Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2816 2822 2838 2893 2898
This examiner grants 62% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18395827 | IMAGE SENSOR | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18541848 | CAPACITOR AND DEVICE INCLUDING THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 18390637 | NANOGAP DIELECTRIC MATERIAL | Non-Final OA | Robert Bosch GmbH |
| 18255760 | VERTICAL POWER TRANSISTOR | Non-Final OA | Robert Bosch GmbH |
| 18540513 | LIGHT-EMITTING DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SAMSUNG DISPLAY CO., LTD. |
| 18138440 | GLASS PACKAGE SUBSTRATE WITH CHIP DISAGGREGATION INTERFACE | Non-Final OA | Intel Corporation |
| 18147644 | FABRICATION OF NOVEL DEVICES USING ION BEAMS | Final Rejection | Intel Corporation |
| 18545183 | PLASMA-ENHANCED METHOD OF DEPOSITING MOLYBDENUM | Final Rejection | ASM IP Holding B.V. |
| 18540329 | METHODS FOR FORMING MULTILAYER STRUCTURES ON A SUBSTRATE AND RELATED MULTILAYER STRUCTURES | Final Rejection | ASM IP Holding B.V. |
| 18597186 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Japan Display Inc. |
| 18597074 | TRANSISTOR | Non-Final OA | Japan Display Inc. |
| 18580309 | DISPLAY APPARATUS AND METHOD FOR MANUFACTURING DISPLAY APPARATUS | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18213311 | COMPOSITE OXIDE SEMICONDUCTOR AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | Semiconductor Energy Laboratory Co., Ltd. |
| 18366938 | THIN FILM TRANSISTOR AND METHOD OF MANUFACTRUTING THIN FILM TRANSISTOR | Final Rejection | TOPPAN Inc. |
| 17373708 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Final Rejection | Mitsubishi Electric Corporation |
| 18430647 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | SK hynix Inc. |
| 18708587 | METHOD FOR MANUFACTURING PEROVSKITE SOLAR CELL | Non-Final OA | JUSUNG ENGINEERING CO., LTD. |
| 18403266 | Memory Circuitry And Method Used In Forming Memory Circuitry | Final Rejection | Micron Technology, Inc. |
| 18777485 | TRANSISTOR, SEMICONDUCTOR STRUCTURE, AND MANUFACTURING METHOD THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18405951 | ONE-TIME-PROGRAMMABLE MEMORY DEVICES WITH HIGH SECURITY AND METHODS OF MANUFACTURING THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18403774 | SEMICONDUCTOR STRUCTURE INCLUDING IMAGE SENSOR AND MRAM DEVICE | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18402404 | CHIP PACKAGE STRUCTURE AND METHOD FOR FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18226849 | Methods and Structure for Shielding Semiconductors From Ultraviolet Light | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18338414 | FEFET DEVICE | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18299691 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18597219 | SEMICONDUCTOR DEVICE AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18597057 | CONTACT CONSTRUCTION FOR SEMICONDUCTOR DEVICES WITH LOW-DIMENSIONAL MATERIALS | Non-Final OA | Applied Materials, Inc. |
| 18349432 | THIN-FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME | Final Rejection | RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY |
| 18448703 | SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18503801 | ELECTRONIC COMPONENT AND METHOD FOR MANUFACTURING ELECTRONIC COMPONENT | Final Rejection | Murata Manufacturing Co., Ltd. |
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