Prosecution Insights
Last updated: April 19, 2026
Application No. 17/518,987

Chip Module, Use of Chip Module, Test Arrangement and Test Method

Non-Final OA §103
Filed
Nov 04, 2021
Examiner
KHALIFA, MOATAZ
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
First Sensor AG
OA Round
7 (Non-Final)
94%
Grant Probability
Favorable
7-8
OA Rounds
3y 4m
To Grant
88%
With Interview

Examiner Intelligence

Grants 94% — above average
94%
Career Allow Rate
50 granted / 53 resolved
+26.3% vs TC avg
Minimal -6% lift
Without
With
+-6.4%
Interview Lift
resolved cases with interview
Typical timeline
3y 4m
Avg Prosecution
45 currently pending
Career history
98
Total Applications
across all art units

Statute-Specific Performance

§103
70.6%
+30.6% vs TC avg
§102
17.5%
-22.5% vs TC avg
§112
9.4%
-30.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 53 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Remarks The 01/16/2026 amendments of claims 1 and 18 are noted and entered. The 01/16/2026 addition of claims 26-27 is noted and entered. The 01/16/2026 cancellation of claim 15 is noted and entered. Response to Arguments Applicant’s arguments, see Remarks pages 6-9, filed 01/16/2026, with respect to the rejection(s) of claim(s) 1-6, 8, 10, 12-13, 15-18 and 25 under 35 U.S.C. 103 have been fully considered and are persuasive. However, the examiner would like to point out that the rejection of claim 15 was omitted from the Final Rejection filed on 11/26/2025 by accident, and not as an indication of containing allowable subject matter. Thus, the rejections below detail the examiner’s position regarding the amended claims of the instant application. Additionally, upon further consideration, a new ground(s) of rejection is made in view of Tamura et al, WO 2010035864 A1 (Tamura). New Grounds for Rejection New grounds for rejection, prior art reference Tamura et al, WO 2010035864 A1 (Tamura) appear below. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-3, 5-6, 8, 17-18 and 27 are rejected under 35 U.S.C. 103 as being unpatentable over Pierson et al, US 6774315 B1 (Pierson) in view of Hu et al, US 20190295982 A1 (Hu) in further view of Daubenspeck et al, US 20100038780 A1 (Daubenspeck) in further view of Tamura et al, WO 2010035864 A1 (Tamura). Regarding claim 1; Pierson teaches a chip module, comprising: a chip (23) having a front side and a rear side (Col.3 lines 20-50 and (23) in Figure (7)); a chip carrier (3) having an upper side facing the chip (23); a contact layer (7) formed of an electrically conductive material and arranged on the upper side of the chip carrier (3) between the rear side of the chip (23) and the upper side of the chip carrier (3); the contact layer (7) has a plurality of regions electrically insulated from each other, at least two of the plurality of regions have a plated-through hole (5) extending from the upper side of the chip carrier (3) to an underside of the chip carrier (3). Pierson’s embodiment of Fig. (7) lacks an electrically conductive adhesive arranged on an upper side of the contact layer facing the chip, the electrically conductive adhesive connecting the upper side of the contact layer and the rear side of the chip, nor the electrically conductive adhesive filling the plated-through hole. However, Pierson discloses in their specifications (see col 3 lines 46-50 of Pierson’s specifications: “For some applications, the copper plated vias could then be filled with a conductive adhesive composition, if necessary, but the arrangements shown in FIGS. 5 and 7 use a different approach.”). Given this description disclosed by Pierson and combining this description with Figs (1) and (7) of Pierson, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify the first embodiment disclose din Pierson by using an electrically conductive adhesive as suggested by Pierson to lead to both the contact layer (7) and the conductive adhesive filling the plated-through via and establishing an electrical connection between the chip (23) at the top of the carrier (3) and the bottom of the carrier and that such a choice of a conductive adhesive would be suitable for certain processing conditions making the process more efficient. PNG media_image1.png 580 570 media_image1.png Greyscale PNG media_image2.png 521 538 media_image2.png Greyscale PNG media_image3.png 613 565 media_image3.png Greyscale Pierson does not teach an electrically non-conductive adhesive arranged between the chip carrier and the chip and connecting the upper side of the chip carrier to the rear side of the chip, the electrically non- conductive adhesive is arranged on the contact layer and between the electrically conductive