Prosecution Insights
Last updated: April 18, 2026
Application No. 17/884,143

PACKAGE-ON-PACKAGE AND PACKAGE MODULE INCLUDING THE SAME

Final Rejection §103
Filed
Aug 09, 2022
Examiner
TRAN, TONY
Art Unit
2893
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Electronics Co., Ltd.
OA Round
4 (Final)
70%
Grant Probability
Favorable
5-6
OA Rounds
2y 11m
To Grant
99%
With Interview

Examiner Intelligence

Grants 70% — above average
70%
Career Allow Rate
597 granted / 850 resolved
+2.2% vs TC avg
Strong +34% interview lift
Without
With
+34.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 11m
Avg Prosecution
61 currently pending
Career history
911
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
59.0%
+19.0% vs TC avg
§102
35.2%
-4.8% vs TC avg
§112
3.9%
-36.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 850 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 12/05/2025 has been entered. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-4, 6 and 8-12 is/are rejected under 35 U.S.C. 103 as being unpatentable over Lin (Pub. No.: US 2021/0050300). PNG media_image1.png 659 1249 media_image1.png Greyscale Re claim 1, Lin, Fig. 39 [as shown above] teaches a package-on-package (PoP) comprising: a lower package (301); an upper package [UP] disposed over the lower package; an interposer substrate (79) disposed between the lower package and the upper package; and a plurality of balls [PofB] between the interposer substrate (79) and the upper package [UP] and connecting the interposer substrate to the upper package, wherein the lower package comprises: a first substrate (101); a first die (200) and a second die (250), the first and the second dies being disposed side by side in a horizontal direction, and disposed on the first substrate; a vertical connection member (158, ¶ [0681]) electrically connecting the first substrate (101) to the interposer substrate (79), and disposed between the first substrate and the interposer substrate; and a molding layer (42+92) covering the first die, the second die, and the vertical connection member, wherein the upper package [UP] comprises: a second substrate [SS]; a third die (251) disposed over the second substrate; and a plurality of ball pads [BP] disposed on a surface of the second substrate, the plurality of ball pads corresponding to a package ball map comprising cells forming a plurality of rows and a plurality of columns (Fig. 27B), wherein one signal is placed in each of the cells, wherein the plurality of balls [PofB] are attached on a bottom surface of the plurality of ball pads [BP], wherein the interposer substrate (79) comprises on a surface thereof a plurality of ball lands [PofBL] disposed on the surface, wherein at least a portion of the plurality of ball [PofB] lands overlap the first (200) and the second dies (250) in a vertical direction that intersects the horizontal direction, and wherein the plurality of balls [PofB] are directly attached to the plurality of ball pads [BP], and are directly attached to some of the plurality of ball lands [PofBL]. Re claim 10, Lin, Fig. 39 [as shown above] teaches a package-on-package (PoP) comprising: a lower package (101): an upper package [UP] disposed over the lower package: an interposer substrate (79) disposed between the lower package and the upper package; and a plurality of balls [PofB] between the interposer substrate (79) and the upper package [UP] and connecting the interposer substrate to the upper package, wherein the lower package comprises: a first substrate (101): a first die (200) and a second die (250), the first and the second dies being disposed side by side in a horizontal direction, and disposed on the first substrate; a vertical connection member (158) electrically connecting the first substrate to the interposer substrate, and disposed between the first substrate (101) and the interposer substrate (79); and a molding layer (42+92) covering the first die, the second die, and the vertical connection member, wherein the upper package [UP] comprises: a second substrate [SS]; a third die (251) disposed over the second substrate; and a plurality of ball pads [PofB] disposed on a surface of the second substrate, the plurality of ball pads corresponding to a package ball map comprising cells forming a plurality of rows and a plurality of columns (Fig. 27B), wherein one signal is placed in each of the cells, wherein the plurality of balls [PofB] are attached on a bottom surface of the plurality of ball pads [BP], wherein the interposer substrate (79) comprises on a surface thereof a plurality of ball lands [PofBL] disposed on the surface, and wherein the vertical connection member (158) is configured so that a data signal and/or a control signal of the third die (411) are transmitted and received through the vertical connection member, wherein the data signal and/or the control signal of the third die transmitted and received through the vertical connection member are not electrically connected to the first (200) and the second dies (250) in the interposer substrate and the lower package, and wherein at least a portion of the plurality of the ball [PofB] lands overlap the first and the second dies in a vertical direction and wherein the plurality of balls [PofB] are directly attached to the plurality of ball pads [BP], and are directly attached to some of the plurality of ball lands [PofBL]. In re claims 1 and 10, however, the plurality of balls [PofB] fails to teach wherein some of the plurality