Prosecution Insights
Last updated: October 23, 2026
Application No. 17/825,350

INTEGRATED CIRCUIT ASSEMBLIES HAVING INTERCONNECTION BRIDGES SPANNING RETICLE BOUNDARY / DICING STREETS OF MONOLITHIC STRUCTURES THEREIN

Non-Final OA §102
Filed
May 26, 2022
Examiner
PHAM, LONG
Art Unit
2897
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Intel Corporation
OA Round
3 (Non-Final)
92%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allowance Rate
1534 granted / 1675 resolved
+23.6% vs TC avg
Moderate +6% lift
Without
With
+5.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
46 currently pending
Career history
1706
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
43.1%
+3.1% vs TC avg
§102
39.5%
-0.5% vs TC avg
§112
10.1%
-29.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1675 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 2, 6-7, 8, 9, 10, 12, and 26-27 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Strong et al. (US pat 11133263). With respect to claim 1, Strong et al. teach an apparatus, comprising (see figs. 1-29, particularly fig. 1 and associated text): a first level structure (level includes 120, IC 1801 and IC 1802), wherein the first level structure comprises a monolithic active device comprising a monolithic substrate (supporting structure) 190 (the structure between 120 and 310), the monolithic active device comprising a first reticle zone (area of IC 1801) comprising first integrated circuitry (within IC 1801) of the monolithic active device on the monolithic substrate, and a second reticle zone (area of IC 1802) comprising second integrated circuitry (within IC 1802) of the monolithic active device on the monolithic substrate comprising a single material structure (molding 190); and a second level structure (level includes 3301, 3302, 3303), wherein the second level structure comprises an integrated circuit device 3301 and a bridge 3302 electrically attached to the first integrated circuitry of the first reticle zone of the monolithic active device and the bridge 3302 electrically attached to the first integrated circuitry of the first reticle zone of the monolithic active device and the second integrated circuitry of the second reticle zone of the monolithic active device. With respect to claim 2, Strong et al. teach the monolithic active device further comprises a boundary zone (the area between IC 1801 and IC 1802) between the first reticle zone and the second reticle zone, the bridge is positioned over the boundary zone, and the boundary zone comprises a guard ring (the molding 190 between 1801 and 1802). See fig. 1 and associated text. With respect to claim 6, Strong et al. teach a backside surface (top) of the integrated circuit device is planar with a backside surface (top) of the bridge. See fig. 1 and associated text. With respect to claim 7, Strong et al. teach a second integrated device 3303 electrically attached to the second integrated circuitry of the second reticle zone of the monolithic active device. See fig. 1 and associated text. With respect to claim 8, Strong et al. teach external interconnects 194 attached to the monolithic active device, wherein the external interconnects are electrically attached to the first integrated circuitry of the first reticle zone and the second integrated circuitry of the second reticle zone with a plurality of through-silicon vias 188 extending through the monolithic active device. See fig. 1 and associated text. With respect to claim 9, Strong et al. teach the monolithic active device comprises first routing layers (connectors right above 342 on left) over the first integrated circuitry and second routing layers (connectors right above 342 on right) over the second integrated circuitry, the first routing layers separated from the second routing layers by dielectric material (3121-4). See fig. 1 and associated text. With respect to claim 10, Strong et al. teach a plurality of external interconnects (bumps under 3301, 3302, 3303) attached to the second level structure. See fig. 1 and associated text. With respect to claim 12, Strong et al. teach a mold material (darkened material around 3501, 3502) abutting the integrated circuit device and the bridge. See fig. 1 and 5 and associated text. With respect to claim 26, Strong et al. teach a carrier substrate (120, 160, 140); and an integrated circuit package electrically attached to the carrier substrate, wherein the integrated circuit package comprises the first level structure and the second level structure. See fig. 1 and 5 and associated text. With respect to claim 27, Strong et al. teach a board electrically attached to the carrier substrate. See fig. 1 and 5 and associated text and col. 3, lines 25-35. Claim(s) 28, 29, 31-33, 35, and 37-39 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Strong et al. (US pat 11133263). With respect to claim 28, Strong et al. teach an apparatus, comprising (see figs. 1-29, particularly fig. 1 and associated text): a first level structure (level includes 120, IC 1801 and IC 1802) comprising a monolithic active device (the structure between 120 and 310), the monolithic active device comprising a monolithic substrate (supporting structure) 190, first integrated circuitry (within IC 1801) on the monolithic substrate defined by a first reticle zone (area of IC 1801) and a second integrated circuitry (within IC 1802) on the monolithic substrate defined by a second reticle zone (area of IC 1802), the monolithic substrate comprising a single material structure (molding 190); and a second level structure (level includes 3301, 3302, 3303) comprising an integrated circuit device 3301 and a bridge 3302, the integrated circuit device electrically attached to the first integrated circuitry of the monolithic active device and the bridge electrically attached to the first integrated circuitry of the monolithic active device and electrically attached to the second integrated circuitry of the second reticle zone of the monolithic active device. With respect to claim 29, Strong et al. teach the monolithic active device further comprises a boundary zone (the area between IC 1801 and IC 1802) between the first reticle zone and the second reticle zone, the bridge is positioned over the boundary zone, the boundary zone comprises a guard ring (the molding 190 between 1801 and 1802). See fig. 1 and associated text. With respect to claim 31, Strong et al. teach a backside surface (top) of the integrated circuit device is planar with a backside surface (top) of the bridge. See fig. 1 and associated text. With respect to claim 32, Strong et al. teach a second integrated device 3303 electrically attached to the second integrated circuitry of the second reticle zone of the monolithic active device. See fig. 1 and associated text. With respect to claim 33, Strong et al. teach external interconnects 194 attached to the monolithic active device, wherein the external interconnects are electrically attached to the first integrated circuitry of the first reticle zone and the second integrated circuitry of the second reticle zone with a plurality of through-silicon vias 188 extending through the monolithic active device. See fig. 