Tech Center 2800 • Art Units: 2858
This examiner grants 0% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18643294 | PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18865207 | METHODS AND SYSTEMS FOR MONITORING AN ELECTRICAL MACHINE | Non-Final OA | SIEMENS AKTIENGESELLSCHAFT |
| 18854131 | DISPLACEMENT DETECTING DEVICE, AND OSCILLATOR | Non-Final OA | Mitsubishi Electric Corporation |
| 18817650 | ANOMALY DETECTOR, MOTOR SYSTEM, AND METHOD FOR DETECTING ANOMALY | Non-Final OA | MINEBEA MITSUMI Inc. |
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