of ball lands do not overlap with the plurality of ball pads in the vertical direction. PNG media_image2.png 499 944 media_image2.png Greyscale Lin, Fig. 39 [as shown above] teaches wherein some of the plurality of ball lands do not overlap with the plurality of ball pads in the vertical direction [BnotOballpads]. It would have been obvious for a person of ordinary skill in the art before the effective filing date of the claim invention to include the above said teaching for the purpose of enhancing the flexibility of manufacturing the packaging device by utilizing the connection without ball pads as taught by Lin. Re claim 2, Lin, Fig. 39 teaches the PoP of claim 1, wherein the first die comprises a modem die, the second die comprises a dynamic random access memory (DRAM) die (250, [0593]), and the lower package is a system-in-package (SIP) (301). Re claim 3, Lin, Fig. 39 teaches the PoP of claim 1, wherein the vertical connection member (158) is configured so that a data signal and/or a control signal of the third die (251, [0716]) are transmitted and received through the vertical connection member, and the data signal and/or the control signal of the third die transmitted and received through the vertical connection member are not electrically connected to the first (200) and the second dies (250) in the interposer substrate and the lower package. Re claim 4, Lin, Fig. 39 teaches the PoP of claim 1, wherein the plurality of ball [PofB] lands comprise a power ball land to which a power ball for transmitting and receiving a power signal of the third die (251) is attached and a ground ball land to which a ground ball for transmitting and receiving a ground signal of the third die is attached, the power signal of the third die (Vcc of 251) is combined with or split from a power signal of the lower package, and the ground signal of the third die (Vss of 251) is combined with a ground signal of the lower package. Re claim 6, Lin teaches the PoP of claim 1, wherein the first die (250) is attached to the first substrate (101) through a bump ([B] of Fig. 39) in a flip-chip structure, and the second die (250 of Fig. 43) is attached to the first substrate (537) through a bonding wire (333). Re claim 8, Lin, Fig. 39 teaches the PoP of claim 1, wherein the interposer substrate comprises a printed circuit board (PCB) or a redistributed layer (RDL) (79). Re claim 9, Lin, Fig. 39 teaches the PoP of claim 1. wherein the upper package further comprises a memory controller (2014/258 of Fig. 33B) attached to the second substrate and configured to control an operation of the third die. and the third die comprises a memory die (2nd 250 of Fig. 43). Re claim 11, Lin, Fig. 39 [as shown above] teaches the PoP of claim 10, wherein the first die (250) is attached to the first substrate (101) through a bump [B] in a flip-chip structure, and the second die (2nd 250 of Fig. 43) is stacked on the first die in the vertical direction, and is electrically connected to the first substrate (537) through a bonding wire (333). Re claim 12, Lin, Fig. 39 [as shown above] teaches the PoP of claim 10, wherein the first substrate (101) comprises a plurality of signal pads (27) electrically connected to the first (250) and the second dies (200), the plurality of signal pads being disposed on the surface of the first substrate, and at least two first signal pads connected to the first die and at least two second signal pads connected to the second die, the at least two first signal and the at least two second signal pads [SSP] being among the plurality of signal pads, and configured to transmit and receive data signals between the first and the second dies, and the second die comprises: at least two die pads (directly right below 200) for connection to the at least two second signal pads; and a mode swap pad [SSP] configured to transmit and receive a mode swap signal for swapping an order of data signals transmitted and received through the at least two die pads. Response to Arguments Applicant's arguments with respect to claims 1 and 10 on the remarks filed on 12/05/2025 have been considered but are moot due to a new matching element of the upper package as shown in Fig. 39 above. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TONY TRAN whose telephone number is (571)270-1749. The examiner can normally be reached Monday-Friday, 8AM-5PM, EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Britt Hanley can be reached on 571-270-3042. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TONY TRAN/Primary Examiner, Art Unit 2893
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Prosecution Timeline

Aug 09, 2022
Application Filed
Mar 28, 2025
Non-Final Rejection — §103
May 19, 2025
Applicant Interview (Telephonic)
May 19, 2025
Examiner Interview Summary
Jun 30, 2025
Response Filed
Aug 27, 2025
Final Rejection — §103
Oct 29, 2025
Response after Non-Final Action
Nov 26, 2025
Request for Continued Examination
Dec 04, 2025
Response after Non-Final Action
Dec 15, 2025
Non-Final Rejection — §103
Feb 24, 2026
Examiner Interview Summary
Feb 24, 2026
Examiner Interview (Telephonic)
Mar 18, 2026
Response Filed
Apr 10, 2026
Final Rejection — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

5-6
Expected OA Rounds
70%
Grant Probability
99%
With Interview (+34.0%)
2y 11m
Median Time to Grant
High
PTA Risk
Based on 850 resolved cases by this examiner. Grant probability derived from career allow rate.

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