Prosecution Insights
Last updated: July 17, 2026
Application No. 18/112,107

SEMICONDUCTOR PACKAGE

Non-Final OA §103
Filed
Feb 21, 2023
Priority
Jul 19, 2022 — RE 10-2022-0089105
Examiner
SYLVIA, CHRISTINA A
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Electronics Co., Ltd.
OA Round
3 (Non-Final)
88%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
668 granted / 762 resolved
+19.7% vs TC avg
Moderate +9% lift
Without
With
+9.4%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
19 currently pending
Career history
789
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
76.4%
+36.4% vs TC avg
§102
10.2%
-29.8% vs TC avg
§112
12.8%
-27.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 762 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Foreign Priority Receipt is acknowledged of certified copies of papers submitted under 35 U.S.C. 119(a)-(d), which papers have been placed of record in the file, as electronically retrieved 04/19/2023. Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 04/24/2026 has been entered. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Claim(s) 1-3, 12-14 and 16 are rejected under 35 U.S.C. 103 as being unpatentable over Geissler et al. (PG Pub 2018/0331080; hereinafter Geissler) and Kuo et al. (PG Pub 2017/0084589; hereinafter Kuo). PNG media_image1.png 300 632 media_image1.png Greyscale Regarding claim 1, refer to the modified Fig. 2b provided above, Geissler teaches a semiconductor package 200, comprising: a main semiconductor chip 120 having a first thickness (annotated “t1”); a first semiconductor device 110 disposed on a first side (left side) of the main semiconductor chip and having a second thickness (annotated “t2”) less than the first thickness (see Fig. 2b); a second semiconductor device 110 disposed on a second side (right side) of the main semiconductor chip and having a third thickness (annotated “t3”) less than the first thickness (see Fig. 2b); a first molding layer 730 that covers the main semiconductor chip, the first semiconductor device, and the second semiconductor device so as to expose a top surface of the first semiconductor device and the second semiconductor device, and to expose a top surface and a portion of a lateral surface of the main semiconductor chip (see Fig. 2b); a first redistribution substrate (annotated “RDL-1”) below the first molding layer (see Fig. 2b); a second redistribution substrate (annotated “RDL-2”) on the first molding layer (see Fig. 2b); and a mold via 220 that penetrates the first molding layer and connects the first redistribution substrate to the second redistribution substrate (see Fig. 2b), and the second semiconductor device is disposed between the first redistribution substrate and the second redistribution substrate in a vertical direction (see Fig. 2b), and wherein a top surface of the first molding layer is coplanar with a top surface of the second semiconductor chip (see Fig. 2b). Geissler does not teach “the second semiconductor device includes a first semiconductor chip and a second semiconductor chip, and the second semiconductor device is disposed between the first redistribution substrate and the second redistribution substrate in a vertical direction; and wherein a top surface of the first molding layer is coplanar with a top surface of the second semiconductor chip.” PNG media_image2.png 394 668 media_image2.png Greyscale In the same field of endeavor, refer to Fig. 1d-provided above, Kuo teaches a second semiconductor device (see claim limitations below) comprising: a first semiconductor chip 200; a second semiconductor chip 400; and the second semiconductor device is disposed between a first redistribution substrate (“RDL-1”) and the second redistribution substrate (“RDL-2”) in a vertical direction (see Fig. 1d); and wherein a top surface of a first molding layer 500 is coplanar with a top surface of the second semiconductor chip (see Fig. 1d). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the second semiconductor device comprise two semiconductor chips, as taught by Kuo, to create a more robust package. Regarding claim 2, refer to the figures cited above, in the combination of Geissler and Kuo, Kuo teaches the first semiconductor chip 200 includes a first chip pad 210, and the first semiconductor chip is oriented such that the first chip pad faces the first redistribution substrate (“RDL-1”) and is connected to the first redistribution substrate via the first chip pad (see Fig. 1d), and wherein the second semiconductor chip 400 includes a second chip pad 410, and the second semiconductor chip is stacked on the first semiconductor chip and is oriented such that the second chip pad faces the second redistribution substrate (“RDL-2”) and is connected to the second redistribution substrate (RDL-2”) via the second chip pad (see Fig. 1d). Regarding claim 3, refer to the figures cited above, in the combination of Geissler and Kuo, Kuo teaches an adhesion layer 300 is disposed between the stacked first semiconductor chip 200 and the second semiconductor chip 400 in the vertical direction (see Fig. 1d), and Geissler teaches the second semiconductor chip the second thickness is equal to the third thickness (see Fig. 2b). Regarding claim 12, refer to the