Prosecution Insights
Last updated: April 19, 2026
Application No. 18/096,811

ELECTROSTATIC DEVICE

Non-Final OA §103
Filed
Jan 13, 2023
Examiner
DOAN, THERESA T
Art Unit
2814
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Globalfoundries Singapore Pte. Ltd.
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
2y 1m
To Grant
93%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allow Rate
791 granted / 896 resolved
+20.3% vs TC avg
Moderate +5% lift
Without
With
+5.1%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
24 currently pending
Career history
920
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
42.2%
+2.2% vs TC avg
§102
38.4%
-1.6% vs TC avg
§112
3.3%
-36.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 896 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Applicant’s election without traverse of claims 1-12 and 20 in the reply filed on 12/02/25 is acknowledged. By this election, claims 13-19 are withdrawn; and claims 1-12 and 20 will be exam in the application. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-5, 7 and 20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Bae et al. (2006/0121667) in view of Ammo et al. (6,159,784). Regarding claims 1, 4 and 20, Bae (Fig. 13) discloses a structure/method comprises: a device comprising a collector 7a ([0029]), an emitter 12a ([0037]), and a base 9 ([0027]); an isolation structure 2 extending between the base 9 and the collector 7a ([0020]); a polysilicon film 15 over the isolation structure 2 ([0037]); and a silicide blocking layer 16a partially covering the polysilicon film 15, the isolation structure 2 and the collector 7a (Fig. 13, [0042]). Bae discloses the polysilicon film but does not teach the polysilicon film has a high resistivity. However, Ammo (Fig. 5) discloses the polysilicon film 34 has a high resistivity in order to provide devices designed for an intended purpose (see column 6, lines 55-57). Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention, to modify the device of Bae by forming the polysilicon film has a high resistivity, as taught by Ammo in order to provide devices designed for an intended purpose (see column 6, lines 55-57). Regarding claim 2, Bae (Fig. 13) discloses wherein the collector and emitter comprise P+ diffusion regions ([0023] and [0033]), but does not disclose the base comprises an N-well. However, it would have been obvious to one having ordinary skill in the art before the effective filing date of the claimed invention was made to modify the structure of Bae by forming the base comprises an N-well because such that forming would not affect the function of the semiconductor device. Regarding claim 3, as discussed, the combination above, Bae (Fig. 15) discloses wherein the high resistivity film 15 and the collector 7a,b are connected by a plate (19a,b,c) ([0045]). Regarding claim 5, as discussed, the combination above, Ammo (Fig. 8) discloses wherein the base 36 and the emitter 39 are connected with a base resistor 19. Regarding claim 7, as discussed, the combination above, Ammo (Fig. 1) discloses wherein the isolation structure 10 comprises a local oxidation of silicon (column 9, line 21). Claim(s) 6 is/are rejected under 35 U.S.C. 103 as being unpatentable over Bae et al. (2006/0121667) in view of Ammo et al. (6,159,784) and further in view of Zeng et al. (2021/0082905). Regarding claim 6, Bae (Fig. 13) discloses the base but does not disclose the base is floating. However, Zeng (Fig. 11) discloses the base 214 is floating in order to provide devices designed for an intended purpose (see [0045]). Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention, to modify the device of Bae by forming the base is floating, as taught by Zeng in order to provide devices designed for an intended purpose (see[0045]). Allowable Subject Matter Claims 8-12 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The prior art of record fails to disclose all the limitations recited in the above claims. Specifically, the prior art of record fails to disclose further comprising a P-drift region which surrounds the collector and a first deep trench isolation structure touching the P-drift region (claim 8); or further comprising an N-type drift region and a P+ buried layer under the N-type drift region, the N-type drift region and the P+ buried layer having a gap between sides filled with a semiconductor material, and the emitter spans the gap (claim 12). The dependent claims being further limiting and definite are also allowable. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to THERESA T DOAN whose telephone number is (571)272-1704. The examiner can normally be reached on Monday, Tuesday, Wednesday and Thursday from 7:00AM - 3:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, WAEL FAHMY can be reached on (571) 272-1705. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see https://ppair-my.uspto.gov/pair/PrivatePair. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /THERESA T DOAN/ Primary Examiner, Art Unit 2814
Read full office action

Prosecution Timeline

Jan 13, 2023
Application Filed
Jan 06, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
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MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE
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2y 5m to grant Granted Mar 24, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
93%
With Interview (+5.1%)
2y 1m
Median Time to Grant
Low
PTA Risk
Based on 896 resolved cases by this examiner. Grant probability derived from career allow rate.

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