Prosecution Insights
Last updated: April 19, 2026
Application No. 18/037,157

PLATING DEVICE

Non-Final OA §103
Filed
May 16, 2023
Examiner
WITTENBERG, STEFANIE S
Art Unit
1795
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Mitomo Semicon Engineering Co. Ltd.
OA Round
1 (Non-Final)
54%
Grant Probability
Moderate
1-2
OA Rounds
3y 2m
To Grant
73%
With Interview

Examiner Intelligence

Grants 54% of resolved cases
54%
Career Allow Rate
361 granted / 667 resolved
-10.9% vs TC avg
Strong +19% interview lift
Without
With
+19.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 2m
Avg Prosecution
59 currently pending
Career history
726
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
51.2%
+11.2% vs TC avg
§102
17.6%
-22.4% vs TC avg
§112
29.2%
-10.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 667 resolved cases

Office Action

§103
DETAILED ACTION Status of Claims Claims 1-4 are pending. It is noted that there are 3 claim sets dated 05/16/2023. Two claim sets appear to be amended, however, one of the amended claim sets indicates that it was received 03/11/2022 by another Bureau. Therefore the claim set that is amended and has claims 1-4 pending is being examined. Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Specification The disclosure is objected to because of the following informalities: the term “silicon” found throughout the specification appears to be a typo for “silicone”. Silicon is the element having the symbol Si and is a hard solid. Silicone however is a polymeric based compound that appears to be chemical composition of the ring (10) given that it is casted and referred to as a resin. Appropriate correction is required. Claim Objections Claim 1 is objected to because of the following informalities: “silicon” may be more appropriately written as “silicone” (line 11). See explanation above. Appropriate correction is required. Claim 1 is objected to because of the following informalities: “an” diaphragm (lines 4, 6) may be more appropriately written as “a” diaphragm. Appropriate correction is required. Claim 1 objected to because of the following informalities: “for to separate” (line 4) may be more appropriately written as “to separate” Appropriate correction is required. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. Claim(s) 1-4 is/are rejected under 35 U.S.C. 103 as being unpatentable over Matsubara et al. (JP 2002-004099) in view of Woodruff et al. (US 2016/0348263). Regarding claim 1, Matsubara discloses a plating tank (1) [0030] (= a plating equipment comprising a plating tank) including: An opening part (2) of the cathode chamber (7) which a substrate (W) is placed [0031] (Figure 3) (= an opening part in which an object to be plated is placed); A supply pipe (9) for a copper sulfate solution (L1) [0034] (= a solution supply piping that supplies a plating solution toward the object to be plated); An insoluble anode (4) arranged opposite to the substrate [0030] (= an insoluble anode that is arranged so as to be opposed to the object to be plated); A membrane sheet (6) (= and a diaphragm to separate the object to be plated and the insoluble anode from each other), Ends (6b) fixed to the inner portion of the plating tank (= a diaphragm outer peripheral end being fixed to a plating tank inner wall), A through hole at the openings (6a) (= a through-hole being provided in a diaphragm center; not labeled), The ends (6a) fixed to the solution piping (9) (= a hole peripheral end of the through-hole being fixed to the solution supply piping), The membrane (6) being inclined as depicted in Figure 3 [0049] (= the diaphragm being thus arranged so as to be inclined upward in an outer circumferential direction from the solution supply piping), The copper sulfate solution (L1) flowing through supply pipe (9) towards the substrate (W), the supply pipe connected to the cathode tank (11) [0034]-[0036] (= the solution supply piping supplies the plating solution to an upper catholyte chamber in the plating tank, the upper catholyte chamber being formed by the diaphragm and the placed object to be plated), and A supply pipe (10) which is disposed radially around the supply pipe (9) and supplies solution (L2) [0034]-[0036] (= an annular flow passage including a solution ejection hole in an upper part thereof is provided in an outer circumference of the solution supply piping), Solution (L2) is supplied to the anode side from the supply pipe outlet (Figure 3, [0034]-[0036]) (= a lower anolyte chamber solution is supplied from the solution ejection hole to the lower anolyte chamber in the plating tank), The lower anolyte chamber being formed below the membrane (6) (Figure 3) (= the lower anolyte chamber being formed below the diaphragm, Arrows depict the flow of solution towards a circumferential direction or periphery direction in the anolyte chamber originating from the supply pipe which is around the through-hole (Figure 3) [0044] (= and a flow that moves from around the through-hole of the diaphragm toward the outer circumferential direction of the diaphragm is thus formed in the lower anolyte chamber solution; although the circular elements depict bubbles, Matsubara indicates that the plating liquid discharges together with the bubbles [0023]), PNG media_image1.png 580 722 media_image1.png Greyscale Figure 3 of JP 2002-004099 Matsubara differs from the instant claim in that Matsubara is silent in regards to a silicon(e) ring is firmly fixed to each of the outer peripheral end of the diaphragm and a hole edge of the through-hole of the diaphragm. In the same or similar field of electroplating devices, Woodruff discloses a processor comprising a membrane plate (114) that is sealed to the anode cup by the compression applied to o-ring seal (102) [0034], Figure 9. Alternatively, Woodruff discloses an annular membrane seal (122) [0022]. Woodruff discloses providing a rigid membrane assembly (110) having improved sealing characteristics [0021]-[0022]. Before the effective filing date of the claimed invention, it would have been obvious to one of ordinary skill in the art to produce a device comprising a silicon(e) ring because Woodruff discloses that anode and cathode chambers are separated by a membrane and the membrane can be secured and provide improved sealing with the use of an o-ring seal. O-ring seals are known to be formed of silicone rubber or other elastomeric material. Regarding the ring being fixed to a hole edge of the through-hole, use of a sealing element for abutting elements such as the diaphragm opening and the supply pipes for example would have been an obvious engineering design choice in order to seal off the anode and cathode chambers at positions that would be susceptible to leakage. Regarding claim 2, Matsubara illustrates arrows depicting the flow of solution towards a circumferential direction or periphery direction in the anolyte chamber originating from the supply pipe which is around the through-hole (Figure 3) [0023], [0044]. Although the circular elements depict bubbles, Matsubara indicates that the plating liquid discharges together with the bubbles [0023]. Regarding claims 3-4, Matsubara discloses the use of pumps (13, 14) [0036]. Woodruff discloses a computer (65, or an electronic controller [0030]) controlling a servo valve (75) to control the liquid supply [0030] and including one or more pumps [0025]. It would have been obvious to utilize the computer (= flow rate controller) of Woodruff with the pumping system of Matsubara for controlling the flow rate in the lower anolyte chamber. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. US 2007/0114127 plating apparatus with diaphragm (F) Any inquiry concerning this communication or earlier communications from the examiner should be directed to STEFANIE S WITTENBERG whose telephone number is (571)270-7594. The examiner can normally be reached Monday - Friday, 7:00 am -4:00 pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Luan Van can be reached at (571) 272-8521. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Stefanie S Wittenberg/Primary Examiner, Art Unit 1795
Read full office action

Prosecution Timeline

May 16, 2023
Application Filed
Nov 07, 2025
Non-Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
54%
Grant Probability
73%
With Interview (+19.3%)
3y 2m
Median Time to Grant
Low
PTA Risk
Based on 667 resolved cases by this examiner. Grant probability derived from career allow rate.

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