modified Fig. 2b provided above, Geissler teaches a semiconductor package 200, comprising: a first redistribution substrate (annotated “RDL-1”); a main semiconductor chip 120 on the first redistribution substrate (see Fig. 2b); a second redistribution substrate (annotated “RDL-2”) on the first redistribution substrate, a top surface of the second redistribution substrate being at a level lower than a level of the main semiconductor chip (see Fig. 2b); a first molding layer 730 between the first redistribution substrate and the second redistribution substrate (see Fig. 2b); a second molding layer 980 that covers the second redistribution substrate and exposes a top surface of the main semiconductor chip (see Fig. 2b); and a semiconductor device 110 (second) and the semiconductor device is disposed between the first redistribution substrate and the second redistribution substrate in a vertical direction (see Fig. 2b). Although, Geissler teaches the semiconductor device is disposed between the first redistribution substrate and the second redistribution substrate in a vertical direction, Geissler does not teach “the semiconductor device includes a first semiconductor chip and a second semiconductor chip, wherein a top surface of the first molding layer is coplanar with a top surface of the second semiconductor chip.” In the same field of endeavor, refer to Fig. 1d-provided above, Kuo teaches a semiconductor device comprising: a first semiconductor chip 200; a second semiconductor chip 400; wherein the semiconductor device is disposed between a first redistribution substrate (RDL-1”) and a second redistribution substrate (“RDL-2”) in a vertical direction (see Fig. 1d); wherein a top surface of a first molding layer 500 is coplanar with a top surface of the second semiconductor chip (see Fig. 1d). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the second chip comprise a stack of chips, as taught by Kuo, to create a more robust package. Regarding claim 13, refer to the figures cited above, in the combination of Geissler and Kim, Geissler teaches the semiconductor device 110 (second) is horizontally spaced apart from the main semiconductor chip 120 (see Fig. 2b), and wherein the semiconductor device comprises a first semiconductor chip 110 (second) includes first chip pads (“pads”), and the first semiconductor chip is oriented such that the first chip pads face the first redistribution substrate (“RDL-1”) and is connected to the first redistribution substrate via the first chip pads (see Fig. 2b). Geissler does not teach the semiconductor device 110 (second) comprises a “second semiconductor chip includes a second chip pad, and the second semiconductor chip is stacked on the first semiconductor chip and is oriented such that the second chip pad faces the second redistribution substrate and is connected to the second redistribution substrate via the second chip pad.” In the same field of endeavor, refer to Fig. 1d-provided above, Kuo teaches a semiconductor device (see claim limitations below) comprising: a first semiconductor chip 200; a second semiconductor chip 400; wherein the second semiconductor chip includes a second chip pad 410, and the second semiconductor chip is stacked on a first semiconductor chip 200 and is oriented such that the second chip pad faces a second redistribution substrate (annotated RDL-2”) and is connected to the second redistribution substrate via the second chip pad (see Fig. 1d). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the second chip comprise a stack of chips, as taught by Kuo, to create a more robust package. Regarding claim 14, refer to the figures cited above, Geissler and Kuo teach the first semiconductor chip (200-Kuo) and the second semiconductor chip (400-Kuo) are different types from each other (para [0025] and [0034]), wherein an adhesion layer 300 is disposed between the stacked first semiconductor chip and the second semiconductor chip (para [0033]), and wherein a top surface of a first molding layer 500-Kuo = 730=Geissler) is coplanar with a top surface of the second semiconductor chip (see figures cited above). Regarding claim 16, refer to the figures cited above, Geissler and Kuo teach the first chip pads (“pads” of Geissler) are adjacent to a bottom surface of the first semiconductor chip 110 (second), Geissler does not teach “the second semiconductor chip includes a second chip pads, the second chip pads are adjacent to a top surface of the second semiconductor chip, the first redistribution substrate includes first redistribution patterns that contact the first chip pads, and the second redistribution substrate includes second redistribution patterns that contact the second chip pads. In the same field of endeavor, refer to Fig. 1d-provided above, Kuo teaches a semiconductor device comprising: a first semiconductor chip 200; a second semiconductor chip 400; wherein the second semiconductor chip includes a second chip pads 410, and the second chip pads are adjacent to a top surface of the second semiconductor chip (see Fig. 1d), a first redistribution substrate (“RDL-1”) includes first redistribution patterns 820 that contact the first chip pads (see Fig. 1d), and a second redistribution substrate (“RDL-2”) includes second redistribution patterns 620 that contact the second chip pads (see Fig. 1d). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the second chip comprise a stack of chips, as taught by Kuo, to create a more robust package. Claim(s) 4 and 15 are rejected under 35 U.S.C. 103 as being unpatentable over Geissler and Kuo, as applied to claim 3 and claim 14 above-respectively, and further in view of Kim et al. (PG Pub 2020/0273801; hereinafter Kim-2). Regarding claim 4, refer to the figures cited above, Geissler and Kuo teach the first semiconductor chip (110-Geissler). The recited "is one of a near field communication (NFC) controller and a touch screen controller chip." (i.e., function) does not structurally distinguish an apparatus claim from the prior art apparatus see In re Danly, 263 F.2d 844, 838 (CCPA 1959) (apparatus claims must distinguish in terms of structure rather than function). The only structural limitation that appears to be required for the prior art apparatus to be capable of performing the aforementioned function is having the second semiconductor chip, which Geissler clearly shows or in other words, the prior art appears to inherently possess the capability of performing the recited functions. "[T]he discovery of a previously unappreciated property of a prior art composition, or of a scientific explanation for the prior art's functioning, does not render the old composition patentably new to the discoverer." Atlas Powder Co. V. IRECO Inc., 190 F.3d 1342, 1347, 51 USPQ2d 1943, 1947 (Fed. Cir. 1999). The claiming of a new use, new function or unknown property which is inherently present in the prior art does not necessarily make the claim patentable. In re Best, 562 F.2d 1252, 1254, 195 USPQ 430, 433 (CCPA 1977). See In re Swinehart, 439 F.2d 210 (CCPA 1971) to emphasize that "where the Patent [and Trademark] Office has reason to believe that a functional limitation asserted to be critical for establishing novelty in the claimed subject matter may, in fact be an inherent characteristic of the prior art, it possesses the authority to require the applicant to prove that the subject matter shown to be in the prior art does not possess the characteristic relied on."). In addition, Geissler does not teach the functionality of the first semiconductor chip as being a capacitor including silicon (Si). In the same field of endeavor, refer to Fig. 10, Kim-2 teaches a semiconductor package (para [0019- 0091]) comprising: a first semiconductor chip 3830 (para [0091]) is a capacitor (para [0091]) including silicon (para [0091]). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the material composition of the capacitor comprise silicon, as taught by Kim-2, for the purpose of choosing a suitable and well-known capacitor material composition. Regarding claim 15, refer to the figures cited above, Geissler and Kuo teach the first semiconductor chip and the second semiconductor chip. Geissler does not teach the functionality of the first semiconductor chip as being a capacitor including silicon (Si). The recited "second semiconductor chip is one of a near field communication (NFC) controller and a touch screen controller chip" (i.e., function) does not structurally distinguish an apparatus claim from the prior art apparatus see In re Danly, 263 F.2d 844, 838 (CCPA 1959) (apparatus claims must distinguish in terms of structure rather than function). The only structural limitation that appears to be required for the prior art apparatus to be capable of performing the aforementioned function is having the second semiconductor chip, which Geissler clearly shows or in other words, the prior art appears to inherently possess the capability of performing the recited functions. "[T]he discovery of a previously unappreciated property of a prior art composition, or of a scientific explanation for the prior art's functioning, does not render the old composition patentably new to the discoverer." Atlas Powder Co. V. IRECO Inc., 190 F.3d 1342, 1347, 51 USPQ2d 1943, 1947 (Fed. Cir. 1999). The claiming of a new use, new function or unknown property which is inherently present in the prior art does not necessarily make the claim patentable. In re Best, 562 F.2d 1252, 1254, 195 USPQ 430, 433 (CCPA 1977). See In re Swinehart, 439 F.2d 210 (CCPA 1971) to emphasize that "where the Patent [and Trademark] Office has reason to believe that a functional limitation asserted to be critical for establishing novelty in the claimed subject matter may, in fact be an inherent characteristic of the prior art, it possesses the authority to require the applicant to prove that the subject matter shown to be in the prior art does not possess the characteristic relied on."). Geissler does not teach the functionality of the first semiconductor chip as being a capacitor including silicon (Si). In the same field of endeavor, refer to Fig. 10, Kim-2 teaches a semiconductor package (para [0019- 0091]) comprising: a first semiconductor chip 3830 (para [0091]) is a capacitor (para [0091]) including silicon (para [0091]). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the material composition of the capacitor comprise silicon, as taught by Kim-2, for the purpose of choosing a suitable and well-known capacitor material composition. Claim(s) 5-11 are rejected under 35 U.S.C. 103 as being unpatentable over Geissler and Kuo, as applied to claim 3 above, and further in view of Kuoang et al. (PG Pub 2020/0321288; hereinafter Kuoang). Regarding claim 5, refer to the figures cited above, Geissler and Kuo teach the first redistribution substrate ("RDL-1") comprises embedding electrical conductive redistribution connections in a dielectric (para [0077]). Geissler does not explicitly teach the details of the redistribution substrate such that "a first redistribution dielectric layer and first redistribution patterns in the first redistribution dielectric layer, wherein each of the first redistribution patterns includes a first line part and a first via part on the first line part." PNG media_image3.png 234 410 media_image3.png Greyscale In the same field of endeavor, refer to Fig. 10a, Kuoang teaches a redistribution layer structure (para [0017-0055]) comprising: a first redistribution dielectric layer (110, 120, 130 and 140; para [0039]) and first redistribution patterns (113/115) in the first redistribution dielectric layer, wherein each of the first redistribution patterns includes a first line part 113 and a first via part 115 on the first line part (see Fig. 10a). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the RDL of Geissler comprise the structural elements, as taught by Kuoang, to re-route or redistribute signals to/from the device (para [0039]). Regarding claim 6, refer to the figures cited above, Geissler and Kuo teach the second redistribution substrate ('RDL-2") comprises embedding electrical conductive redistribution connections in a dielectric (para [0077]). Geissler does not explicitly teach the details of the second redistribution substrate "includes a second redistribution dielectric layer and a second redistribution pattern in the second redistribution dielectric layer, wherein the second redistribution pattern includes a second line part and a second via part below the second line part." In the same field of endeavor, refer to Fig.10a, Kuoang teaches a redistribution layer structure (para [0017-0055]) comprising: a second redistribution dielectric layer (110, 120, 130 and 140; para [0039]) and first redistribution patterns (113/115) in the first redistribution dielectric layer, wherein each of the first redistribution patterns includes a first line part 113 and a first via part 115 on the first line part (see Fig. 10a). In light of such teachings, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have the RDL of Geissler comprise the structural elements, as taught by Kuoang, to re-route or redistribute signals to/from the device (para [0039]). Regarding claim 7, refer to the figures cited above, Geissler, Kuo and Kuoang teach a third semiconductor device 130 on the second redistribution pattern (“RDL-2"), wherein the second redistribution pattern comprises via structures (annotated "via-1” and “via-2" in Fig. 2b), wherein the via structures include: a first via structure (annotated "via-1") that connects the third semiconductor device and the second semiconductor chip 110 (second) to each other (see Fig. 2b); and a second via structure (“via-2”) that connects the second semiconductor chip and the mold via 220 to each other (see Fig. 2b). Regarding claim 8, refer to the figures cited above, Geissler, Kuo and Kuoang teach the second semiconductor chip 110 (second) is connected through the second via structure ("via-2") to the first redistribution substrate ('RDL-1") and is one of a near field communication (NFC) controller and a touch screen controller chip. The recited "is one of a near field communication (NFC) controller and a touch screen controller chip." (i.e., function) does not structurally distinguish an apparatus claim from the prior art apparatus see In re Danly, 263 F.2d 844, 838 (CCPA 1959) (apparatus claims must distinguish in terms of structure rather than function). The only structural limitation that appears to be required for the prior art apparatus to be capable of performing the aforementioned function is having the second semiconductor chip, which Geissler clearly shows or in other words, the prior art appears to inherently possess the capability of performing the recited functions. "[T]he discovery of a previously unappreciated property of a prior art composition, or of a scientific explanation for the prior art's functioning, does not render the old composition patentably new to the discoverer." Atlas Powder Co. V. IRECO Inc., 190 F.3d 1342, 1347, 51 USPQ2d 1943, 1947 (Fed. Cir. 1999). TKuos, the claiming of a new use, new function or unknown property which is inherently present in the prior art does not necessarily make the claim patentable. In re Best, 562 F.2d 1252, 1254, 195 USPQ 430, 433 (CCPA 1977). See In re Swinehart, 439 F.2d 210 (CCPA 1971) to emphasize that "where the Patent [and Trademark] Office has reason to believe that a functional limitation asserted to be critical for establishing novelty in the claimed subject matter may, in fact be an inherent characteristic of the prior art, it possesses the authority to require the applicant to prove that the subject matter shown to be in the prior art does not possess the characteristic