Prosecution Insights
Last updated: April 19, 2026
Application No. 18/148,658

INTERLEAVED HIGH SIDE AND LOW SIDE POWER TRANSISTORS WITH VARIABLE FINGER SPACING

Non-Final OA §102§103
Filed
Dec 30, 2022
Examiner
WALL, VINCENT
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Texas Instruments Incorporated
OA Round
1 (Non-Final)
62%
Grant Probability
Moderate
1-2
OA Rounds
2y 8m
To Grant
87%
With Interview

Examiner Intelligence

Grants 62% of resolved cases
62%
Career Allow Rate
488 granted / 793 resolved
-6.5% vs TC avg
Strong +25% interview lift
Without
With
+25.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
52 currently pending
Career history
845
Total Applications
across all art units

Statute-Specific Performance

§101
2.0%
-38.0% vs TC avg
§103
48.9%
+8.9% vs TC avg
§102
16.9%
-23.1% vs TC avg
§112
27.2%
-12.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 793 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement As of January 5, 2026, no information disclosure statement has been made of record. The listing of references in the specification is not a proper information disclosure statement. 37 CFR 1.98(b) requires a list of all patents, publications, or other information submitted for consideration by the Office, and MPEP § 609.04(a) states, "the list may not be incorporated into the specification but must be submitted in a separate paper." Therefore, unless the references have been cited by the examiner on form PTO-892, they have not been considered. See specification at ¶ 0020. Specification Objections The disclosure is objected to because of the following informalities: In ¶ 0022, it appears that the isolation 240 needs to be labeled 245, and the internal area 245 needs to be labeled 240. Appropriate correction is required. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1-6, 8, 10, 12-17, 19, and 21 is/are rejected under 35 U.S.C. 102(a)(1) and (a)(2) as being anticipated by Arai et al. (US 2006/0175635 A1) (“Arai”). Regarding claims 1 and 12, Arai teaches at least in figures 13A-16B: a first transistor array (described below) in or over a semiconductor substrate (¶ 0003) and distributed among a first plurality (A1) of first transistor banks (a plurality of sets of CC/EC/BC; hereinafter A; therefore a first transistor array is a plurality of As; hereinafter As); and a second transistor array (described below) in or over the semiconductor substrate (¶ 0003) and distributed among a second plurality (B2) of second transistor banks (a second set of CC/EC/BC; hereinafter B; therefore a second transistor array is a plurality of Bs; hereinafter Bs), wherein a first one (A1) of the first transistor banks (As) is located between a first one (a first one of B; hereinafter B1) and a second one (a second one of B; hereinafter B2) of the second transistor banks (Bs), and the second one (B2) of the second transistor banks (B) is located between the first one (A1) of the first transistor banks (As) and a second one (A2) of the first transistor banks (As). Regarding claims 2 and 13, Arai teaches at least in figures 13A-16B: wherein the first one of the first transistor banks (A) includes a first number of blocks (a subset of the plurality of CC/EC/BC; hereinafter A’), and the second one of the second transistor banks (B) includes a second smaller number of blocks (a subset of the plurality of CC/EC/BC; hereinafter B’). Regarding claims 3 and 14, Arai teaches at least in figures 13A-16B: wherein the blocks (A’ and B’) are individually isolated (See figure 15A). Regarding claims 4 and 15, Arai teaches at least in figures 13A-16B: wherein the blocks (A’ and B’) include deep trench isolation structures that surround corresponding blocks (2b so surrounds). Regarding claims 5 and 16, Arai teaches at least in figures 13A-16B: wherein the second one (A2) of the first transistor banks (As) is located between the second one (B2) of the second transistor banks (Bs) and a third one (B3) of the second transistor banks (Bs); the first one (A1) of the first transistor banks (As) and the second one (B2) of the second transistor banks (Bs) laterally extend over the semiconductor substrate (¶ 0003) a first distance in a first direction (This is so shown in the figures); and the first one (B1) of the second transistor banks (Bs) and the second one (A2) of the first transistor banks (As) laterally extend a greater second distance in the first direction (This is so shown in the figures). Regarding claims 6 and 17, Arai teaches at least in figures 13A-16B: wherein the first (A1) and second ones (A2) of the first transistor banks (As) and the first (B1) and second ones (B2) of the second transistor banks (Bs) bound a central region of the integrated circuit located directly between the first one of the second transistor banks and the second one of the