adhesive on the regions of the contact layer. However, Hu teaches an electrically non-conductive adhesive (300) (see paragraph [0062] of the specifications of Hu: “[0062]… and the insulating medium 300 (adhesive film) is provided with an additional through hole communicating with the first openings 120c of the connection through holes 120a, 120b.”) arranged between the chip carrier (100) and the chip (200) and connecting the upper side of the chip carrier (100) to the rear side of the chip (200), the electrically non- conductive adhesive (300) is arranged on the contact layer (110a) and between the electrically conductive adhesive ((400a) and (400b)) on the regions of the contact layer (110a). Pierson and Hu are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson by introducing the non-conductive adhesive disclosed in Hu to enhance the attachment of the chip to the chip carrier to avoid any possibility of mechanical damage if the device was to experience any mechanical stress. PNG media_image4.png 643 858 media_image4.png Greyscale Pierson in view of Hu teach all the above disclosed subject matter. However, Pierson in view of Hu does not teach a passivation applied over at least a portion of the chip module, the passivation includes an underfill that is a polymer, the underfill flows between the chip and the chip carrier to fill a space between the chip and chip carrier and fix the chip to the chip carrier. Daubenspeck teaches a passivation (20) applied over at least a portion of the chip module (10), the passivation includes an underfill (20) that is a polymer, the underfill flows (see paragraph [0030] of Daubenspeck) between the chip (10) and the chip carrier (220 to fill a space between the chip (10) and chip carrier (22) and fix the chip (10) to the chip carrier (22) (see paragraph [0030] of the specifications of Daubenspeck). Pierson in view of Hu and Daubenspeck are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu by adding the passivation underfill layer flowing between the chip and the chip carrier as disclosed in Duabenspeck to improve the insulation of the chip from the carrier and to enhance the adhesion of the chip to the carrier leading to a more reliable device. PNG media_image5.png 732 711 media_image5.png Greyscale Pierson in view of Hu in view of Daubenspeck teach all the above disclosed subject matter. However, Pierson in view of Hu in further view of Daubenspeck does not teach an electrical contact element and a bonding wire electrically connecting the front side of the chip to the electrical contact element. Tamura teaches an electrical contact element (Contact Element – see annotated fig (5) part 18 shared in this OA for convenience) and a bonding wire (4) electrically connecting the front side of the chip (2) to the electrical contact element (Contact Element – see annotated fig (5) part 18 shared in this OA). Pierson in view of Hu in further view of Daubenspeck and Tamura are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck by introducing the contact element and the bonding wire disclosed in Tamura to make establishing an electrical connection between the front face of the chip and the rest of the device easier leading to a more efficient device production process. PNG media_image6.png 875 569 media_image6.png Greyscale PNG media_image7.png 275 821 media_image7.png Greyscale Regarding claim 2; Pierson in view of Hu in further view Daubenspeck in further view of Tamura teach all the limitations of claim 1. Further, Pierson teaches wherein the plurality of regions are at least three regions (see Figs (5) and (7) of Pierson). Regarding claim 3; Pierson in view of Hu in further view Daubenspeck in further view of Tamura teach all the limitations of claim 1. However, Pierson and Duabnespeck and Tamura do not teach wherein the electrically conductive adhesive does not electrically connect the regions of the contact layer. Hu teaches wherein the electrically conductive adhesive ((400a) and (400b)) does not electrically connect the regions of the contact layer (110a). Pierson and Daubenspeck and Tamura and Hu are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson and Daubenspeck and Tamura by ensuring that the conductive adhesive does not electrically connect regions of the contact layer as disclosed in Hu to lower the chances of short circuits and improve the longevity and reliability of the electronic device. Regarding claim 5; Pierson in view of Hu in further view Daubenspeck in further view of Tamura teach all the limitations of claim 1. Further, Pierson teaches wherein the chip (23) has a length and/or a width that is greater than a length and/or a width