1 and associated text. With respect to claim 35, Strong et al. teach a plurality of external interconnects (bumps under 3301, 3302, 3303) attached to the second level structure. See fig. 1 and associated text. With respect to claim 37, Strong et al. teach a mold material (darkened material around 3501, 3502) abutting the integrated circuit device and the bridge. See fig. 1 and 5 and associated text. With respect to claim 38, Strong et al. teach a carrier substrate (120, 160, 140); and an integrated circuit package electrically attached to the carrier substrate, wherein the integrated circuit package comprises the first level structure and the second level structure. See fig. 1 and 5 and associated text. With respect to claim 39, Strong et al. teach a board electrically attached to the carrier substrate. See fig. 1 and 5 and associated text and col. 3, lines 25-35. Claim(s) 28, 30, 33, 34, 35 and 36 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Zhai (US pub 20210125967). With respect to claim 28, Zhai teaches an apparatus, comprising (see figs. 1-7, particularly fig. 7 and associated text): a first level structure (level including 210, 220, 230, 240) comprising a monolithic active device (the structure cover 210, 220, 230, 240), the monolithic active device comprising a monolithic substrate (supporting structure) 206, first integrated circuitry 210 on the monolithic substrate defined by a first reticle zone (area of IC 210) and a second integrated circuitry 230 on the monolithic substrate defined by a second reticle zone (area of 230), the monolithic substrate comprising a single material structure 206; and a second level structure (level including 110, 120, 130) comprising an integrated circuit device (left part of 120) and a bridge (right part of 120), the integrated circuit device electrically attached to the first integrated circuitry of the monolithic active device and the bridge electrically attached to the first integrated circuitry of the monolithic active device and electrically attached to the second integrated circuitry of the second reticle zone of the monolithic active device. With respect to claim 30, Zhai teaches the bridge comprises a portion of the integrated circuit device. See fig. 7 and associated text. With respect to claim 33, Zhai teaches a plurality of external interconnects 180 attached to the monolithic active device. See fig. 7 and associated text. With respect to claim 34, Zhai teaches the monolithic active device comprises first routing layers (102,202 left) over the first integrated circuitry and second routing layers (102,202 right) over the second integrated circuitry, the first routing layers separated from the second routing layers by dielectric material 104,204. See fig. 7 and associated text. With respect to claim 35, Zhai teaches a plurality of external interconnects 180 attached to the second level structure. See fig. 7 and associated text. With respect to claim 36, Zhai teaches the external interconnects are electrically attached to the integrated circuit device with a plurality of through-silicon vias 170 extending through the integrated circuit device. See fig. 7 and associated text. Claim(s) 1, 3, 8, 9, 10, 11, 12, and 13 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Zhai (US pub 20210125967). With respect to claim 1, Zhai teaches an apparatus, comprising (see figs. 1-7, particularly fig. 7 and associated text): a first level structure (level including 210, 220, 230, 240), wherein the first level structure comprises a monolithic active device (the structure cover 210, 220, 230, 240), the monolithic active device comprising a monolithic substrate 206, a first reticle zone (area of IC 210) comprising first integrated circuitry 210 of the monolithic active device on the monolithic substrate, and a second reticle zone (area of 230) comprising second integrated circuitry 230 of the monolithic active device on the monolithic substrate, the monolithic substrate comprising a single material structure 206; and a second level structure (level including 110, 120, 130), wherein the second level structure comprises an integrated circuit device (left part of 120) and a bridge (right part of 120)electrically attached to the first integrated circuitry of the first reticle zone of the monolithic active device and the bridge electrically attached to the first integrated circuitry of the first reticle zone of the monolithic active device and the second integrated circuitry of the second reticle zone of the monolithic active device. With respect to claim 3, Zhai teaches the bridge comprises a portion of the integrated circuit device. See fig. 7 and associated text. With respect to claim 8, Zhai teaches external interconnects 180 attached to the monolithic active device, wherein the external interconnects are electrically attached to the first integrated circuitry of the first reticle zone and the second integrated circuitry of the second reticle zone with a plurality of through-silicon vias 270 extending through the monolithic active device. See fig. 7 and associated text. With respect to claim 9, Zhai teaches the external interconnects are electrically attached to the first integrated circuitry of the first reticle zone and the second integrated circuitry of the second reticle zone with a plurality of through-silicon vias 270 extending through the monolithic active device. See fig. 7 and associated text. With respect to claim 9, Zhai teaches the monolithic active device comprises first routing layers (102,202 left) over the first integrated circuitry and second routing layers (102,202 right)) over the second integrated circuitry, the first routing layers separated from the second routing layers by dielectric material 206. See fig. 7 and associated text. With respect to claim 10, Zhai teaches a plurality of external interconnects 180 attached to the second level structure. See fig. 7 and associated text. With respect to claim 11, Zhai teaches the external interconnects are electrically attached to the integrated circuit device with a plurality of through-silicon vias 170 extending through the integrated circuit device. See fig. 7 and associated text. With respect to claim 12, Zhai teaches a mold material (the material covering over, between, and below 110, 120, 130) abutting the integrated circuit device and the bridge. See fig. 7 and associated text. With respect to claim 13, Zhai teaches a through-mold via (connectors between 120 and 210 and 230 and 120) extending through the mold material and electrically attaching the external interconnects to the monolithic active device. See fig. 7 and associated text. Response to Arguments Applicant's arguments filed 7/28/26 have been fully considered but they are not persuasive. See the above rejections. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to LONG PHAM whose telephone number is (571)272-1714. The examiner can normally be reached Mon-Friday. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jacob Choi can be reached at 469-295-9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. LONG . PHAM Examiner Art Unit 2823 /LONG PHAM/Primary Examiner, Art Unit 2897
Read full office action