first transistor banks (Based upon the breath of the claimed pluralities Arai teaches this at least in figure 16A-B). Regarding claims 8 and 19, Arai teaches at least in figures 13A-16B: wherein the first transistor bank is configured as a high-side transistor of a voltage converter circuit and the second transistor bank is configured as a low-side transistor of the voltage converter circuit (This is considered a relabeling of the banks of claim 1. This claim adds no new structure and carries no patentable weight. The banks of claim 1 can be so configured simply by relabeling them). Regarding claims 10 and 21, Arai teaches at least in figures 13A-16B: wherein the first (As) and second transistor arrays (Bs) include a plurality of isolated sub-banks, each sub-bank including a plurality of vertical trench transistor segments (this is shown in figure 15A). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 7, and 18, is/are rejected under 35 U.S.C. 103 as being unpatentable over Arai. Regarding claims 7 and 18, Arai does not expressly teach: further comprising active circuit components configured to control the first and second transistor banks, wherein the active circuit components are located in the central region. However, it would have been obvious that one of ordinary skill in the art using routine skill in the art could wire up, i.e. connect, the transistor array as claimed. This is because transistors are active circuit components, and they can be “configured”, or connected together, to control a subset of the other transistors arbitrarily grouped together as banks. Therefore, while Arai does not expressly teach the above limitation this would have bene obvious to one of ordinary skill in the art before the effective filing date of the current application. Claim(s) 9 and 19 is/are rejected under 35 U.S.C. 103 as being unpatentable over Arai, in view of Oshima et al. (US 2018/0211898 A1) (“Oshima”) Regarding claims 9 and 19, Arai does not expressly teach: wherein a first spacing between sub-banks in the first one of the first transistor banks is greater than a second spacing between sub-banks in the second one of the first transistor banks. Oshima teaches wherein a first spacing between sub-banks in the first one of the first transistor banks is greater than a second spacing between sub-banks in the second one of the first transistor banks (Oshima teaches that one would want different spacing 401-404 between the banks 201-205 in order to change, increase or decrease, the heat dissipation between the banks. ¶ 0035). It would have been obvious to one of ordinary skill in the art to adjust the spacing between the banks and/or sub-banks of the first transistor banks and/or second transistor banks in order to adjust and optimize the heat dissipation generated by the active (transistor) elements of the banks. Claim(s) 11, and 22, is/are rejected under 35 U.S.C. 103 as being unpatentable over Arai, in view Yang (US 7,535,057 B2) (“Yang”) Regarding claims 11 and 22, Arai does not expressly teach: wherein a first block of the first one of the second transistor banks has a first number of vertical trench transistor segments and a second block of the second one of the second transistor banks has a lesser second number of vertical trench transistor segments. This is because Arai does not teach vertical transistors. Arai teaches planar transistors. In this case planar BJT transistors. In regards to the number of transistors in each block the prior art can be arbitrarily grouped together in the same manner. Yang teaches: That one can use MOSFETs instead of BJTs. Col. 1 at lines 20-45, were BJTs were commonly used. Col. 1 at lines 45-67, where one could use MOSFETs to improve performances. The replacement of BJTs with MOSFETs would have been an obvious substitution for one of ordinary skill in the art because by doing so they could improve the performance of the device of Arai. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to VINCENT WALL whose telephone number is (571)272-9567. The examiner can normally be reached Monday to Thursday at 7:30am to 2:30pm PST. Interviews can be scheduled on Tuesday thru Thursday at 10am PST or 2pm PST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jessica Manno can be reached at 571-272-2339. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /VINCENT WALL/ Primary Examiner, Art Unit 2898
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Prosecution Timeline

Dec 30, 2022
Application Filed
Jan 05, 2026
Non-Final Rejection — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
62%
Grant Probability
87%
With Interview (+25.4%)
2y 8m
Median Time to Grant
Low
PTA Risk
Based on 793 resolved cases by this examiner. Grant probability derived from career allow rate.

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