Prosecution Insights
Last updated: April 19, 2026
Application No. 17/763,253

RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING HETEROCYCLIC COMPOUND

Non-Final OA §103
Filed
Mar 24, 2022
Examiner
LEE, ALEXANDER N
Art Unit
1737
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Nissan Chemical Corporation
OA Round
3 (Non-Final)
74%
Grant Probability
Favorable
3-4
OA Rounds
3y 3m
To Grant
79%
With Interview

Examiner Intelligence

Grants 74% — above average
74%
Career Allow Rate
72 granted / 98 resolved
+8.5% vs TC avg
Moderate +6% lift
Without
With
+5.8%
Interview Lift
resolved cases with interview
Typical timeline
3y 3m
Avg Prosecution
34 currently pending
Career history
132
Total Applications
across all art units

Statute-Specific Performance

§103
55.1%
+15.1% vs TC avg
§102
24.3%
-15.7% vs TC avg
§112
14.7%
-25.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 98 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Amendment to the claims was submitted on 10/14/2025, claim 2 is canceled. Claim Status Claims 1, 3, and 5-13 are under consideration Claims 2 and 4 are canceled Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 10/14/2025 has been entered. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Claims 1, 3 and 5-13 are rejected under 35 U.S.C. 103 as being unpatentable over Shin (US20200117088 A1, filed 2018) in view of Nakafuji (US 20140048512 A1, published 2014). Regarding claims 1, 3, and 5-13, Shin teaches a resin composition and a cured (calcined) film comprising of a compound (C) [abstract, claim 1], which may be the following example with formula 14 (with a weight average molecular weight of 471) [0083], reading on the instant epoxy group-containing compound. PNG media_image1.png 161 307 media_image1.png Greyscale Shin teaches including a solvent [0113]. Shin teaches their compound (C) binds with silanol groups (containing an OH group) in their siloxane polymer [0078], reading on instant site reactive with an epoxy group, reading on instant claim 3. Shin also teaches including an epoxy compound (D) which would similarly bind with and be a part of the siloxane polymer [0085] and may contain additional structural units such as N-vinyl pyrrolidone (where the pyrrolidone (tetrahydropyrrole) structure contains a heterocyclic pyrrol (pyrrole) ring) [0092], reading on the instant heterocyclic compound. Shin is silent to their resist composition for forming an underlayer film. Nakafuji teaches thermosetting resins such as epoxy resins for use in underlayer film forming compositions and functions to prevent intermixing between the resultant resist underlayer film and a resist coating film provided thereon [0099-0100, 0106]. Nakafuji further teaches a method comprising steps of coating and baking their underlayer film forming composition on a substrate, coating and baking a resist film on the underlayer film, exposing the resist film with radiation such as visible light rays, ultraviolet rays, far ultraviolet rays, and electron beams, developing the exposed resist film to form a patterned film, etching the underlayer film using the patterned resist film, and etching (processing) the substrate using the patterned underlayer film [0114-0122]. As both teach similar coating compositions for forming a resist film, it would have been obvious to a person of ordinary skill in the art to try using the method of forming and patterning an underlayer film of Nakafuji with the composition of Shin, reading on instant claims 1, 6-8, and 12-13. Further, Nakafuji teaches a known benefit in using epoxy resin containing compositions as underlayer film forming compositions, to prevent intermixing between the resultant resist underlayer film and a resist coating film provided thereon [0099]. Shin also teaches the weight average molecular weight of their siloxane polymer may be 500 to 50,000 [0057]. The resulting compound formed by binding with compound (D) would be about 971 or greater, overlapping the instantly claimed range of 300-3000, reading on instant claims 9-11. Per MPEP 2144.05, in the case where the claimed ranges "overlap or lie inside ranges disclosed by the prior art" a prima facie case of obviousness exists. Shin teaches including a surfactant [0085], reading on instant claim 5. Response to Arguments Applicant’s arguments filed 10/14/2025 with respect the new claim amendments have been fully considered but are not persuasive. The above rejections have been updated accordingly. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to Alexander Lee whose telephone number is (571)272-2261. The examiner can normally be reached M-Th 7:30-5:30 EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Mark Huff can be reached at (571) 272-1385. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /A.N.L./Examiner, Art Unit 1737 /JONATHAN JOHNSON/Supervisory Patent Examiner, Art Unit 1734
Read full office action

Prosecution Timeline

Mar 24, 2022
Application Filed
Mar 24, 2022
Response after Non-Final Action
Sep 30, 2024
Non-Final Rejection — §103
Feb 04, 2025
Response Filed
May 08, 2025
Final Rejection — §103
Oct 14, 2025
Response after Non-Final Action
Nov 10, 2025
Request for Continued Examination
Nov 12, 2025
Response after Non-Final Action
Dec 09, 2025
Non-Final Rejection — §103
Mar 11, 2026
Examiner Interview Summary
Mar 11, 2026
Applicant Interview (Telephonic)

Precedent Cases

Applications granted by this same examiner with similar technology

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Patent 12547075
METHOD OF FORMING PHOTORESIST PATTERN
2y 5m to grant Granted Feb 10, 2026
Patent 12535738
PHOTORESIST TOP COATING MATERIAL FOR ETCHING RATE CONTROL
2y 5m to grant Granted Jan 27, 2026
Patent 12535739
METHOD OF FORMING PHOTORESIST PATTERN
2y 5m to grant Granted Jan 27, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
74%
Grant Probability
79%
With Interview (+5.8%)
3y 3m
Median Time to Grant
High
PTA Risk
Based on 98 resolved cases by this examiner. Grant probability derived from career allow rate.

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