Tech Center 3700 • Art Units: 2877 3783
This examiner grants 86% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18579809 | RAPID DETERMINATION OF DISEASE IN SURROGATE CELLS USING INFRARED LIGHT | Non-Final OA | The Regents of the University of California |
| 18894097 | DISTANCE MEASURING DEVICE | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 17996421 | DISTANCE MEASURING DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18664376 | Laser Interferometer And Method Of Adjusting Optical Axis Of Laser Interferometer | Non-Final OA | SEIKO EPSON CORPORATION |
| 18795410 | STRUCTURED-LIGHT-BASED TRENCH PROFILE MEASUREMENT FOR PLANTER ROW UNIT | Non-Final OA | DEERE & COMPANY |
| 18041510 | LIDAR DEVICE | Non-Final OA | Robert Bosch GmbH |
| 18684675 | DEVICE AND METHOD FOR OBSERVING A BIOLOGICAL PROBE | Non-Final OA | Siemens Healthineers AG |
| 18681914 | SUBSTRATE THICKNESS MEASURING DEVICE, SUBSTRATE PROCESSING SYSTEM, AND SUBSTRATE THICKNESS MEASURING METHOD | Non-Final OA | Tokyo Electron Limited |
| 18710022 | ASCERTAINMENT OF A WAVEFRONT GRADIENT OF A LIGHT ON THE BASIS OF ANGLE-DEPENDENT TRANSMISSION | Non-Final OA | FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
| 18203172 | INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER SOURCE OF AN INTERFEROMETER SYSTEM, METHOD OF DETERMINING A POSITION OF A MOVABLE OBJECT, AND LITHOGRAPHIC APPARATUS | Non-Final OA | ASML NETHERLANDS B.V. |
| 17609454 | SUBSTRATES FOR SURFACE-ENHANCED RAMAN SPECTROSCOPY AND METHODS FOR MANUFACTURING SAME | Final Rejection | The Research Foundation for The State University of New York |
| 18576115 | INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS | Non-Final OA | Oxford University Innovation Limited |
| 18848905 | HIGH FREQUENCY MODULATION CHOPPER | Non-Final OA | NOVA LTD. |
| 18590913 | FLATNESS PRECISION IMPROVEMENT WITH SYSTEMATIC ERROR REDUCTION VIA INDUCED WAFER TILT VARIATION | Non-Final OA | KLA Corporation |
| 18777447 | WAVELENGTH REFERENCE DEVICE | Non-Final OA | II-VI Delaware, Inc. |
| 18799510 | SURFACE METROLOGY SYSTEMS AND METHODS THEREOF | Non-Final OA | OptiPro Systems, LLC |
| 18776985 | DEVICE AND METHOD FOR DETECTING AND IDENTIFYING EXTRACELLULAR VESICLES IN A LIQUID DISPERSION SAMPLE | Final Rejection | INESC TEC - INSTITUTO DE ENGENHARIA DE SISTEMAS E COMPUTADORES, TECNOLOGIA E CIÊNCIA |
| 17925969 | DOSIMETRY SYSTEM FOR PHOTODYNAMIC ANITMICROBIAL THERAPY DEVICE OF INFECTIOUS KERATITIS | Non-Final OA | UNIVERSITY OF MIAMI |
| 18698422 | DOUBLE-MIRROR SHEAR INTERFEROMETER | Non-Final OA | HOCHSCHULE TRIER |
| 18697122 | DEVICE FOR MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL | Non-Final OA | OBSCHESTVO S OGRANICHENNOY OTVETSTVENNOST'YU "PROLOG" |
| 18696649 | METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION | Non-Final OA | LIDWAVE LTD. |
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