Prosecution Insights
Last updated: May 29, 2026
Application No. 17/954,194

INTEGRATED CIRCUIT STRUCTURES HAVING FIN ISOLATION REGIONS BOUND BY GATE CUTS

Final Rejection §103
Filed
Sep 27, 2022
Examiner
ENAD, CHRISTINE A
Art Unit
2811
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Intel Corporation
OA Round
2 (Final)
84%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allowance Rate
1114 granted / 1323 resolved
+16.2% vs TC avg
Moderate +10% lift
Without
With
+10.2%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 11m
Avg Prosecution
46 currently pending
Career history
1389
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
86.3%
+46.3% vs TC avg
§102
3.2%
-36.8% vs TC avg
§112
1.3%
-38.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1323 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-5 are rejected under 35 U.S.C. 103 as being unpatentable over Lin et al (US Publication No. 2021/0126113) in view of Ko et al (US Publication No. 2022/0367286). Regarding claim 1, Lin discloses an integrated circuit structure Fig 1, comprising: a vertical stack of horizontal nanowires Fig 7A-7B, 701 over a first sub-fin Fig 7A-7B, 105; a gate structure Fig 8A-8B, 107 over the vertical stack of horizontal nanowires and on the first sub-fin Fig 8A-8B; a dielectric structure Fig 13A-13B, 111 laterally spaced apart from the gate structure Fig 13A-13B, 107, wherein the dielectric structure Fig 13A-13B, 111 is not over a channel structure Fig 13A-13B, 701 but is on a second sub-fin Fig 13A-13B, 105; and a gate cut Fig 13A-13B, 109 ¶0092 between the gate structure Fig 13A-13B, 107 and the dielectric structure Fig 13A-13B, 111. Lin discloses all the limitations but silent on the arrangement of the gate cut relative to the dielectric structure. Whereas Ko discloses the gate cut Fig 13, 58/60/70/72 or Fig 23, 58/70/72 having a bottommost surface below a bottommost surface of the dielectric structure Fig 7B, 50 or Fig 23, 50A/50B. Lin and Ko are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the arrangement of the gate cut to improve device isolation. Regarding claim 2, Lin discloses a dielectric gate cut plug in the gate cut¶0092. Regarding claim 3, Lin discloses a second gate structure over a second vertical stack of horizontal nanowires and on a third sub-fin Fig 13A-13B, the second gate structure laterally spaced apart from the dielectric structure; a second gate cut between the second gate structure and the dielectric structure Fig 13A-13B; and a second dielectric gate cut plug in the second gate cut Fig 13A-13B. Regarding claim 4, Lin discloses wherein the second sub-fin has a top surface below a top surface of the first sub-fin Fig 13B. Regarding claim 5, Lin discloses an epitaxial source or drain structure at an end of the vertical stack of horizontal nanowires ¶0108. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 6-20 are rejected under 35 U.S.C. 103 as being unpatentable over Lin et al (US Publication No. 2021/0126113) in view of Guler et al (US Publication No. 20220093592) and Ko et al (US Publication No. 2022/0367286). Regarding claim 6, Lin discloses an integrated circuit structure Fig 1, comprising: a vertical stack of horizontal nanowires Fig 7A-7B, 701 over a first sub-fin Fig 7A-7B, 105; a gate structure Fig 8A-8B, 107 over the vertical stack of horizontal nanowires and on the first sub-fin Fig 8A-8B; a dielectric structure Fig 13A-13B, 111 laterally spaced apart from the gate structure Fig 13A-13B, 107, wherein the dielectric structure Fig 13A-13B, 111 is not over a channel structure Fig 13A-13B, 701 but is on a second sub-fin Fig 13A-13B, 105; and a gate cut Fig 13A-13B, 109 ¶0092 between the gate structure Fig 13A-13B, 107 and the dielectric structure Fig 13A-13B, 111. Lin discloses all the limitation but silent on the type of channel. Whereas Guler discloses an integrated circuit structure, comprising: a fin over a first sub-fin Fig 6; a gate structure over the fin Fig 8A-8C. Lin and Guler are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the type of channel region of Guler as an alternative channel known in the art. Lin and Guler discloses all the limitations but silent on the arrangement of the gate cut relative to the dielectric structure. Whereas Ko discloses the gate cut Fig 13, 58/60/70/72 or Fig 23, 58/70/72 having a bottommost surface below a bottommost surface of the dielectric structure Fig 7B, 50 or Fig 23, 50A/50B. Lin and Ko are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the arrangement of the gate cut to improve device isolation. Regarding claim 7, Lin discloses a dielectric gate cut plug in the gate cut Fig 13A-13B. Regarding claim 8, Lin in view of Guler discloses a second gate structure over a second vertical stack of horizontal nanowires and on a third sub-fin Fig 13A-13B, the second gate structure laterally spaced apart from the dielectric structure; a second gate cut between the second gate structure and the dielectric structure Fig 13A-13B; and a second dielectric gate cut plug in the second gate cut Fig 13A-13B. Regarding claim 9, Lin discloses wherein the second sub-fin has a top surface below a top surface of the first sub-fin Fig 13B. Regarding claim 10, Lin discloses an epitaxial source or drain structure at an end of the vertical stack of horizontal nanowires ¶0108. Regarding claim 11, Lin discloses an integrated circuit