CTNF 18/187,990 CTNF 74721 DETAILED ACTION Notice of Pre-AIA or AIA Status 07-03-aia AIA 15-10-aia The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA. Election/Restrictions Applicant's election with traverse of Species 1 in the reply filed on 5/29/26 is acknowledged. The traversal is on the ground(s) that claim 18 does not require a 5 nm height and is similar to elected species 1. Applicant is reminded that the claims themselves are never species- and comparing claim 18 to claim 1 is irrelevant because examining claim 18 would require further examining the claims dependent from claim 18 (as does the examination of claim 1) and reviewing the specification/drawings along with potential mutually exclusive characteristics shows that the groups of claims pertain to different species. A single claim on its own does not necessarily provide an indication of its properly corresponding species. Applicant should note that should future prosecution determine allowable subject matter and such subject matter be properly incorporated into the withdrawn claims- rejoinder may be possible. The requirement is still deemed proper and is therefore made FINAL. Claim Rejections - 35 USC § 102 07-07-aia AIA 07-07 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – 07-08-aia AIA (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. 07-15-aia AIA Claim(s) 1-7 is/are rejected under 35 U.S.C. 102 a1 as being anticipated by Hsu et al (US 2020/0006478) . 1. (Original) An integrated circuit (IC) device comprising: a substrate (Fig.5A-C (115) and [0059]); a first elongated structure (Fig.5B (102/113-right side/bottom 113) and [0062-0063]) over the substrate (Fig.5A-C (115) and [0059]), the first elongated structure extending in a first direction (x-direction in Fig.5B) parallel to the substrate (Fig.5B (W-right ) and [0062-0063]), the first elongated structure having a first length (Fig.5B (W-right- note- W is interpreted as the length of 102/113 in the x-direction or Fig.5B) and [0062-0063]) in the first direction (x-direction in Fig.5B), and the first elongated structure having a height less than 5 nanometers [0062-0063]; and a second elongated structure (Fig.5B (102/113-left side/bottom 113) and [0062-0063]) over the substrate (Fig.5A-C (115) and [0059]), the second elongated structure (Fig.5B (W-left) and [0062-0063]) extending in the first direction (x-direction in Fig.5B) and the second elongated structure further parallel to the first elongated structure (Fig.5B (W-left and right) and [0062-0063]), the second elongated structure having a second length (Fig.5B (W-left-note W is interpreted as the length of 102/113 in the x-direction of Fig.5B) and [0062-0063]) in the first direction (x-direction in Fig.5B), the second length (Fig.5B (W-left) and [0062-0063]) greater than the first length (Fig.5B (W-right ) and [0062-0063]). 2. (Original) The IC device of claim 1, wherein the second elongated structure is a fin having a height greater than 20 nanometers (Fig.5B (102-left side) and [0062-0063]). 3. (Original) The IC device of claim 2, further comprising a third elongated structure (Fig.5B (102/113-right side/top 113) and [0062-0063]) over the first elongated structure (Fig.5B (102/113-right side/bottom 113) and [0062-0063]), the third elongated structure (Fig.5B (102/113-right side/top 113) and [0062-0063]) having the first length and extending in the first direction (Fig.5B (W-right) and [0062-0063]). 4. (Original) The IC device of claim 1, wherein the second length (Fig.5B (W-left) and [0062-0063]) is at least twice the first length (Fig.5B (W-right ) and [0062-0063]). 5. (Original) The IC device of claim 1, wherein the first elongated structure has a first width (Fig.5B (W-left) and [0062-0063]) and the second elongated structure has a second width (Fig.5B (W-right ) and [0062-0063]), the first width (Fig.5B (W-left) and [0062-0063]) greater than the second width(Fig.5B (W-right ) and [0062-0063]). 6. (Original) The IC device of claim 5, wherein the first width is at least 10 nanometers [0062-10063]. 7. (Original) The IC device of claim 5, wherein the second width is less than 6 nanometers [0062-0063] . Conclusion 07-96 AIA The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Mehandru et al (US 2020/0006488); Thompson et al (US 2019/0393350) and Liu et al (US 9202920) teach nanochannel dimensions for FET devices . Any inquiry concerning this communication or earlier communications from the examiner should be directed to LAURA M MENZ whose telephone number is (571)272-1697. The examiner can normally be reached Monday-Friday 7:00-3:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Steven Gauthier can be reached at 571-270-0373. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /LAURA M MENZ/Primary Examiner, Art Unit 2813 7/6/26 Application/Control Number: 18/187,990 Page 2 Art Unit: 2813 Application/Control Number: 18/187,990 Page 3 Art Unit: 2813 Application/Control Number: 18/187,990 Page 4 Art Unit: 2813
Prosecution Insights