relied on."). Regarding claim 9, refer to the figures cited above, Geissler, Kuo and Kuoang teach a second molding layer 980 that covers the third semiconductor device 130 and exposes the top surface of the main semiconductor chip 120. Geissler does not teach a top surface of the third semiconductor chip is at a level lower than a level of the top surface of the main semiconductor chip. However, it would have been obvious, to one of ordinary skill in the art, to choose from a finite number of identified, predictable solutions, such as to have the top surface of the third semiconductor chip be at a lever lower then, equal to or greater than a level of the top surface of the main semiconductor chip to achieve the same desired outcome (see MPEP 2143 (1)(E) and KSR, 550 U.S. at 421, 82 USPQ2d at 1397). Regarding claim 10, refer to the figures cited above, Geissler, Kuo and Kuoang do not teach a top surface of the second molding layer 980-top is coplanar with the top surface of the main semiconductor chip ("main-1") (see Fig. 10g). However, it would have been obvious, to one of ordinary skill in the art, to choose from a finite number of identified, predictable solutions, such as to have the top surface of the second molding layer either be coplanar with, higher than or less than the top surface of the main semiconductor chip, with a reasonable expectation of achieving the same desired outcome (see MPEP 2143 (I)(E) and KSR, 550 U.S. at 421, 82 USPQ2d at 1397). Regarding claim 11, refer to the figures cited above, Geissler, Kuo and Kuoang teach a fourth semiconductor device 130 (fourth) on the second redistribution pattern (“RDL-2”) and spaced apart from the third semiconductor device 130 (third) and on the second side (e.g. left side) of the main semiconductor chip 120 (see Fig. 2b). Allowable Subject Matter 4. Claims 17-20 are allowable. The following is a statement of reasons for the indication of allowable subject matter: Claim 17 contains allowable subject matter, because the prior art of record, either singularly or in combination, fails to disclose or suggest, in combination with the other elements in claim 17, a main semiconductor chip; a first redistribution substrate below the main semiconductor chip; external connection terminals bonded to a bottom surface of the first redistribution substrate; first redistribution patterns in the first redistribution substrate; a second redistribution substrate that extends parallel to the first redistribution substrate and extends in an outward direction from a lateral surface of the main semiconductor chip; second redistribution patterns in the second redistribution substrate; at least one semiconductor device between the first redistribution substrate and the second redistribution substrate; a first molding layer between the first redistribution substrate and the second redistribution substrate, the first molding layer covering a portion of the lateral surface of the main semiconductor chip; and a second molding layer that covers the second redistribution substrate and another portion of the lateral surface of the main semiconductor chip, the second molding layer exposing a top surface of the main semiconductor chip, wherein each of the first redistribution patterns includes a first line part and a first via part on the first line part, wherein each of the second redistribution patterns includes a second line part and a second via part on the second line part, wherein one of the first and second redistribution patterns transmits a power, wherein another of the first and second redistribution patterns transmits a signal, wherein the main semiconductor chip has a first thickness, wherein the at least one semiconductor device has a second thickness, and wherein the first thickness is about 2 to 5 times the second thickness. Claims 18-20 would be allowable, because they depend on allowable claim 17. Any comments considered necessary by applicant must be submitted no later than the payment of the issue fee and, to avoid processing delays, should preferably accompany the issue fee. Such submissions should be clearly labeled “Comments on Statement of Reasons for Allowance.” Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to Christina A Sylvia whose telephone number is (571)272-7474. The examiner can normally be reached on 8am-4pm (M-F). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Marlon Fletcher can be reached on 571-272-2063. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHRISTINA A SYLVIA/Examiner, Art Unit 2817 /MARLON T FLETCHER/Supervisory Primary Examiner, Art Unit 2817
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Prosecution Timeline

Show 7 earlier events
Oct 17, 2025
Response Filed
Feb 05, 2026
Final Rejection mailed — §103
Mar 25, 2026
Interview Requested
Apr 02, 2026
Examiner Interview Summary
Apr 02, 2026
Applicant Interview (Telephonic)
Apr 24, 2026
Request for Continued Examination
Apr 29, 2026
Response after Non-Final Action
Jun 10, 2026
Non-Final Rejection mailed — §103 (current)

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3-4
Expected OA Rounds
88%
Grant Probability
97%
With Interview (+9.4%)
2y 0m (~0m remaining)
Median Time to Grant
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