Prosecution Insights
Last updated: July 17, 2026
Application No. 18/085,106

LAYER TRANSFER DIODE OR THIN-FILM RESISTOR FOR GALLIUM NITRIDE (GAN) INTEGRATED CIRCUIT TECHNOLOGY

Non-Final OA §102§103
Filed
Dec 20, 2022
Examiner
VU, HUNG K
Art Unit
2897
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Intel Corporation
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
877 granted / 1001 resolved
+19.6% vs TC avg
Moderate +9% lift
Without
With
+9.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
34 currently pending
Career history
1034
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
72.0%
+32.0% vs TC avg
§102
18.1%
-21.9% vs TC avg
§112
3.6%
-36.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1001 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Invention of Group I, Claims 1-5 and 11-20, in the reply filed on 03/09/2026 is acknowledged. Claims 6-10 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected Invention, there being no allowable generic or linking claim. Election was made without traverse in the reply filed on 03/09/2026. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-2 and 4-5 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Morita Tatsuo (JP 2018067730A). Regarding claim 1, Morita discloses, as shown in Figures 7-15, an integrated circuit structure comprising: a GaN device on or above a substrate (101), the GaN device comprising a source (113), a gate (112) and a drain (114); and a silicon-based diode structure (118) or a silicon-based thin-film resistor (117) (page 29) above the substrate, the silicon-based diode structure or the silicon-based thin-film resistor over the GaN device in a region between the gate and the drain of the GaN device. Regarding claim 2, Morita discloses the silicon-based diode structure or the silicon-based thin-film resistor comprises a silicon crystal layer. Regarding claim 4, Morita discloses the silicon-based diode structure comprises doped regions in the silicon crystal layer Regarding claim 5, Morita discloses further comprising contacts (A,K) to the GaN device and to the silicon-based diode structure or the silicon-based thin-film resistor. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 3 is/are rejected under 35 U.S.C. 103 as being unpatentable over Morita Tatsuo (JP 2018067730A). Morita discloses the claimed invention including the integrated circuit structure as explained in the above rejection. Morita further discloses the crystal layer (of the diode) is formed on and connected to the GaN. Morita does not clearly disclose the silicon crystal layer is bonded to a dielectric, the dielectric layer above the GaN. However, Morita discloses, in Figure 12, a dielectric layer (140) is above the GaN. Therefore, it would have been obvious to one of ordinary skill in the art at the time the invention was made to form the structure of Morita having the dielectric between the GaN device and the silicon crystal layer, such as taught by Figure 12 of Morita, in order to protect the GaN device from short-circuit. Claim(s) 11-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Morita Tatsuo (JP 2018067730A) in view of Jun et al. (US 2017/0077281). Regarding claim 11, Morita discloses, as shown in Figures, a component including an integrated circuit structure comprising: a GaN device on or above a substrate (101), the GaN device comprising a source (113), a gate (112) and a drain (114); and a silicon-based diode structure (118) or a silicon-based thin-film resistor (117) (page 29) above the substrate, the silicon-based diode structure or the silicon-based thin-film resistor over the GaN device in a region between the gate and the drain of the GaN device. Morita does not disclose the component couple to a board to form a computing device. However, Jun discloses a component couple to a board to form a computing device. Note [0037] and Figure 8 of Jun. Therefore, it would have been obvious to one of ordinary skill in the art at the time the invention was made to couple the component of Morita to a board, such as taught by Jun et al. in order to integrate multiple devices into a computing device to perform the desired function. Regarding claims 12 and 17, Morita and Jun et al. disclose the device further comprising: a memory (310,312) coupled to the board [0037]. Regarding claims 13 and 18, Morita and Jun et al. disclose the device further comprising: a communication chip coupled to the board [0037]. Regarding claims 14 and 19, Morita and Jun et al. disclose the device further comprising: a camera (336) coupled to the board [0037]. Regarding claims 15 and 20, Morita and Jun et al. disclose the component is a packaged integrated circuit die (302) [0036]. Regarding claim 16, Morita discloses, as shown in Figures, a component including an integrated circuit structure comprising: a GaN device on or above a substrate (101), the GaN device comprising a source (113), a gate (112) and a drain (114); and a silicon-based diode structure (118) or a silicon-based thin-film resistor (117) (page 29) above the substrate, the silicon-based diode structure or the silicon-based thin-film resistor over the GaN device in a region between the gate and the drain of the GaN device. Morita does not disclose the component couple to a board to form a computing device. However, Jun discloses a component couple to a board to form a computing device. Note [0037] and Figure 8 of Jun. Therefore, it would have been obvious to one of ordinary skill in the art at the time the invention was made to couple the component of Morita to a board, such as taught by Jun et al. in order to integrate multiple devices into a computing device to perform the desired function. Note that the term “fabricated according to a method comprising” is method recitation in a device claimed. “[E]ven though product-by-process claims are limited by and defined by the process, determination of patentability is based on the product itself. The patentability of a product does not depend on its method of production. If the product in the product-by-process claim is the same as or obvious from a product of the prior art, the claim is unpatentable even though the prior product was made by a different process.” In re Thorpe, 777 F.2d 695, 698, 227 USPQ 964, 966 (Fed. Cir. 1985). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to HUNG K VU whose telephone number is (571)272-1666. The examiner can normally be reached Monday - Friday: 7am - 5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, JACOB CHOI can be reached at (469) 295-9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HUNG K VU/ Primary Examiner, Art Unit 2897
Read full office action

Prosecution Timeline

Dec 20, 2022
Application Filed
Jul 27, 2023
Response after Non-Final Action
Jun 03, 2026
Non-Final Rejection mailed — §102, §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12685171
SEMICONDUCTOR PACKAGE WITH EXTENDED STIFFENER
4y 0m to grant Granted Jul 14, 2026
Patent 12685203
BUMP INTEGRATION WITH REDISTRIBUTION LAYER
2y 0m to grant Granted Jul 14, 2026
Patent 12677601
QUANTUM CHIP AND FABRICATION METHOD THEREFOR
3y 2m to grant Granted Jul 07, 2026
Patent 12666771
TRANSMISSIVE DISPLAY DEVICE
2y 6m to grant Granted Jun 23, 2026
Patent 12660691
HIGH DENSITY SEMICONDUCTOR DEVICE INCLUDING INTEGRATED CONTROLLER, LOGIC CIRCUIT AND MEMORY DIES
3y 9m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
97%
With Interview (+9.3%)
2y 6m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1001 resolved cases by this examiner. Grant probability derived from career allowance rate.

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