Prosecution Insights
Last updated: May 29, 2026
Application No. 17/819,367

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT

Non-Final OA §102§OTHER
Filed
Aug 12, 2022
Examiner
HAIDER, WASIUL
Art Unit
2812
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Macronix International Co. Ltd.
OA Round
2 (Non-Final)
92%
Grant Probability
Favorable
2-3
OA Rounds
0m
Est. Remaining
98%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allowance Rate
495 granted / 538 resolved
+24.0% vs TC avg
Moderate +6% lift
Without
With
+6.3%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
11 currently pending
Career history
554
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
87.3%
+47.3% vs TC avg
§102
2.4%
-37.6% vs TC avg
§112
3.0%
-37.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 538 resolved cases

Office Action

§102 §OTHER
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. 1. Claim(s) 1-2,4,6-9,11-12,14,16-18 and 20-24 is/are rejected under 35 U.S.C. 102a(1) as being anticipated by US 20100103570 A1 (Song). PNG media_image1.png 496 700 media_image1.png Greyscale Regarding claim 1, Song shows (Fig. 6) an electrostatic discharge protection circuit (para 32), comprising: a first N type region (93+99); a first P type region (95+104); a second P type region (100) in the first N type region; second N type region (101) in the first P type region; a first conductive terminal (VDD) electrically connected to the first N type region; a second conductive terminal (VSS) electrically connected to the first P type region (through 104) and the second N type region; a power clamp circuit (17) electrically connected between the first conductive terminal and the second conductive terminal; a conductive pad (PAD) electrically connected to the second P type region; and a third N type region (103) in the first P type region, wherein the conductive pad is electrically connected to the third N type region. Regarding claim 2, Song shows (Fig. 6) wherein the second P type region (100), the first N type region (93+99), the first P type region (95+104) and the second N type region (101) form a silicon controlled rectifier (para 45). Regarding claim 4, Song shows (Fig. 6) wherein the first N type region (93) and the second P type region (100) form a diode. Regarding claim 6, Song shows (Fig. 6) wherein the first conductive terminal is a power input terminal (VDD), the second conductive terminal (VSS) is a ground terminal. Regarding claim 7, Song shows (Fig. 6) wherein the first N type region comprises: a N type well (93); and a fourth N type region (99) in the N type well, wherein the second P type region (100) is in the N type well, the first conductive terminal (VDD) is electrically connected to the fourth N type region. Regarding claim 8, Song shows (Fig. 6) wherein the first P type region comprises: a P type well (95); and a third P type region (104) in the P type well, wherein the second conductive terminal (VSS) is electrically connected to the third P type region. Regarding claim 9, Song shows (Fig. 6) further comprising a fourth P type region (102) in the first N type region, wherein the first conductive terminal (VDD) is electrically connected to the fourth P type region. Regarding claim 11, Song shows (Fig. 6) an electrostatic discharge protection circuit, comprising: a first P type region (95+104); a first N type region (93+99); a second N type region (103) in the first P type region; a second P type region (102) in the first N type region; a first conductive terminal (VDD) electrically connected to the second P type region and the first N type region; a second conductive terminal (VSS) electrically connected to the first P type region; a power clamp circuit (17) electrically connected between the first conductive terminal and the second conductive terminal; a conductive pad (PAD) electrically connected to the second N type region; and a third P type region (100) in the first N type region, wherein the conductive pad is electrically connected to the third P type region. Regarding claim 12, Song shows (Fig. 6) wherein the first P type region (95) and the second N type region (103) form a diode. Regarding claim 14, Song shows (Fig. 6) wherein the second P type region (102), the first N type region (93), the first P type region (95) and the second N type region (103) form a silicon controlled rectifier (para 45). Regarding claim 16, Song shows (Fig. 6) wherein the first P type region comprises: a P type well (95); and a fourth P type region (104) in the P type well, wherein the second N type region (101) is in the P type well, the second conductive terminal (VSS) is electrically connected to the fourth P type region. Regarding claim 17, Song shows (Fig. 6) wherein the first conductive terminal is a power input terminal (VDD), the second conductive terminal (VSS) is a ground terminal. Regarding claim 18, Song shows (Fig. 6) wherein the first N type region comprises: a N type well (93); and a third N type region (99) in the N type well, wherein the first conductive terminal (VDD) is electrically connected to the third N type region. Regarding claim 20, Song shows (Fig. 6) further comprising a fourth N type region (101), wherein the first P type region comprises: a P type well (95); and a fourth P type region (104) in the P type well, wherein the fourth N type region is in the P type well, the second conductive terminal (VSS) is electrically connected to the fourth N type region. Regarding claim 21, Song shows (Fig. 6) wherein an electrostatic discharge current flows through the conductive pad (PAD), the second P type region (102), the first N type region (93+99), the first conductive terminal (VDD) and the power clamp circuit in sequence. Regarding claim 22, Song shows (Fig. 6) wherein an electrostatic discharge current flows through the conductive pad (PAD), the second P type region (102), the first N type region (93), the first P type region (95) and the second N type region (101) the second conductive terminal (VSS) in sequence. Regarding claim 23, Song shows (Fig. 6) wherein an electrostatic discharge current flows through the first conductive terminal (VDD), the power clamp circuit (17), the second conductive terminal (VSS), the first P type region (95+104), the second N type region (103) and the conductive pad (PAD) in sequence. Regarding claim 24, Song shows (Fig. 6) wherein an electrostatic discharge current flows through the first conductive terminal (VDD), the second P type region (102), the first N type region (93,99), the first P type region (95,104), the second N type region (103) and the conductive pad (PAD) in sequence. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to WASIUL HAIDER whose telephone number is (571)272-1554. The examiner can normally be reached M-F 9 a.m. - 6 p.m.. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, William Partridge can be reached at (571) 270-1402. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /WASIUL HAIDER/Primary Examiner, Art Unit 2812
Read full office action

Prosecution Timeline

Aug 12, 2022
Application Filed
Sep 18, 2025
Non-Final Rejection mailed — §102, §OTHER
Nov 02, 2025
Response Filed
Jan 14, 2026
Non-Final Rejection mailed — §102, §OTHER (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

2-3
Expected OA Rounds
92%
Grant Probability
98%
With Interview (+6.3%)
1y 11m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 538 resolved cases by this examiner. Grant probability derived from career allowance rate.

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