Prosecution Timeline

Show 1 earlier event
Feb 09, 2023
Response after Non-Final Action
Nov 17, 2025
Non-Final Rejection mailed — §102
Feb 17, 2026
Response Filed
May 28, 2026
Final Rejection mailed — §102
Jul 28, 2026
Response after Non-Final Action
Aug 24, 2026
Request for Continued Examination
Aug 27, 2026
Response after Non-Final Action
Oct 13, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12765420
SEMICONDUCTOR PACKAGE STRUCTURE AND MANUFACTURING METHOD
3y 9m to grant Granted Oct 13, 2026
Patent 12760145
POLYMER COMPOUND, AND ELECTROLUMINESCENT DEVICE MATERIAL AND ELECTROLUMINESCENT DEVICE INCLUDING POLYMER COMPOUND
3y 0m to grant Granted Oct 13, 2026
Patent 12765378
SEMICONDUCTOR APPARATUS
2y 4m to grant Granted Oct 13, 2026
Patent 12757762
WIRING BOARD, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
3y 7m to grant Granted Oct 06, 2026
Patent 12751320
CHIP-ON-WAFER-ON-BOARD STRUCTURE USING SPACER DIE AND METHODS OF FORMING THE SAME
4y 3m to grant Granted Sep 29, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

3-4
Expected OA Rounds
92%
Grant Probability
97%
With Interview (+5.5%)
2y 4m (~0m remaining)
Median Time to Grant
High
PTA Risk
Based on 1675 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month