of the contact layer (7), and the chip (23) covers the contact layer (7) (see Fig (5) of Pierson). Regarding claim 6; Pierson in view of Hu in further view Daubenspeck in further view of Tamura teach all the limitations of claim 1. Further, Pierson teaches wherein the chip (23) and contact layer (7) are centered with respect to each other, a surface of the contact layer (7) is defined by a plurality of outer edges of the plurality of regions (see Fig (5) of Pierson). Regarding claim 8; Pierson in view of Hu in further view Daubenspeck in further view of Tamura teach all the limitations of claim 1. Further, Pierson teaches that the plated-through hole (5)+(6) has a soldering surface and/or a solder ball (29) on the underside of the chip carrier (3). Regarding claim 17; Pierson in view of Hu in further view Daubenspeck in further view of Tamura teach all the limitations of claim 1. However, Pierson and Daubenspeck and Tamura do not teach wherein the chip is one of a plurality of chips. Hu teaches wherein the chip is one of a plurality of chips (see paragraph [0027] of the specification of Hu: “[0027]… thereby improving the connection precision, achieving batch production of the second through holes and setting a plurality of chips in batches, and greatly improving production efficiency.”). Pierson and Daubenspeck and Tamura and Hu are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson and Daubenspeck and Tamura by using multiple chips as disclosed in Hu to improve the efficiency of the construction process and the density of the chips in the device. Regarding claim 18; Pierson teaches a chip module including a chip (23) having a front side and a rear side (Col.3 lines 20-50), a chip carrier (3) having an upper side facing the chip (Figs (5) and (7)), a contact layer formed (7) of an electrically conductive material (claim 4) and arranged on the upper side of the chip carrier (3) between the rear side of the chip (23) and the upper side of the chip carrier (3); Pierson’s embodiment appears to show the contact layer (7) has a plurality of regions electrically insulated from each other and each electrically connected to the chip by the electrically conductive adhesive. However, the feature is shown elsewhere as well, such as Pierson’s ((5) in Fig. 5) which discloses separate connection points for the electric leads of the chip. Therefore, it would have been obvious, prior to the effective filing date of the instant application, to a person of ordinary skill in the art, to modify the first embodiment of Pierson to have the contact leads electrically isolated from each other as disclosed in other embodiments in Pierson so that the leads can receive different signals ensuring the proper functionality of the device. Pierson’s embodiment of Fig. (7) lacks an electrically conductive adhesive arranged on an upper side of the contact layer facing the chip, the electrically conductive adhesive connecting the upper side of the contact layer and the rear side of the chip, nor the electrically conductive adhesive filling the plated-through hole. However, Pierson discloses in their specifications (see col 3 lines 46-50 of Pierson’s specifications: “For some applications, the copper plated vias could then be filled with a conductive adhesive composition, if necessary, but the arrangements shown in FIGS. 5 and 7 use a different approach.”). Given this description disclosed by Pierson and combining this description with Figs (1) and (7) of Pierson, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify the first embodiment disclose din Pierson by using an electrically conductive adhesive as suggested by Pierson to lead to both the contact layer (7) and the conductive adhesive filling the plated-through via and establishing an electrical connection between the chip (23) at the top of the carrier (3) and the bottom of the carrier and that such a choice of a conductive adhesive would be suitable for certain processing conditions making the process more efficient. Pierson does not teach an electrically non-conductive adhesive arranged between the chip carrier and the chip and connecting the upper side of the chip carrier to the rear side of the chip, the electrically non- conductive adhesive is arranged on the contact layer and between the electrically conductive adhesive on the regions of the contact layer. However, Hu teaches an electrically non-conductive adhesive (300) (see paragraph [0062] of the specifications of Hu: “[0062]… and the insulating medium 300 (adhesive film) is provided with an additional through hole communicating with the first openings 120c of the connection through holes 120a, 120b.”) arranged