Prosecution Insights
Last updated: July 17, 2026
Application No. 18/085,281

DRY FILM PHOTORESIST WET LAMINATION AND METHOD

Non-Final OA §102
Filed
Dec 20, 2022
Examiner
SRINIVASAN, SESHA SAIRAMAN
Art Unit
2812
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Intel Corporation
OA Round
1 (Non-Final)
67%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 67% — above average
67%
Career Allowance Rate
24 granted / 36 resolved
-1.3% vs TC avg
Strong +34% interview lift
Without
With
+34.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 8m
Avg Prosecution
42 currently pending
Career history
104
Total Applications
across all art units

Statute-Specific Performance

§103
94.7%
+54.7% vs TC avg
§102
5.4%
-34.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 36 resolved cases

Office Action

§102
DETAILED ACTION Notice of AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement No Information Disclosure Statement (IDS) has been filed. Election/Restrictions Applicant’s election without traverse of Invention 1, direct to Claims 1-12 in the reply filed 03/23/2026 is acknowledged and is under consideration. Response to Amendment The amendment with respect to the elected claims 1-12 filed on 03/23/2026 have been fully considered for examination based on their merits. The non-elected Claims 13-20 are withdrawn by the Applicant. Specification Amendment The amendment with respect to Specification filed on 03/23/2026 has been fully considered and entered. Response to Arguments Applicant elected Claims 1-12 (without traverse) in the Remarks filed on 03/23/2026 are considered for examination. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-12 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Hisashi Kato, (hereinafter KATO), US 20110284277 A1. Regarding Claim 1, KATO teaches an electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) comprising: a cored substrate (Fig. 16, 30, insulative substrate) including a conductor coating (Fig. 16, 34U, conductive circuit, [0036]) extending along at least one of a first major surface (annotated Figure 16) or a second major surface (annotated Figure 16); a through via (Figs. 8/16, 36b, through-hole conductor, [0045]) extending through the cored substrate (Fig. 16, 30, insulative substrate) from the first major surface (annotated Figure 16) to the second major surface (annotated Figure 16), the through via (Figs. 8/16, 36b, through-hole conductor, [0045]) connected (annotated Figure 16) to the conductor coating (Fig. 16, 34U, conductive circuit, [0036]); PNG media_image1.png 777 1235 media_image1.png Greyscale an external via (Fig. 16, 160-1, third via conductor, [0169]) external (annotated Figure 16) to the cored substrate (Fig. 16, 30, insulative substrate), the external via (Fig. 16, 160-1, third via conductor, [0169]) connected (annotated Figure 16) to the conductor coating (Fig. 16, 34U, conductive circuit, [0036]); PNG media_image2.png 776 1301 media_image2.png Greyscale a solder resist layer (Fig. 16, 70) on the cored substrate (Fig. 16, 30, insulative substrate), the solder resist layer (Fig. 16, 70) defines a channel that the external via (Fig. 16, 160-1, third via conductor, [0169]) is formed within and insulates (annotated Figure 16) the external via (Fig. 16, 160-1, third via conductor, [0169]); PNG media_image3.png 793 1235 media_image3.png Greyscale a top layer (Figs. 6D/16, 74, gold-plated layer, [0074]), the top layer including gold (Figs. 6D/16, 74, gold-plated layer, [0074]) to prevent oxidation (protective film, [0074]) and prepare the conductor coating (Fig. 16, 34U, conductive circuit, [0036]) to adhere to the external via (Fig. 16, 60-1, first via conductor, [0145]), the top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) extending along the conductor coating (Fig. 16, 60-1, first via conductor, [0145]) and only a portion of the solder resist layer (Fig. 16, 70); and one or more dies (Fig. 16, 90, IC chip) connected to the external via (Fig. 16, 160-1, third via conductor, [0169]). Regarding Claim 2, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 1, wherein the top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) includes an electrolytic layer (Figs. 6D/16, 74, electroless gold-plated layer, [0074]; Figs. 19C/21B, 2304/3301, electrolytic plated film is formed on electroless plated film, 2300 exposed from plating resist, 2304/3300, [0105], [0113]). Regarding Claim 3, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 1, wherein the cored substrate (Fig. 16, 30, insulative substrate) includes glass (insulative substrate, 30 is preferred to contain a core material as glass cloth, [0045]). Regarding Claim 4, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 1, wherein the conductor coating (Fig. 16, 34U, conductive circuit, [0036]) includes copper (electrolytic copper plated-film, [0067-0068]). Regarding Claim 5, KATO teaches an electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) comprising: a