Prosecution Insights
Last updated: October 02, 2026

Examiner: LO, KENNETH M

Tech Center 2100 • Art Units: 2100 2116 2121 2125 2128 2133 2136 2188 2189

This examiner grants 43% of resolved cases

Analysis

Kenneth M. Lo is an examiner in Tech Center 2100 and Art Unit 2100, with 246 resolved cases. The allowance rate is 43.1 percent, which is below the majority threshold. However, the interview lift of 35.5 percent is quite high, indicating that interviews are a very effective strategy for moving toward a grant.

The median days to allowance is 1462, which represents a lengthy prosecution timeline. This 1462-day figure is a critical metric for applicants to consider when planning their patent strategy. With 246 resolved cases, the examiner's 43.1 percent allowance rate and 35.5 percent interview lift are well-defined.

Practitioners should prioritize interviews to leverage the 35.5 percent lift. Given the 43.1 percent allowance rate, the baseline for success is challenging, making the interview a key tool. The 1462-day median to allowance suggests that applicants should be prepared for a long-term engagement with the examiner in Art Unit 2100.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

43.1%
Allow Rate
-11.9% vs TC avg
252
Total Applications
+35.5%
Interview Lift
1462
Avg Prosecution Days
Based on 246 resolved cases, 2023–2026

Rejection Statute Breakdown

6.4%
§101 Eligibility
22.3%
§102 Novelty
42.2%
§103 Obviousness
25.3%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
19020499 METHOD FOR CONTROLLING AN AIR CONDITIONER IN A MULTI-USER ENVIRONMENT, AND THE AIR CONDITIONER Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18443873 ALLOCATING STORAGE NODE PROCESS OR CORES TO STORAGE CONTROL PROGRAMS BASED ON VOLUME ATTRIBUTES Final Rejection Hitachi, Ltd.
18374815 Data Compression Using Reconfigurable Hardware based on Data Redundancy Patterns Final Rejection Advanced Micro Devices, Inc.
18934280 EARLY DETECTION AND MANAGEMENT OF THERMAL RISK FOR INFORMATION HANDLING SYSTEMS Non-Final OA Dell Products L.P.

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