Prosecution Insights
Last updated: October 02, 2026

Examiner: PARK, SOO JIN

Tech Center 2600 • Art Units: 2624 2668 2675

This examiner grants 82% of resolved cases

Analysis

Examiner PARK, SOO JIN is assigned to Art Unit 2624 within Tech Center 2600. The data shows that the examiner has 736 resolved cases, with an allowance rate of 81.9 percent. This 81.9 percent allowance rate serves as a baseline for applicants during the examination process. The 736 resolved cases provide a record of the examiner's work in Art Unit 2624. These figures establish the prosecution environment for this unit.

The median days to allowance for successful applications is 968. An interview lift of 17.3 percent is recorded, which indicates the change in the probability of allowance following an interview. Practitioners can use this 17.3 percent lift to evaluate the impact of communication. The 968 median days to allowance helps in planning the prosecution timeline. The metrics are derived from the examiner's professional history in Tech Center 2600.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

81.9%
Allow Rate
+19.9% vs TC avg
746
Total Applications
+17.3%
Interview Lift
968
Avg Prosecution Days
Based on 736 resolved cases, 2023–2026

Rejection Statute Breakdown

9.5%
§101 Eligibility
23.9%
§102 Novelty
39.6%
§103 Obviousness
20.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
17546149 DEVICES, METHODS, AND COMPUTER READABLE MEDIA FOR SCREEN-CAPTURE COMMUNICATION Final Rejection HUAWEI TECHNOLOGIES CO., LTD.
18845036 DISTORTION ARTIFACT REMOVAL AND UPSCALING IN MAGNETIC RESONANCE IMAGING Final Rejection KONINKLIJKE PHILIPS N.V.
18200474 SINGLE EXTRACELLULAR VESICLE SORTING BASED ON SURFACE BIOMARKERS Non-Final OA Sony Corporation of America
18915269 TECHNIQUES FOR PARTITIONING IMAGES FOR MACHINE LEARNING MODELS Non-Final OA Oracle International Corporation
18622134 SYSTEMS AND METHODS FOR NAVIGATION AND IDENTIFICATION DURING ENDOSCOPIC SURGERY Non-Final OA Vanderbilt University
18841032 METHODS AND SYSTEMS FOR IMPROVING WAFER DEFECT CLASSIFICATION NUISANCE RATE Non-Final OA ASML Netherlands B.V.

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