING METHOD, GAS MONITORING DEVICE, GAS MONITORING SYSTEM, AND GAS MONITORING PROGRAM | Non-Final OA | MITSUBISHI HEAVY INDUSTRIES, LTD. |
| 18869902 | IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING PROGRAM | Non-Final OA | NTT, Inc. |
| 18598375 | ELECTRICAL EQUIPMENT STATE MONITORING SYSTEM, MONITORING SYSTEM, AND ELECTRICAL EQUIPMENT STATE MONITORING METHOD | Non-Final OA | Hitachi, Ltd. |
| 19009284 | METHOD FOR DETECTING FRAMES | Non-Final OA | Jabil Inc. |
| 18487653 | UNIFIED VISUAL LOCALIZATION ARCHITECTURE | Final Rejection | Honeywell International Inc. |
| 18030166 | ARTIFICIAL INTELLIGENCE (AI) ASSISTED ANALYSIS OF ELECTRON MICROSCOPE DATA | Final Rejection | Battelle Memorial Institute |
| 18502496 | IMAGE ANNOTATION USING PRIOR MODEL SOURCING | Non-Final OA | Genesee Valley Innovations, LLC |
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