substrate (Fig. 16, 30, insulative substrate) including a conductor coating (Fig. 16, 34U, conductive circuit, [0036]); a via (Figs. 8/16, 36b, through-hole conductor, [0045]) connected (annotated Figure 16) to the conductor coating (Fig. 16, 34U, conductive circuit, [0036]); PNG media_image4.png 777 1235 media_image4.png Greyscale a solder resist layer (Fig. 16, 70) on the substrate (Fig. 16, 30, insulative substrate), the solder resist layer (Fig. 16, 70) defining a channel that the via (Figs. 8/16, 36b, through-hole conductor, [0045]) is formed within and insulating (annotated Figure 16) the via (Figs. 8/16, 36b, through-hole conductor, [0045]) during operation of the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]); PNG media_image5.png 793 1235 media_image5.png Greyscale a top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) interproximal (annotated Figure 16) to the substrate (Fig. 16, 30, insulative substrate) and the via (Figs. 8/16, 36b, through-hole conductor, [0045]); and one or more dies (Fig. 16, 90, IC chip) connected to the via (Figs. 8/16, 36b, through-hole conductor, [0045]). PNG media_image6.png 1022 914 media_image6.png Greyscale Regarding Claim 6, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 5, wherein the top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) includes an electrolytic layer (Figs. 6D/16, 74, electroless gold-plated layer, [0074]; Figs. 19C/21B, 2304/3301, electrolytic plated film is formed on electroless plated film, 2300 exposed from plating resist, 2304/3300, [0105], [0113]). Regarding Claim 7, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 6, wherein the top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) covers (annotated Figure 16) the conductor coating (Figs. 6D/16, 34U, conductive circuit, [0036]). PNG media_image7.png 1022 895 media_image7.png Greyscale Regarding Claim 8, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 7, wherein the top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) includes a flat layer (Figs. 6D/16, 72, nickel-plated layer, [0074]) such that the top layer (Figs. 6D/16, 74, gold-plated layer, [0074]) does not extend upward along (annotated Figure 6D) the solder resist layer (Fig. 6D, 70). PNG media_image8.png 1022 896 media_image8.png Greyscale Regarding Claim 9, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 7, wherein the top layer(Figs. 6D/16, 74, gold-plated layer, [0074]) covers only a portion (annotated Figure 6D) of the solder resist layer (Fig. 6D, 70). PNG media_image9.png 1022 896 media_image9.png Greyscale Regarding Claim 10, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 5, wherein the substrate is a cored substrate (Fig. 16, 30, insulative substrate), and wherein the cored substrate includes glass (insulative substrate, 30 is preferred to contain a core material as glass cloth, [0045]). Regarding Claim 11, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 5, wherein the conductor coating (Fig. 16, 34U, conductive circuit, [0036]) includes copper (electrolytic copper plated-film, [0067-0068]). Regarding Claim 12, KATO teaches the electronic device (Fig. 16, 10, IC chip mounted on the multilayer printed wiring board, [0024]) of claim 5, wherein the via (Figs. 8/16, 36b, through-hole conductor, [0045]) connected includes copper (electrolytic copper-plated film covers through-hole conductor (36b), [0049], [0067-0068]). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. US 20220248531 A1 – Figures 5A STATEMENT OF RELEVANCE – Surface of the conductor pattern is covered by the coating film (5) and the conductor pattern with surface roughness higher than the surface roughness of the surfaces of the wiring patterns (1b). US 20220165695 A1 – Figure 1B STATEMENT OF RELEVANCE – A cross-sectional illustration of the electronic package (100) after attachment of the die (105) to the package substrate (101) and the location of vias (131) within the package substrate (131). Any inquiry concerning this communication or earlier communications from the examiner should be directed to SESHA SAIRAMAN SRINIVASAN whose telephone number is (703)756-1389. The examiner can normally be reached Monday-Friday 7:30 AM -5:30 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Christine S. Kim can be reached at 571-272-8458. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SESHA SAIRAMAN SRINIVASAN/ Examiner, Art Unit 2812 /CHRISTINE S. KIM/ Supervisory Patent Examiner, Art Unit 2812
Read full office action

Prosecution Timeline

Dec 20, 2022
Application Filed
Jun 22, 2023
Response after Non-Final Action
Apr 06, 2026
Non-Final Rejection mailed — §102
Jul 06, 2026
Response Filed

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
67%
Grant Probability
99%
With Interview (+34.3%)
3y 8m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 36 resolved cases by this examiner. Grant probability derived from career allowance rate.

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