between the chip carrier (100) and the chip (200) and connecting the upper side of the chip carrier (100) to the rear side of the chip (200), the electrically non- conductive adhesive (300) is arranged on the contact layer (110a) and between the electrically conductive adhesive ((400a) and (400b)) on the regions of the contact layer (110a). Pierson and Hu are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson by introducing the non-conductive adhesive disclosed in Hu to enhance the attachment of the chip to the chip carrier to avoid any possibility of mechanical damage if the device was to experience any mechanical stress. Pierson in view of Hu teach all the above disclosed subject matter. However, Pierson in view of Hu does not teach a passivation applied over at least a portion of the chip module, the passivation includes an underfill that is a polymer between the chip and the chip carrier that fills a space and fixes between the chip and the chip carrier. Daubenspeck teaches a passivation (20) applied over at least a portion of the chip module (10), the passivation includes an underfill (20) that is a polymer, the underfill flows (see paragraph [0030] of Daubenspeck) between the chip (10) and the chip carrier (220 to fill a space between the chip (10) and chip carrier (22) and fix the chip (10) to the chip carrier (22) (see paragraph [0030] of the specifications of Daubenspeck). Pierson in view of Hu and Daubenspeck are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu by adding the passivation underfill layer flowing between the chip and the chip carrier as disclosed in Duabenspeck to improve the insulation of the chip from the carrier and to enhance the adhesion of the chip to the carrier leading to a more reliable device. Pierson in view of Hu in view of Daubenspeck teach all the above disclosed subject matter. However, Pierson in view of Hu in further view of Daubenspeck does not teach an electrical contact element and a bonding wire electrically connecting the front side of the chip to the electrical contact element. Tamura teaches an electrical contact element (Contact Element – see annotated fig (5) part 18 shared in this OA for convenience) and a bonding wire (4) electrically connecting the front side of the chip (2) to the electrical contact element (Contact Element – see annotated fig (5) part 18 shared in this OA). Pierson in view of Hu in further view of Daubenspeck and Tamura are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck by introducing the contact element and the bonding wire disclosed in Tamura to make establishing an electrical connection between the front face of the chip and the rest of the device easier leading to a more efficient device production process. Regarding claim 27; Pierson in view of Hu in further view of Duabenspeck in further view of Tamura teach all the limitations of claim 1. However, Pierson in view of Hu in further view of Duabenspeck does not teach wherein the bonding wire is connected to one of the regions of the contact layer that does not have the electrically conductive adhesive. Tamura teaches wherein the bonding wire (4) is connected to one of the regions of the contact layer (Contact Element – see annotated Fig (5) part 18 of Tamura shared in this OA) that does not have the electrically conductive adhesive. Pierson in view of Hu in further view of Duabenspeck and Tamura are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Duabenspeck by connecting the bonding wire to a region of the contact layer that does not contain conductive adhesive to expand the reach of the electrical connections in the device allowing for more parts to be connected leading to a better performing device. Claim 16 is rejected under 35 U.S.C. 103 as being unpatentable over Pierson et al, US 6774315 B1 (Pierson) in view of Hu et al, US 20190295982 A1 (Hu) in further view of Daubenspeck et al, US 20100038780 A1 (Daubenspeck) in further view of Tamura et al, WO 2010035864 A1 (Tamura) in further view of Watanabe et al, US 20210092835 A1 (Watanabe) Regarding claim 16; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura teach all the limitations of claim 1. However, Pierson in view of Hu in further view of Daubenspeck in further view of Tamura does not teach wherein the chip has a length greater than or equal to 1 mm and less than or equal to 200 mm, and/or the chip has a width greater than or equal to 1.5 mm and less than or equal to 200 mm. Watanabe teaches wherein the chip has a length greater than or equal to 1 mm and less than or equal to 200 mm, and/or the chip has a width greater than or equal to 1.5 mm and less than or equal to 200 mm (see