structure Fig 1, comprising: a vertical stack of horizontal nanowires Fig 7A-7B, 701 over a first sub-fin Fig 7A-7B, 105; a gate structure Fig 8A-8B, 107 over the vertical stack of horizontal nanowires and on the first sub-fin Fig 8A-8B; a dielectric structure Fig 13A-13B, 111 laterally spaced apart from the gate structure Fig 13A-13B, 107, wherein the dielectric structure Fig 13A-13B, 111 is not over a channel structure Fig 13A-13B, 701 but is on a second sub-fin Fig 13A-13B, 105; and a gate cut Fig 13A-13B, 109 ¶0092 between the gate structure Fig 13A-13B, 107 and the dielectric structure Fig 13A-13B, 111. Lin discloses all the limitations but silent on applying the integrated circuit structure to a computing device. Whereas Guler discloses a computing device, comprising: a board; and a component coupled to the board, the component including an integrated circuit structure Fig 9. Lin and Guler are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the teachings of Guler to provide a product that optimize performance ¶0002. Lin and Guler discloses all the limitations but silent on the arrangement of the gate cut relative to the dielectric structure. Whereas Ko discloses the gate cut Fig 13, 58/60/70/72 or Fig 23, 58/70/72 having a bottommost surface below a bottommost surface of the dielectric structure Fig 7B, 50 or Fig 23, 50A/50B. Lin and Ko are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the arrangement of the gate cut to improve device isolation. Regarding claim 12, Guler discloses a memory coupled to the board Fig 9. Regarding claim 13, Guler discloses a communication chip coupled to the board Fig 9. Regarding claim 14, Guler discloses wherein the component is a packaged integrated circuit die Fig 9. Regarding claim 15, Guler discloses wherein the component is selected from the group consisting of a processor, a communications chip, and a digital signal processor Fig 9. Regarding claim 16, Lin discloses an integrated circuit structure Fig 1, comprising: a vertical stack of horizontal nanowires Fig 7A-7B, 701 over a first sub-fin Fig 7A-7B, 105; a gate structure Fig 8A-8B, 107 over the vertical stack of horizontal nanowires and on the first sub-fin Fig 8A-8B; a dielectric structure Fig 13A-13B, 111 laterally spaced apart from the gate structure Fig 13A-13B, 107, wherein the dielectric structure Fig 13A-13B, 111 is not over a channel structure Fig 13A-13B, 701 but is on a second sub-fin Fig 13A-13B, 105; and a gate cut Fig 13A-13B, 109 ¶0092 between the gate structure Fig 13A-13B, 107 and the dielectric structure Fig 13A-13B, 111. Lin discloses all the limitation but silent on the type of channel and also Lin is silent on applying the integrated circuit structure to a computing device. Whereas Guler discloses an integrated circuit structure, comprising: a fin over a first sub-fin Fig 6; a gate structure over the fin Fig 8A-8C. Guler also discloses a computing device, comprising: a board; and a component coupled to the board, the component including an integrated circuit structure Fig 9. Lin and Guler are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the type of channel region of Guler as an alternative channel known in the art. Also, the teachings of Guler to provide a product that optimize performance ¶0002. Lin and Guler discloses all the limitations but silent on the arrangement of the gate cut relative to the dielectric structure. Whereas Ko discloses the gate cut Fig 13, 58/60/70/72 or Fig 23, 58/70/72 having a bottommost surface below a bottommost surface of the dielectric structure Fig 7B, 50 or Fig 23, 50A/50B. Lin and Ko are analogous art because they are directed to semiconductor devices having metal gates and one of ordinary skill in the art would have had a reasonable expectation of success to modify Lin because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the device of Lin and incorporate the arrangement of the gate cut to improve device isolation. Regarding claim 17, Guler discloses a memory coupled to the board Fig 9. Regarding claim 18, Guler discloses a communication chip coupled to the board Fig 9. Regarding claim 19, Guler discloses wherein the component is a packaged integrated circuit die Fig 9. Regarding claim 20, Guler discloses wherein the component is selected from the group consisting of a processor, a communications chip, and a digital signal processor Fig 9. Response to Arguments Applicant’s arguments with respect to claims 1-20 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to CHRISTINE A ENAD whose telephone number is (571)270-7891. The examiner can normally be reached Monday-Friday, 7:30 am -4:30 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lynne Gurley can be reached at 571 272 1670. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHRISTINE A ENAD/Primary Examiner, Art Unit 2811
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Prosecution Timeline

Sep 27, 2022
Application Filed
May 25, 2023
Response after Non-Final Action
Oct 23, 2025
Non-Final Rejection mailed — §103
Jan 20, 2026
Response Filed
Apr 01, 2026
Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
84%
Grant Probability
94%
With Interview (+10.2%)
1y 11m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 1323 resolved cases by this examiner. Grant probability derived from career allowance rate.

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