paragraph [0064] of the specification of Watanabe: “… The dimensions of the first chip surface 21 are not particularly limited but may fall within the range from 3 mm×3 mm to 20 mm×20 mm, for example. That is to say, each side of the first chip surface 21 may have a length falling within the range from 3 mm to 20 mm, for example.”). Pierson in view of Hu in further view of Daubenspeck in further view of Tamura and Watanabe are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck in further view of Tamura by using the dimensions of the chips disclosed in Watanabe to be able to use the technique disclosed in Pierson in view of Hu in further view of Daubenspeck in further view of Tamura with a variety of chips of different sizes to broaden the versatility of the technique making manufacturing chips more efficient. Claim 10 is rejected under 35 U.S.C. 103 as being unpatentable over Pierson et al, US 6774315 B1 (Pierson) in view of Hu et al, US 20190295982 A1 (Hu) as applied to claim 1 above, in further view of Daubenspeck et al, US 20100038780 A1 (Daubenspeck) in further view of Tamura et al, WO 2010035864 A1 (Tamura) in further view of Fillion, US 20190304910 A1 (Fillion). Regarding claim 10; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura teach all the limitations of claim 1. Further, Pierson teaches with the plated-through hole (5)+(6) and the rear side of the chip (23) However, Pierson in view of Hu in further view of Daubenspeck in further view of Tamura does not teach wherein the electrically conductive adhesive is arranged between the plated-through hole and the rear side of the chip. Fillion teaches the chip module of claim 1 wherein the electrically conductive adhesive (82) is arranged between the contact surface (52) (which goes through a via through-hole (44) and the contact pad (76) of the passive chip above the via. Pierson in view of Hu in further view of Daubenspeck in further view of Tamura and Fillion are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck in further view of Tamura by including the conductive adhesive layer disclosed in Fillion to increase the ductile properties of the bonding material making the bonds less brittle and less prone to damage under mechanical stress. Claim 4 is rejected under 35 U.S.C. 103 as being unpatentable over Pierson et al, US 6774315 B1 (Pierson) in view of Hu et al, US 20190295982 A1 (Hu) in further view of Daubenspeck et al, US 20100038780 A1 (Daubenspeck) in further view of Tamura et al, WO 2010035864 A1 (Tamura) in further view of Pueschner et al, US 20140021264 A1 (Pueschner). Regarding claim 4; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura teach all the limitations of claim 1. However, Pierson in view of Hu in further view of Daubenspeck in further view of Tamura does not teach the dimensions of the chip being smaller than the contact layer. Pueschner teaches that the chip has a length and/or a width that is less than a length and/or a width of the contact layer, and the contact layer protrudes beyond the chip (215 and 205 in Fig. 2A above). Pierson in view of Hu in further view of Daubenspeck in further view of Tamura and Pueschner are considered analogous art given that they both disclose inventions in semiconductor device construction. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck in further view of Tamura by using the dimesions and configuration disclosed in Pueschner which is a known alternative that would have been expected to perform equally well for the benefit of ease of connecting the leads of the chip to their proper positions on the carrier. PNG media_image8.png 372 810 media_image8.png Greyscale Claims 12-13 and 25-26 are rejected under 35 U.S.C. 103 as being unpatentable over Pierson et al, US 6774315 B1 (Pierson) in view of Hu et al, US 20190295982 A1 (Hu) in further view of Daubenspeck et al, US 20100038780 A1 (Daubenspeck) in further view of Tamura et al, WO 2010035864 A1 (Tamura) in further view of Ghahremani, US 20190293923 A1 (Ghahremani). Regarding claim 12; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura teach all the limitations of claim 1. However, Pierson in view of Hu in further view of Daubenspeck in further view of Tamura does not teach further comprising a housing arranged on the upper side of the chip carrier, the housing enclosing the chip and the contact layer. Ghahremani teaches a housing (202) arranged on the upper side of the chip carrier (201), the housing enclosing the chip and the contact layer (abstract and 202 in Fig. 2A). Pierson in view of Hu in further view of Daubenspeck in further view of Tamura and Ghahremani are considered analogous art given that they both disclose inventions in semiconductor device construction. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck in further view of Tamura by including a housing for the chip as disclosed by Ghahremani for the benefit of providing protection for the chip. PNG media_image9.png 430 767 media_image9.png Greyscale Regarding claim 13; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura in further view of Gharemani teach all the limitations of claim 12. However, Pierson in view of Hu in further view of Daubenspeck in further view of Tamura does not teach wherein the housing has an optical window on the front side of the chip. Ghahremani teaches the housing (202) has an optical window (203) on the front side of the chip (205) (see also paragraph 81 and 203 in Figure 2A). Pierson in view of Hu in further view of Daubenspeck in further view of Tamura and Ghahremani are considered analogous art given that they both disclose inventions in semiconductor device construction. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck in further view of Tamura by adding a housing such as the one disclosed in Ghahremani that includes an optical window for the benefit of expanding the diversity of uses of the chips to include the use of light as a signal for the operation of the chip. Regarding claim 25; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura in further view of Ghahremani teach all the limitations of claim 12. However, Pierson in view of Hu in further view of Daubenspeck in further view of Tamura does not teach wherein the housing is an epoxy-based potting. Ghahremani teaches wherein the housing (1424) is an epoxy-based potting (see paragraph [0124] of the specifications of Ghahermani: “[0124]… For example, the encapsulant may be 1424 a mold compound, a liquid epoxy, a gel, a soft epoxy, or a soft encapsulant, and may be silicone-based”). Pierson in view Hu in further view of Daubenspeck in further view of Tamura and Ghahermani are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck in further view of Tamura by using the epoxy encapsulant disclosed in Ghahermani to improve the protection of the device against mechanical damage. PNG media_image10.png 649 783 media_image10.png Greyscale Regarding claim 26; Pierson in view of Hu in further view of Daubenspeck in further view of Tamura in further view of Ghahremani teach all the limitations of claim 25. However, Pierson in view of Hu in further view of Daubenspeck and Ghahremani does not teach wherein the bonding wire is embedded in the housing. Tamura teaches wherein the bonding wire (4) is embedded in the housing (3). Pierson in view of Hu in further view of Daubenspeck and Ghahremani and Tamura are considered analogous art. Thus, it would have been obvious, prior to the effective filing date of the instant application, to a person having ordinary skill in the art, to modify Pierson in view of Hu in further view of Daubenspeck and Ghahremani by embedding the bonding wire in the housing as disclosed in Tamura to increase the strength of the mechanical connection of the bonding wire to make it more resilient towards mechanical stress thus leading to a more reliable device. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to Moataz Khalifa whose telephone number is (703)756-1770. The examiner can normally be reached Monday - Friday (8:30 am - 5:00). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Joshua Benitez can be reached at 571-270-1435. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MOATAZ KHALIFA/Examiner, Art Unit 2815 /MONICA D HARRISON/Primary Examiner, Art Unit 2815
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Prosecution Timeline

Nov 04, 2021
Application Filed
Mar 06, 2024
Non-Final Rejection — §103
May 20, 2024
Response Filed
Jul 03, 2024
Final Rejection — §103
Aug 16, 2024
Response after Non-Final Action
Oct 09, 2024
Request for Continued Examination
Oct 15, 2024
Response after Non-Final Action
Nov 14, 2024
Non-Final Rejection — §103
Feb 12, 2025
Response Filed
Apr 24, 2025
Final Rejection — §103
Jun 23, 2025
Response after Non-Final Action
Aug 01, 2025
Request for Continued Examination
Aug 04, 2025
Response after Non-Final Action
Aug 05, 2025
Non-Final Rejection — §103
Oct 17, 2025
Response Filed
Nov 18, 2025
Final Rejection — §103
Jan 16, 2026
Response after Non-Final Action
Jan 23, 2026
Non-Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

7-8
Expected OA Rounds
94%
Grant Probability
88%
With Interview (-6.4%)
3y 4m
Median Time to Grant
High
PTA Risk
Based on 53 resolved cases by this examiner. Grant probability derived from career allow rate.

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